Magnetism: From Fundamentals to Nanoscale Dynamics, Stцhr Joachim, Siegmann Hans Christoph
Автор: Edward M. Purcell Название: Electricity and Magnetism (Berkeley Physics Course, Vol. 2) ISBN: 1107014026 ISBN-13(EAN): 9781107014022 Издательство: Cambridge Academ Рейтинг: Цена: 9504.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Introducing students to the world of electricity and magnetism, the third edition of this classic textbook has now been converted to SI units and features additional examples and problems. It covers all the standard introductory topics and contains hundreds of illustrations and nearly 600 end-of-chapter problems and exercises.
Описание: A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction.
Автор: Yosi Shacham-Diamand; Tetsuya Osaka; Madhav Datta; Название: Advanced Nanoscale ULSI Interconnects: Fundamentals and Applications ISBN: 1461497442 ISBN-13(EAN): 9781461497448 Издательство: Springer Рейтинг: Цена: 32004.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Electromechanical processes for Ultra-large-Scale Integration technology for Integrated Circuits applications is a new frontier in electrochemistry and science. This book details copper based interconnect technology for ULSI technology to ICs application.
Автор: Enrico Gnecco; Ernst Meyer Название: Fundamentals of Friction and Wear on the Nanoscale ISBN: 3319330780 ISBN-13(EAN): 9783319330785 Издательство: Springer Рейтинг: Цена: 23508.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book provides an updated review on the development of scanning probe microscopy and related techniques, and the availability of computational techniques not even imaginable a few decades ago.
Автор: Mathias Getzlaff Название: Fundamentals of Magnetism ISBN: 3642068278 ISBN-13(EAN): 9783642068270 Издательство: Springer Рейтинг: Цена: 9794.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
The first part of this state-of-the-art book conveys the fundamentals of magnetism for atoms and bulk-like solid-state systems, providing a basis for understanding new phenomena which exclusively occur in low-dimensional systems as the giant magneto resistance. This wide field is discussed in the second part. Suitable for graduate students in physical and materials sciences, the book includes numerous examples, exercises, and references.
Автор: Terry L. Alford; L.C. Feldman; James W. Mayer Название: Fundamentals of Nanoscale Film Analysis ISBN: 1441939806 ISBN-13(EAN): 9781441939807 Издательство: Springer Рейтинг: Цена: 11099.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Modern science and technology, from materials science to integrated circuit development, is directed toward the nanoscale. From thin films to field effect transistors, the emphasis is on reducing dimensions from the micro to the nanoscale. Fundamentals of NanoscaleFilm Analysis concentrates on analysis of the structure and composition of the surface and the outer few tens to hundred nanometers in depth. It describes characterization techniques to quantify the structure, composition and depth distribution of materials with the use of energetic particles and photons.
The book describes the fundamentals of materials characterization from the standpoint of the incident photons or particles which interrogate nanoscale structures. These induced reactions lead to the emission of a variety of detected of particles and photons. It is the energy and intensity of the detected beams that is the basis of the characterization of the materials. The array of experimental techniques used in nanoscale materials analysis covers a wide range of incident particle and detected beam interactions.
Included are such important interactions as atomic collisions, Rutherford backscattering, ion channeling, diffraction, photon absorption, radiative and nonradiative transitions, and nuclear reactions. A variety of analytical and scanning probe microscopy techniques are presented in detail.
Автор: Andres Cano, Dennis Meier, Morgan Trassin Название: Multiferroics: Fundamentals and Applications ISBN: 3110580977 ISBN-13(EAN): 9783110580976 Издательство: Walter de Gruyter Рейтинг: Цена: 20074.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Multiferroics, materials with a coexistence of magnetic and ferroelectric order, provide an efficient route for the control of magnetism by electric fields. The authors cover multiferroic thin-film heterostructures, device architectures and domain/interface effects. They critically discuss achievements as well as limitations and assess opportunities for future applications.
Описание: They also discuss real surface determinations and layer-by-layer growth of ultrathin films, as well as the very latest modeling approaches to UPD based on nanothermodynamics, statistical mechanics, molecular dynamics and Monte-Carlo simulations.
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