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Advanced metric wave radar, Wu, Jianqi


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Цена: 22359.00р.
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Автор: Wu, Jianqi
Название:  Advanced metric wave radar
ISBN: 9789811076466
Издательство: Springer
Классификация:



ISBN-10: 9811076464
Обложка/Формат: Hardcover
Страницы: 385
Вес: 0.77 кг.
Дата издания: 12.06.2018
Язык: English
Издание: 1st ed. 2020
Иллюстрации: 183 illustrations, color; 87 illustrations, black and white; xv, 383 p. 270 illus., 183 illus. in color.
Размер: 165 x 242 x 25
Читательская аудитория: General (us: trade)
Ссылка на Издательство: Link
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Поставляется из: Германии
Описание: This book systematically describes advanced metric wave radar and its practical applications, offering a comprehensive introduction to the engineering design methods from the perspectives of system design, antenna/feed and transmit/receive subsystems, as well as mechanical structure design. Focusing on the height-finding method, it describes in detail how the super-resolution technique can be used to solve the problem of low-angle height finding in metric wave radar. It also discusses the anti-jamming method for the unique jamming environment. Further, it presents narrowband target recognition methods to overcome the limitations of narrow absolute bandwidth in metric wave radar and to further explore the technique’s potential. Cooperative detection for metric wave radar netting is also addressed, and the main experimental results are included. The book offers a valuable resource for professional engineers, researchers and teachers, as well as graduate students engaged in radar system engineering, electronic engineering, and signal processing.
Дополнительное описание: Introduction.- Target Characteristics in Metric Wave Band.- System Design of Advanced Metric Wave Radar.- Height Finding Technology of Metric Wave Radar.- Metric Wave Radar Anti-Jamming Technology.- Antenna Technology for Metric Wave Band.- Transmit/Recei



Fundamentals of Signal Processing in Generalized Metric Spaces: Algorithms and Applications

Автор: Popoff Andrey
Название: Fundamentals of Signal Processing in Generalized Metric Spaces: Algorithms and Applications
ISBN: 1032231254 ISBN-13(EAN): 9781032231259
Издательство: Taylor&Francis
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Цена: 25265.00 р.
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Описание: Exploring the interrelations between generalized metric spaces, lattice-ordered groups, and order statistics, the book contains a new algebraic approach to Signal Processing Theory. It describes mathematical concepts and results important in the development, analysis, and optimization of signal processing algorithms.

Design of Video Quality Metrics with Multi-Way Data Analysis: A Data Driven Approach

Автор: Keimel Christian
Название: Design of Video Quality Metrics with Multi-Way Data Analysis: A Data Driven Approach
ISBN: 9811091196 ISBN-13(EAN): 9789811091193
Издательство: Springer
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Цена: 13974.00 р.
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Описание: Introduction.- Video Quality.- Video Quality Metrics.- Data Analysis Approach.- Two-way Data Analysis.- Multi-way Data Analysis.- Model Building Considerations.- Designing Video Quality Metrics.- Performance Comparison.- Conclusion.

Computer Vision Metrics: Survery, Taxonomy and Analysis of Computer Vision, Visual Neuroscience, and Deep Learning

Автор: Krig Scott
Название: Computer Vision Metrics: Survery, Taxonomy and Analysis of Computer Vision, Visual Neuroscience, and Deep Learning
ISBN: 3319815954 ISBN-13(EAN): 9783319815954
Издательство: Springer
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Цена: 11179.00 р.
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Описание: Based on the successful 2014 book published by Apress, this textbook edition is expanded to provide a comprehensive history and state-of-the-art survey for fundamental computer vision methods and deep learning.

Design of Video Quality Metrics with Multi-Way Data Analysis

Автор: Christian Keimel
Название: Design of Video Quality Metrics with Multi-Way Data Analysis
ISBN: 9811002681 ISBN-13(EAN): 9789811002687
Издательство: Springer
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Цена: 18284.00 р.
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Описание: Introduction.- Video Quality.- Video Quality Metrics.- Data Analysis Approach.- Two-way Data Analysis.- Multi-way Data Analysis.- Model Building Considerations.- Designing Video Quality Metrics.- Performance Comparison.- Conclusion.

Advanced Electromagnetic Wave Propagation Methods

Автор: Gonzalez Guillermo
Название: Advanced Electromagnetic Wave Propagation Methods
ISBN: 1032113707 ISBN-13(EAN): 9781032113708
Издательство: Taylor&Francis
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Цена: 22202.00 р.
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Описание: This textbook provides a solid foundation into the approaches used in the analysis of complex electromagnetic problems and wave propagation. The techniques discussed are essential to obtain closed-form solutions or asymptotic solutions and meet an existing need for instructors and students in electromagnetic theory.

Performance Metrics for Haptic Interfaces

Автор: Evren Samur
Название: Performance Metrics for Haptic Interfaces
ISBN: 1447158032 ISBN-13(EAN): 9781447158035
Издательство: Springer
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Цена: 16769.00 р.
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Описание: This book meets the need to understand performance metrics for haptic interfaces and their implications on device design, use and application. The authors propose evaluation practices including a combined physical and psychophysical experimental methodology.

Metrics of Sensory Motor Coordination and Integration in Robots and Animals

Автор: Fabio Bonsignorio; Elena Messina; Angel P. del Pob
Название: Metrics of Sensory Motor Coordination and Integration in Robots and Animals
ISBN: 3030141241 ISBN-13(EAN): 9783030141240
Издательство: Springer
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Цена: 13974.00 р.
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Описание:

This book focuses on a critical issue in the study of physical agents, whether natural or artificial: the quantitative modelling of sensory–motor coordination.
Adopting a novel approach, it defines a common scientific framework for both the intelligent systems designed by engineers and those that have evolved naturally. As such it contributes to the widespread adoption of a rigorous quantitative and refutable approach in the scientific study of ‘embodied’ intelligence and cognition.
More than 70 years after Norbert Wiener’s famous book Cybernetics: or Control and Communication in the Animal and the Machine (1948), robotics, AI and life sciences seem to be converging towards a common model of what we can call the ‘science of embodied intelligent/cognitive agents’.
This book is interesting for an interdisciplinary community of researchers, technologists and entrepreneurs working at the frontiers of robotics and AI, neuroscience and general life and brain sciences.
Metric Driven Design Verification

Автор: Hamilton B. Carter; Shankar G. Hemmady
Название: Metric Driven Design Verification
ISBN: 1441942556 ISBN-13(EAN): 9781441942555
Издательство: Springer
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Цена: 16977.00 р.
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Описание: The purpose of the book is to train verification engineers on the breadth of technologies available and to give them a utilitarian methodology for making effective use of those technologies. The book is easy to understand and a joy to read.

Perceptual Metrics for Image Database Navigation

Автор: Yossi Rubner; Carlo Tomasi
Название: Perceptual Metrics for Image Database Navigation
ISBN: 1441948635 ISBN-13(EAN): 9781441948632
Издательство: Springer
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Цена: 29209.00 р.
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Perceptual Metrics for Image Database Navigation

Автор: Yossi Rubner; Carlo Tomasi
Название: Perceptual Metrics for Image Database Navigation
ISBN: 0792372190 ISBN-13(EAN): 9780792372196
Издательство: Springer
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Цена: 29209.00 р.
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Описание: Introduces the metric, called the Earth Mover's Distance (EMD), for comparing images in terms of their appearance. This title includes a CD-ROM with full color images and is useful to researchers, industrial professionals, and students in the fields of Computer Vision; Image Processing; Data Mining; and Digital Libraries.

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Автор: Manoj Sachdev; Jose Pineda de Gyvez
Название: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
ISBN: 1441942858 ISBN-13(EAN): 9781441942852
Издательство: Springer
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Цена: 26120.00 р.
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Описание: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.


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