Scanning Probe Microscopy in Nanoscience and Nanotechnology 3, Bharat Bhushan
Автор: Murty Название: Textbook of Nanoscience and Nanotechnology ISBN: 3642280293 ISBN-13(EAN): 9783642280290 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Поставка под заказ.
Описание: It covers the entire spectrum of nanoscience and technology: introduction, terminology, historical perspectives of this domain of science, unique and widely differing properties, advances in the various synthesis, consolidation and characterization techniques, applications of nanoscience and technology and emerging materials and technologies.
Автор: Rodgers, P. Название: Nanoscience and Technology ISBN: 9814282685 ISBN-13(EAN): 9789814282680 Издательство: World Scientific Publishing Рейтинг: Цена: 29938.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Contains 35 review articles on nanoscience and nanotechnology that were first published in "Nature Nanotechnology", "Nature Materials" and a number of other "Nature" journals. This title includes articles that cover a wide range of areas in nanoscience and technology, from basic research through to applications (nanomedicine and data storage).
Автор: Sergei V. Kalinin; Alexei Gruverman Название: Scanning Probe Microscopy of Functional Materials ISBN: 1493939475 ISBN-13(EAN): 9781493939473 Издательство: Springer Рейтинг: Цена: 28732.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to characterize a wide range of functional materials, including complex oxides, biopolymers, and semiconductors.
Автор: Bert Voigtl?nder Название: Scanning Probe Microscopy ISBN: 3662505576 ISBN-13(EAN): 9783662505571 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope.
Описание: Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices.
Автор: T. Sakurai; Y. Watanabe Название: Advances in Scanning Probe Microscopy ISBN: 3642630847 ISBN-13(EAN): 9783642630842 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland.
Автор: Bharat Bhushan Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology ISBN: 3662502208 ISBN-13(EAN): 9783662502204 Издательство: Springer Рейтинг: Цена: 40389.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents the physical and technical foundation of the state-of-the-art in applied scanning probe techniques. It constitutes a comprehensive overview of SPM applications. The chapters are written by leading researchers and application scientists.
Автор: Bharat Bhushan Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 ISBN: 3662506017 ISBN-13(EAN): 9783662506011 Издательство: Springer Рейтинг: Цена: 28732.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.
Автор: Varga Название: Computational Nanoscience ISBN: 1107001706 ISBN-13(EAN): 9781107001701 Издательство: Cambridge Academ Рейтинг: Цена: 11086.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Describes advanced algorithms for students in computational physics, quantum mechanics, atomic and molecular physics, and condensed matter theory.
Автор: Francesco Marinello; Daniele Passeri; Enrico Savio Название: Acoustic Scanning Probe Microscopy ISBN: 3642430791 ISBN-13(EAN): 9783642430794 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This comprehensive presentation of a powerful new technology deals with everything from basic theoretical explanations to calibration, enhancement, and applications. It also compares the advantages of the process to more established scanning probe methods.
Автор: Harald Fuchs; Bharat Bhushan Название: Biosystems - Investigated by Scanning Probe Microscopy ISBN: 3662519194 ISBN-13(EAN): 9783662519196 Издательство: Springer Рейтинг: Цена: 39182.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: All the essentials from the series Applied Scanning Probe Methods that relate to bio- and bio-related systems have here been combined in one volume to provide a comprehensive overview of SPM applications for biosystems, aimed at scientists and professionals.
Автор: T. Sakurai; Y. Watanabe Название: Advances in Scanning Probe Microscopy ISBN: 3540667180 ISBN-13(EAN): 9783540667186 Издательство: Springer Рейтинг: Цена: 23058.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Covers several important topics in the field of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors, and more. This book is of interest to those involved in using scanning probe microscopy.
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