Scanning Probe Microscopy in Nanoscience and Nanotechnology 2, Bharat Bhushan

Автор: Murty
Название: Textbook of Nanoscience and Nanotechnology
ISBN: 3642280293 ISBN-13(EAN): 9783642280290
Издательство: Springer
Рейтинг:
Цена: 20962.00 р.
Наличие на складе: Поставка под заказ.

Описание: It covers the entire spectrum of nanoscience and technology: introduction, terminology, historical perspectives of this domain of science, unique and widely differing properties, advances in the various synthesis, consolidation and characterization techniques, applications of nanoscience and technology and emerging materials and technologies.

Автор: T. Sakurai; Y. Watanabe
Название: Advances in Scanning Probe Microscopy
ISBN: 3540667180 ISBN-13(EAN): 9783540667186
Издательство: Springer
Рейтинг:
Цена: 23058.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Covers several important topics in the field of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors, and more. This book is of interest to those involved in using scanning probe microscopy.

Автор: Bharat Bhushan
Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology
ISBN: 3662502208 ISBN-13(EAN): 9783662502204
Издательство: Springer
Рейтинг:
Цена: 40389.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This book presents the physical and technical foundation of the state-of-the-art in applied scanning probe techniques. It constitutes a comprehensive overview of SPM applications. The chapters are written by leading researchers and application scientists.

Автор: Bharat Bhushan
Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
ISBN: 3662507250 ISBN-13(EAN): 9783662507254
Издательство: Springer
Рейтинг:
Цена: 19589.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: With chapters contributed by leading researchers, this comprehensive overview of the latest applied scanning probe techniques includes a strong section on biological applications and includes material from a number of industries for a fuller perspective.

Автор: Varadan, V.K.
Название: Nanoscience and Nanotechnology in Engineering
ISBN: 9814277924 ISBN-13(EAN): 9789814277921
Издательство: World Scientific Publishing
Рейтинг:
Цена: 8870.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: The usage of nanoscience and nanotechnology in engineering directly links academic research in the above two fields of nanoscience and nanotechnology to industries. This book provides the theoretical knowledge and important experimental techniques required for the research and development on nanoscience and nanotechnology in engineering.

Автор: Rodgers, P.
Название: Nanoscience and Technology
ISBN: 9814282685 ISBN-13(EAN): 9789814282680
Издательство: World Scientific Publishing
Рейтинг:
Цена: 29938.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Contains 35 review articles on nanoscience and nanotechnology that were first published in "Nature Nanotechnology", "Nature Materials" and a number of other "Nature" journals. This title includes articles that cover a wide range of areas in nanoscience and technology, from basic research through to applications (nanomedicine and data storage).

Автор: Varga
Название: Computational Nanoscience
ISBN: 1107001706 ISBN-13(EAN): 9781107001701
Издательство: Cambridge Academ
Рейтинг:
Цена: 11086.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Describes advanced algorithms for students in computational physics, quantum mechanics, atomic and molecular physics, and condensed matter theory.

Автор: Paula M. Vilarinho; Yossi Rosenwaks; Angus Kingon
Название: Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
ISBN: 1402030177 ISBN-13(EAN): 9781402030178
Издательство: Springer
Рейтинг:
Цена: 55762.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices.

Автор: Stephen C. Minne; Scott R. Manalis; Calvin F. Quat
Название: Bringing Scanning Probe Microscopy up to Speed
ISBN: 1461373530 ISBN-13(EAN): 9781461373537
Издательство: Springer
Рейтинг:
Цена: 13974.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. First, fast scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented.

Автор: Francesco Marinello; Daniele Passeri; Enrico Savio
Название: Acoustic Scanning Probe Microscopy
ISBN: 3642430791 ISBN-13(EAN): 9783642430794
Издательство: Springer
Рейтинг:
Цена: 16977.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This comprehensive presentation of a powerful new technology deals with everything from basic theoretical explanations to calibration, enhancement, and applications. It also compares the advantages of the process to more established scanning probe methods.

Автор: Sergei V. Kalinin; Alexei Gruverman
Название: Scanning Probe Microscopy of Functional Materials
ISBN: 1493939475 ISBN-13(EAN): 9781493939473
Издательство: Springer
Рейтинг:
Цена: 28732.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to characterize a wide range of functional materials, including complex oxides, biopolymers, and semiconductors.