Nanoscale AFM and Tem Observations of Elementary Dislocation Mechanisms, Veselэ Jozef
Автор: Taira Suzuki; Shin Takeuchi; Hideo Yoshinaga Название: Dislocation Dynamics and Plasticity ISBN: 3642757766 ISBN-13(EAN): 9783642757761 Издательство: Springer Рейтинг: Цена: 9141.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Studies of dislocations in ionic and covalent bonding materials with large Peierls forces provided infonnation about the core structures of dislocations and their electronic interactions with charged particles.
Описание: This thesis addresses elementary dislocation processes occurring in single-crystalline alloys based on Fe-Al, and investigates correspondences between dislocation distribution inside crystals characterized by transmission electron microscopy (TEM) and surface patterns observed using atomic force microscopy (AFM). Fe-Al alloys with different degrees of ordering were prepared and deformed in compression at ambient temperature in-situ inside the AFM device. The evolution of slip line structures was captured in the sequences of AFM images and wavy slip bands, while cross slip at the tip of the slip band and homogeneous fine slip lines were also identified. Further, the thesis develops a technique for constructing 3D representations of dislocations observed by TEM without the prohibitive difficulties of tomography, and creates 3D models of dislocation structures. Generally speaking, the thesis finds good agreement between AFM and TEM observations, confirming the value of AFM as a relevant tool for studying dislocations.
Автор: Ulrich Messerschmidt Название: Dislocation Dynamics During Plastic Deformation ISBN: 3642263577 ISBN-13(EAN): 9783642263576 Издательство: Springer Рейтинг: Цена: 20896.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Along with numerous illustrative examples, this text provides an overview of the dynamic behavior of dislocations and its relation to plastic deformation. It introduces the general properties of dislocations and treats the dislocation dynamics in some detail.
Автор: Carlo Sansour; Sebastian Skatulla Название: Generalized Continua and Dislocation Theory ISBN: 3709117550 ISBN-13(EAN): 9783709117552 Издательство: Springer Рейтинг: Цена: 20896.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The most comprehensive treatment to date of generalized continua, this volume outlines their links to disciplines such as nanoengineering and biomechanics. Incorporating current notions of scale variation, it includes revelatory lectures from Maugin and Zbib.
Описание: This book presents the latest state of simulation techniques to model plasticity and fracture in crystalline materials on the nano- and microscale. It covers discrete dislocation mechanics and the neighboring fields molecular dynamics and crystal plasticity.
Автор: Ulrich Messerschmidt Название: Dislocation Dynamics During Plastic Deformation ISBN: 3642031765 ISBN-13(EAN): 9783642031762 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Along with numerous illustrative examples, this text provides an overview of the dynamic behavior of dislocations and its relation to plastic deformation. It introduces the general properties of dislocations and treats the dislocation dynamics in some detail.
Автор: Shuai Yuan, Lianqing Liu, Zhidong Wang, Ning Xi Название: AFM-Based Observation and Robotic Nano-manipulation ISBN: 9811505071 ISBN-13(EAN): 9789811505072 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Further, the book describes how the tip positioning errors caused by thermal drift and system nonlinearity can be corrected using the proposed landmark observation method, and also explores the tip path planning method in a complex environment.
Описание: Part I Principles: Theory and Practice: Physical principles of Force-Distance Curves by Atomic Force Microscopy.- Force-Distance Curves in Practice.- Part II Case Studies: Mechanical Properties of Homogeneous Polymer Films, Thin Polymer Films and Polymer Blends: Homogeneous Polymer Films.- Thin Polymer Films.- Polymer Blends.- Creep Compliance Measurement and Force-Modulation.
Описание: This book introduces current theory and practice of electron microscopy, primarily for undergraduates, as well as for technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Описание: This Springer Laboratory volume is a practical guide for scientists and students dealing with the measurement of mechanical properties of polymers at the nanoscale through AFM force-distance curves.In the first part of the book the reader will find a theoretical introduction about atomic force microscopy, focused on force-distance curves, and mechanical properties of polymers. The discussion of several practical issues concerning the acquisition and the interpretation of force-distance curves will help scientists starting to employ this technique.The second part of the book deals with the practical measurement of mechanical properties of polymers by means of AFM force-distance curves. Several 'hands-on' examples are illustrated in a very detailed manner, with particular attention to the sample preparation, data analysis, and typical artefacts. This section gives a complete overview about the qualitative characterization and quantitative determination of the mechanical properties of homogeneous polymer samples, polymer brushes, polymer thin films, confined polymer samples, model blends and microstructured polymer blends through AFM force-distance curves. The book also introduces to new approaches and measurement techniques, like creep compliance and force modulation measurements, pointing out approximations, limitations and issues requiring further confirmation.
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