Truth and Traceability in Physics and Metrology, Grabe Michael
Автор: Graham T. Smith Название: Industrial Metrology ISBN: 1849968780 ISBN-13(EAN): 9781849968782 Издательство: Springer Рейтинг: Цена: 28732.00 р. Наличие на складе: Поставка под заказ.
Описание: The subject of this book is surface metrology, in particular two major aspects: surface texture and roundness. Traditionally surface metrology usage has been dictated by engineers who have served long and demanding apprenticeships, usually in parallel with studies leading to technician-level qualifications.
Описание: This book presents the select proceedings of the International Conference on Functional Material, Manufacturing and Performances (ICFMMP) 2019.
Автор: Grabe, Michael Название: Truth and traceability in physics and metrology ISBN: 1643270931 ISBN-13(EAN): 9781643270937 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 6237.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Metrological data is known to be blurred by the imperfections of the measuring process. In retrospect, for about two centuries regular or constant errors were no focal point of experimental activities, only irregular or random error were. Today's notation of unknown systematic errors is in line with this. Confusingly enough, the worldwide practiced approach to belatedly admit those unknown systematic errors amounts to consider them as being random, too. This book discusses a new error concept dispensing with the common practice to randomize unknown systematic errors. Instead, unknown systematic errors will be treated as what they physically are- namely as constants being unknown with respect to magnitude and sign. The ideas considered in this book issue a proceeding steadily localizing the true values of the measurands and consequently traceability.
Автор: Hockett, Paul Название: Quantum metrology with photoelectrons, volume i: foundations ISBN: 1681749998 ISBN-13(EAN): 9781681749990 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 13860.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications.The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.
Автор: Valery A. Slaev, Anna G. Chunovkina, Leonid A. Mironovsky Название: Metrology and Theory of Measurement ISBN: 3110650940 ISBN-13(EAN): 9783110650945 Издательство: Walter de Gruyter Цена: 30673.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The series Texts and Monographs in Theoretical Physics collects advanced texts on selected topics from the broad and varied field of Theoretical Physics. The works in the series will enable the readers to get a deep understanding of current topics in Theoretical Physics, with a special emphasis on recent developments. They are aimed at advanced students and researchers in theoretical and mathematical physics, and can also serve as secondary reading for lectures and seminars at post-graduate levels.
Автор: Balasubramanian Muralikrishnan; Jayaraman Raja Название: Computational Surface and Roundness Metrology ISBN: 1849967733 ISBN-13(EAN): 9781849967730 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. There are examples, illustrations and exercises included.
Описание: The book describes the implementation of different methods, including artificial neural networks, the Matrix Method, the Monte Carlo method and the virtual CMM (Coordinate Measuring Machine), and demonstrates how these methods can be effectively used in practice to gauge the accuracy of coordinate measurements.
Автор: Y Zhao; T Kramer; Robert Brown; Xun Xu Название: Information Modeling for Interoperable Dimensional Metrology ISBN: 1447160290 ISBN-13(EAN): 9781447160298 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book analyzes interoperability issues in dimensional metrology systems and describes information modeling techniques. Coverage includes theory, techniques and key technologies, and explores new approaches for solving real-world interoperability problems.
Автор: S. V. Gupta Название: Mass Metrology ISBN: 3030124649 ISBN-13(EAN): 9783030124649 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This second edition of Mass Metrology: The Newly Defined Kilogram has been thoroughly revised to reflect the recent redefinition of the kilogram in terms of Planck’s constant. The necessity of defining the kilogram in terms of physical constants was already underscored in the first edition. However, the kilogram can also be defined in terms of Avogadro’s number, using a collection of ions of heavy elements, by the levitation method, or using voltage and watt balances. The book also addresses the concepts of gravitational, inertial and conventional mass, and describes in detail the variation of acceleration due to gravity. Further topics covered in this second edition include: the effect of gravity variations on the reading of electronic balances derived with respect to latitude, altitude and earth topography; the classification of weights by the OIML; and maximum permissible error in different categories of weights prescribed by national and international organizations. The book also discusses group weighing techniques and the use of nanotechnology for the detection of mass differences as small as 10-24 g. Last but not least, readers will find details on the XRCD method for defining the kilogram in terms of Planck’s constant.
Автор: Hockett, Paul Название: Quantum metrology with photoelectrons, volume i: foundations ISBN: 1681746859 ISBN-13(EAN): 9781681746852 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 10811.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications.The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.
Автор: Hebra, Alexius J. Название: Physics of metrology ISBN: 3709116740 ISBN-13(EAN): 9783709116746 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Conceived as a reference manual for practicing engineers, instrument designers, service technicians and engineering students. Historical anecdotes as far back as Hellenistic times to modern scientists help illustrate in an entertaining manner ideas ranging from impractical inventions in history to those that have changed our lives.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
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