Автор: Grabe, Michael Название: Truth and traceability in physics and metrology ISBN: 1643270931 ISBN-13(EAN): 9781643270937 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 6237.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Metrological data is known to be blurred by the imperfections of the measuring process. In retrospect, for about two centuries regular or constant errors were no focal point of experimental activities, only irregular or random error were. Today's notation of unknown systematic errors is in line with this. Confusingly enough, the worldwide practiced approach to belatedly admit those unknown systematic errors amounts to consider them as being random, too. This book discusses a new error concept dispensing with the common practice to randomize unknown systematic errors. Instead, unknown systematic errors will be treated as what they physically are- namely as constants being unknown with respect to magnitude and sign. The ideas considered in this book issue a proceeding steadily localizing the true values of the measurands and consequently traceability.
Описание: This first of three volumes starts with a short introduction to historical metrology as a scientific discipline and goes on with an anthology of acient and modern measurement systems of all kind, scientific measures, units of time, weights, currencies etc. It concludes with an exhaustive list of references.Units of measurement are of vital importance in every civilization through history. Since the early ages, man has through necessity devised various measures to assist him in everyday life. They have enabled and continue to enable us to trade in commonly and equitably understood amounts, and to investigate, understand, and control the chemical, physical, and biological processes of the natural world.The essence of the work is an alphabetically ordered, comprehensive list of measurement nomenclature, units and scales. It provides an understanding of almost all quantitative expressions observed in all imaginable situations, including spelling variants and the abbreviations and symbols for units, and various acronyms used in metrology. It will be of use not only to historians of science and technology, but also to economic and social historians and should be in every major academic and national library as standard reference work on the topic.
Автор: Waldemar Nawrocki Название: Introduction to Quantum Metrology ISBN: 3030196763 ISBN-13(EAN): 9783030196769 Издательство: Springer Рейтинг: Цена: 23757.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book discusses the theory of quantum effects used in metrology, and presents the author’s research findings in the field of quantum electronics. It also describes the quantum measurement standards used in various branches of metrology, such as those relating to electrical quantities, mass, length, time and frequency.The first comprehensive survey of quantum metrology problems, it introduces a new approach to metrology, placing a greater emphasis on its connection with physics, which is of importance for developing new technologies, nanotechnology in particular. Presenting practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a broad range of physicists and metrologists. It also promotes a better understanding and approval of the new system in both industry and academia.This second edition includes two new chapters focusing on the revised SI system and satellite positioning systems. Practical realization (mise en pratique) the base units (metre, kilogram, second, ampere, kelvin, candela, and mole), new defined in the revised SI, is presented in details. Another new chapter describes satellite positioning systems and their possible applications. In satellite positioning systems, like GPS, GLONASS, BeiDou and Galileo, quantum devices – atomic clocks – serve wide population of users.
Автор: Hockett, Paul Название: Quantum metrology with photoelectrons, volume i: foundations ISBN: 1681749998 ISBN-13(EAN): 9781681749990 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 13860.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications.The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.
Автор: Balasubramanian Muralikrishnan; Jayaraman Raja Название: Computational Surface and Roundness Metrology ISBN: 1849967733 ISBN-13(EAN): 9781849967730 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. There are examples, illustrations and exercises included.
Автор: Y Zhao; T Kramer; Robert Brown; Xun Xu Название: Information Modeling for Interoperable Dimensional Metrology ISBN: 1447160290 ISBN-13(EAN): 9781447160298 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book analyzes interoperability issues in dimensional metrology systems and describes information modeling techniques. Coverage includes theory, techniques and key technologies, and explores new approaches for solving real-world interoperability problems.
Автор: Tom Proulx Название: Optical Measurements, Modeling, and Metrology, Volume 5 ISBN: 1461429056 ISBN-13(EAN): 9781461429050 Издательство: Springer Рейтинг: Цена: 36570.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Optical Measurements, Modeling, and Metrology represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011.
Автор: Fiorenzo Franceschini; Maurizio Galetto; Domenico Название: Distributed Large-Scale Dimensional Metrology ISBN: 1447158393 ISBN-13(EAN): 9781447158394 Издательство: Springer Рейтинг: Цена: 19589.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The new idea of using WSNs for large-scale dimensional metrology has led to the design of distributed systems, subverting classic approaches and providing unique advantages such as portability and flexibility. This book explores the cutting edge in this field.
Описание: Meeting the need for a reliable handbook on pertinent metrology approaches in nanomaterials, experts from European, American and Asian standardization bodies provide a balanced and comprehensive overview of the state of the art, highlighting the importance of global standards.
Автор: Hebra, Alexius J. Название: Physics of metrology ISBN: 3709116740 ISBN-13(EAN): 9783709116746 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Conceived as a reference manual for practicing engineers, instrument designers, service technicians and engineering students. Historical anecdotes as far back as Hellenistic times to modern scientists help illustrate in an entertaining manner ideas ranging from impractical inventions in history to those that have changed our lives.
Автор: S. V. Gupta Название: Mass Metrology ISBN: 3030124649 ISBN-13(EAN): 9783030124649 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This second edition of Mass Metrology: The Newly Defined Kilogram has been thoroughly revised to reflect the recent redefinition of the kilogram in terms of Planck’s constant. The necessity of defining the kilogram in terms of physical constants was already underscored in the first edition. However, the kilogram can also be defined in terms of Avogadro’s number, using a collection of ions of heavy elements, by the levitation method, or using voltage and watt balances. The book also addresses the concepts of gravitational, inertial and conventional mass, and describes in detail the variation of acceleration due to gravity. Further topics covered in this second edition include: the effect of gravity variations on the reading of electronic balances derived with respect to latitude, altitude and earth topography; the classification of weights by the OIML; and maximum permissible error in different categories of weights prescribed by national and international organizations. The book also discusses group weighing techniques and the use of nanotechnology for the detection of mass differences as small as 10-24 g. Last but not least, readers will find details on the XRCD method for defining the kilogram in terms of Planck’s constant.
ООО "Логосфера " Тел:+7(495) 980-12-10 www.logobook.ru
