Scanning Probe Studies of Structural and Functional Properties of Ferroelectric Domains and Domain Walls, Tьckmantel Philippe
Автор: Jill Guyonnet Название: Ferroelectric Domain Walls ISBN: 3319057499 ISBN-13(EAN): 9783319057491 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Using the nano metric resolution of atomic force microscopy techniques, this work explores the rich fundamental physics and novel functionalities of domain walls in ferroelectric materials, the nano scale interfaces separating regions of differently oriented spontaneous polarization.
Автор: Bert Voigtl?nder Название: Scanning Probe Microscopy ISBN: 3662505576 ISBN-13(EAN): 9783662505571 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope.
Автор: T. F. Connolly Название: Ferroelectric Materials and Ferroelectricity ISBN: 1475707002 ISBN-13(EAN): 9781475707007 Издательство: Springer Рейтинг: Цена: 16979.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This volume is a joint effort of the Research Materials Information Center (RMIC) of the Solid State Division at Oak Ridge National Laboratory and the Libraries and Information Systems Center at Bell Telephone Laboratories (BTL) Murray Hill, N.
Описание: This book offers an overview of domain patterning in bulk uniaxial ferroelectrics, and shows how they lead to production of novel photonic and optoelectronic devices with improved characteristics. It provides comprehensive understanding of domain structure evolution and stabilization of tailored domain patterns. The author shows how modern experimental methods have enabled the study of nucleation and growth with high spatial and temporal resolutions. Chapters explain fundamentals and show how they have been demonstrated both experimentally and through computer simulation. It also highlights advances and the outlook for development of short-pitch domain patterns.
Автор: Jill Guyonnet Название: Ferroelectric Domain Walls ISBN: 3319382772 ISBN-13(EAN): 9783319382777 Издательство: Springer Рейтинг: Цена: 13059.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Using the nano metric resolution of atomic force microscopy techniques, this work explores the rich fundamental physics and novel functionalities of domain walls in ferroelectric materials, the nano scale interfaces separating regions of differently oriented spontaneous polarization.
Описание: Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices.
Автор: Sergei V. Kalinin; Alexei Gruverman Название: Scanning Probe Microscopy of Functional Materials ISBN: 1493939475 ISBN-13(EAN): 9781493939473 Издательство: Springer Рейтинг: Цена: 28732.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to characterize a wide range of functional materials, including complex oxides, biopolymers, and semiconductors.
Автор: Bharat Bhushan Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 ISBN: 3662507250 ISBN-13(EAN): 9783662507254 Издательство: Springer Рейтинг: Цена: 19589.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: With chapters contributed by leading researchers, this comprehensive overview of the latest applied scanning probe techniques includes a strong section on biological applications and includes material from a number of industries for a fuller perspective.
Автор: Bharat Bhushan; Satoshi Kawata Название: Applied Scanning Probe Methods VI ISBN: 3642072127 ISBN-13(EAN): 9783642072123 Издательство: Springer Рейтинг: Цена: 23751.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I-IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I-IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.
Автор: T. Sakurai; Y. Watanabe Название: Advances in Scanning Probe Microscopy ISBN: 3540667180 ISBN-13(EAN): 9783540667186 Издательство: Springer Рейтинг: Цена: 23058.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Covers several important topics in the field of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors, and more. This book is of interest to those involved in using scanning probe microscopy.
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