Long-Term Reliability of Nanometer VLSI Systems, Sheldon Tan; Mehdi Tahoori; Taeyoung Kim; Shengche
Автор: Uhrmann, Heimo Kolm, Robert Zimmermann, Horst Название: Analog filters in nanometer cmos ISBN: 3642380123 ISBN-13(EAN): 9783642380129 Издательство: Springer Рейтинг: Цена: 16769.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents recent results in the development of analog filters in nanometer CMOS. It describes methods for successfully dealing with nanometer devices and includes numerous detailed circuit diagrams and plots of measured results.
Автор: Elie Maricau; Georges Gielen Название: Analog IC Reliability in Nanometer CMOS ISBN: 1461461626 ISBN-13(EAN): 9781461461623 Издательство: Springer Рейтинг: Цена: 19564.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book covers modeling, simulation and analysis of analog circuit aging, nanometer CMOS physical effects resulting in unreliability, transistor aging compact models for circuit simulation, methods for efficient circuit reliability simulation and more.
Автор: Elie Maricau; Georges Gielen Название: Analog IC Reliability in Nanometer CMOS ISBN: 1489986308 ISBN-13(EAN): 9781489986306 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book covers modeling, simulation and analysis of analog circuit aging, nanometer CMOS physical effects resulting in unreliability, transistor aging compact models for circuit simulation, methods for efficient circuit reliability simulation and more.
Автор: Basu Soumyadipta Название: Near-Field Radiative Heat Transfer Across Nanometer Vacuum GAPS ISBN: 0323429947 ISBN-13(EAN): 9780323429948 Издательство: Elsevier Science Рейтинг: Цена: 21054.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Near-Field Radiative Heat Transfer across Nanometer Vacuum Gaps provides an in-depth description of fundamentals and application of near-field radiative heat transfer. When the vacuum gap between two media is on the order of nanometers, heat transfer can exceed that between blackbodies. This book investigates near-field heat transfer between different materials and geometries highlighting interplay between optics, material thermophysical properties and electromagnetism. The book also highlights the application of near-field thermal radiation in the field of power generation, imaging, and thermal systems as an analog of electronic devices.
Автор: Massimo Alioto; Elio Consoli; Gaetano Palumbo Название: Flip-Flop Design in Nanometer CMOS ISBN: 3319019961 ISBN-13(EAN): 9783319019963 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book offers a comprehensive treatment of Flip-Flop design, including nanometer effects and the consequent design tradeoffs for current and future VLSI systems. It examines more than 20 topologies, covering all relevant classes of circuits.
Описание: This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. Emphasis is placed on providing digital designers with understanding of the sources of process variations, their impact on circuit performance and tools for improving their designs to comply with product specifications.
Автор: Nisar Ahmed Название: Nanometer Technology Designs ISBN: 1441945598 ISBN-13(EAN): 9781441945594 Издательство: Springer Рейтинг: Цена: 21661.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges.
Автор: Bernhard Goll; Horst Zimmermann Название: Comparators in Nanometer CMOS Technology ISBN: 366244481X ISBN-13(EAN): 9783662444818 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book covers the complete spectrum of the fundamentals of clocked, regenerative comparators, their state-of-the-art, advanced CMOS technologies, innovative comparators inclusive circuit aspects, their characterization and properties.
Автор: P. Avouris Название: Atomic and Nanometer-Scale Modification of Materials ISBN: 9401048959 ISBN-13(EAN): 9789401048958 Издательство: Springer Рейтинг: Цена: 12157.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This volume contains the proceedings of the conference on "Atomic and Nanometer Scale Modification of Materials: Fundamentals and Applications" which was co-sponsored by NATO and the Engineering Foundation, and took place in Ventura, California in August 1992.
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