Advanced VLSI Design and Testability Issues, 

Автор: F.P.M. Beenker; R.G. Bennetts; A.P. Thijssen
Название: Testability Concepts for Digital ICs
ISBN: 0792396588 ISBN-13(EAN): 9780792396581
Издательство: Springer
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Цена: 30606.00 р.
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Описание: Considering the testability aspects for digital ICs, this book integrates the testability aspects into the design and manufacturing of ICs and, for each IC design project, gives a precise definition of the boundary conditions, responsibilities, interfaces and communications between persons, and quality targets.

Автор: Jose Luis Huertas D?az
Название: Test and Design-for-Testability in Mixed-Signal Integrated Circuits
ISBN: 1441954228 ISBN-13(EAN): 9781441954220
Издательство: Springer
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Цена: 21661.00 р.
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Описание: Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods.