Physical Principles of Electron Microscopy: An Introduction to Tem, Sem, and Aem, Egerton R. F.
Автор: Egerton Название: Physical Principles of Electron Microscopy ISBN: 0387258000 ISBN-13(EAN): 9780387258003 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.
Автор: Egerton Название: Physical Principles of Electron Microscopy ISBN: 3319398768 ISBN-13(EAN): 9783319398761 Издательство: Springer Рейтинг: Цена: 11179.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth.
Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes but have only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.
Автор: John Hren Название: Introduction to Analytical Electron Microscopy ISBN: 147575583X ISBN-13(EAN): 9781475755831 Издательство: Springer Рейтинг: Цена: 16979.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The birth of analytical electron microscopy (AEM) is somewhat obscure. Analytical electron microscopy attempts to take full qualitative and quantitative advantage of as many of these interactions as possible while still preserving the capability of high resolution imaging.
Автор: Joseph Goldstein; David C. Joy; Alton D. Romig Jr. Название: Principles of Analytical Electron Microscopy ISBN: 1489920390 ISBN-13(EAN): 9781489920393 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention.
Описание: Since typical operating modes for the ETEM require the sample be subjected to a harsh environment consisting of corrosive gases and high temperatures, the challenges of adapting and operating the instrument for observation under dynamic operating conditions are numerous.
Описание: This thesis addresses elementary dislocation processes occurring in single-crystalline alloys based on Fe-Al, and investigates correspondences between dislocation distribution inside crystals characterized by transmission electron microscopy (TEM) and surface patterns observed using atomic force microscopy (AFM).
Описание: This thesis addresses elementary dislocation processes occurring in single-crystalline alloys based on Fe-Al, and investigates correspondences between dislocation distribution inside crystals characterized by transmission electron microscopy (TEM) and surface patterns observed using atomic force microscopy (AFM). Fe-Al alloys with different degrees of ordering were prepared and deformed in compression at ambient temperature in-situ inside the AFM device. The evolution of slip line structures was captured in the sequences of AFM images and wavy slip bands, while cross slip at the tip of the slip band and homogeneous fine slip lines were also identified. Further, the thesis develops a technique for constructing 3D representations of dislocations observed by TEM without the prohibitive difficulties of tomography, and creates 3D models of dislocation structures. Generally speaking, the thesis finds good agreement between AFM and TEM observations, confirming the value of AFM as a relevant tool for studying dislocations.
Автор: Yuanzhi Xu, Jia Yao Название: Electron Magnetic Resonance Principles ISBN: 3110528002 ISBN-13(EAN): 9783110528008 Издательство: Walter de Gruyter Цена: 13008.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The book presents principles of electron magnetic resonance from a chemist’s point-of-view, covering g-tensor theory, isotropical hyperfine structure, anisotropical hyperfine structure and fine structure of spectrum, and relaxation theory. Detailed explanations on quantitative determination of paramagnetic species are given to address readers' difficulties. Written as a physical chemistry graduate textbook, it is also suitable for industry users.
Описание: This book serves as a practical reference for anyone involved in any form of Secondary Ion Mass Spectrometry (SIMS). This is presented in a concise yet comprehensive manner to those wanting to know more about the technique in general as opposed to advanced sample specific procedures/applications.
Автор: Jerome Mertz Название: Introduction to Optical Microscopy ISBN: 1108428304 ISBN-13(EAN): 9781108428309 Издательство: Cambridge Academ Рейтинг: Цена: 13147.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This self-contained new edition introduces the theory and practice of a range of classical and modern optical microscopy techniques. With two brand new chapters, it is ideal for graduate students in electrical engineering, biomedical engineering, and physics, and is an excellent resource for advanced undergraduates, researchers, and professionals.
Описание: The authors are greatly indebted to the College of Textiles of North Carolina State University at Raleigh for support from the administration there for typing, word processing, stationery, mailing, drafting diagrams, and general assistance.
Автор: Chen, C. Julian (adjunct Senior Research Scientist And Adjunct Professor, Adjunct Senior Research Scientist And Adjunct Professor, Department Of Appli Название: Introduction to scanning tunneling microscopy third edition ISBN: 0198856555 ISBN-13(EAN): 9780198856559 Издательство: Oxford Academ Рейтинг: Цена: 15682.00 р. Наличие на складе: Поставка под заказ.
Описание: This third edition is a thoroughly updated and improved version of the recognized "Bible" of the field.
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