Biosystems - Investigated by Scanning Probe Microscopy, Harald Fuchs; Bharat Bhushan

Автор: David G. Rickerby; Giovanni Valdr?; Ugo Valdr?
Название: Impact of Electron and Scanning Probe Microscopy on Materials Research
ISBN: 0792359402 ISBN-13(EAN): 9780792359401
Издательство: Springer
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Цена: 18167.00 р.
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Описание: Covers diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. This book covers specialized electron diffraction techniques, and the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis.

Автор: Bharat Bhushan
Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
ISBN: 3662507250 ISBN-13(EAN): 9783662507254
Издательство: Springer
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Цена: 19589.00 р.
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Описание: With chapters contributed by leading researchers, this comprehensive overview of the latest applied scanning probe techniques includes a strong section on biological applications and includes material from a number of industries for a fuller perspective.

Автор: Seizo Morita
Название: Roadmap of Scanning Probe Microscopy
ISBN: 3642070698 ISBN-13(EAN): 9783642070693
Издательство: Springer
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Цена: 19589.00 р.
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Описание: Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.

Автор: Sergei V. Kalinin; Alexei Gruverman
Название: Scanning Probe Microscopy of Functional Materials
ISBN: 1493939475 ISBN-13(EAN): 9781493939473
Издательство: Springer
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Цена: 28732.00 р.
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Описание: Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to characterize a wide range of functional materials, including complex oxides, biopolymers, and semiconductors.

Автор: T. Sakurai; Y. Watanabe
Название: Advances in Scanning Probe Microscopy
ISBN: 3540667180 ISBN-13(EAN): 9783540667186
Издательство: Springer
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Цена: 23058.00 р.
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Описание: Covers several important topics in the field of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors, and more. This book is of interest to those involved in using scanning probe microscopy.

Автор: Bharat Bhushan
Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
ISBN: 3662506017 ISBN-13(EAN): 9783662506011
Издательство: Springer
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Цена: 28732.00 р.
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Описание: The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.

Автор: Bharat Bhushan
Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology
ISBN: 3662502208 ISBN-13(EAN): 9783662502204
Издательство: Springer
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Цена: 40389.00 р.
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Описание: This book presents the physical and technical foundation of the state-of-the-art in applied scanning probe techniques. It constitutes a comprehensive overview of SPM applications. The chapters are written by leading researchers and application scientists.

Автор: Bert Voigtl?nder
Название: Scanning Probe Microscopy
ISBN: 3662505576 ISBN-13(EAN): 9783662505571
Издательство: Springer
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Цена: 18284.00 р.
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Описание: This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope.

Автор: Francesco Marinello; Daniele Passeri; Enrico Savio
Название: Acoustic Scanning Probe Microscopy
ISBN: 3642430791 ISBN-13(EAN): 9783642430794
Издательство: Springer
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Цена: 16977.00 р.
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Описание: This comprehensive presentation of a powerful new technology deals with everything from basic theoretical explanations to calibration, enhancement, and applications. It also compares the advantages of the process to more established scanning probe methods.

Автор: Paula M. Vilarinho; Yossi Rosenwaks; Angus Kingon
Название: Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
ISBN: 1402030177 ISBN-13(EAN): 9781402030178
Издательство: Springer
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Цена: 55762.00 р.
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Описание: Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices.