Bringing Scanning Probe Microscopy up to Speed, Stephen C. Minne; Scott R. Manalis; Calvin F. Quat

Автор: Stephen C. Minne; Scott R. Manalis; Calvin F. Quat
Название: Bringing Scanning Probe Microscopy up to Speed
ISBN: 0792384660 ISBN-13(EAN): 9780792384663
Издательство: Springer
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Цена: 20962.00 р.
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Описание: Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. First, fast scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented.

Автор: Harald Fuchs; Bharat Bhushan
Название: Biosystems - Investigated by Scanning Probe Microscopy
ISBN: 3662519194 ISBN-13(EAN): 9783662519196
Издательство: Springer
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Цена: 39182.00 р.
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Описание: All the essentials from the series Applied Scanning Probe Methods that relate to bio- and bio-related systems have here been combined in one volume to provide a comprehensive overview of SPM applications for biosystems, aimed at scientists and professionals.

Автор: Paula M. Vilarinho; Yossi Rosenwaks; Angus Kingon
Название: Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
ISBN: 1402030177 ISBN-13(EAN): 9781402030178
Издательство: Springer
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Цена: 55762.00 р.
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Описание: Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices.

Автор: Francesco Marinello; Daniele Passeri; Enrico Savio
Название: Acoustic Scanning Probe Microscopy
ISBN: 3642430791 ISBN-13(EAN): 9783642430794
Издательство: Springer
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Цена: 16977.00 р.
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Описание: This comprehensive presentation of a powerful new technology deals with everything from basic theoretical explanations to calibration, enhancement, and applications. It also compares the advantages of the process to more established scanning probe methods.

Автор: David G. Rickerby; Giovanni Valdr?; Ugo Valdr?
Название: Impact of Electron and Scanning Probe Microscopy on Materials Research
ISBN: 0792359402 ISBN-13(EAN): 9780792359401
Издательство: Springer
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Цена: 18167.00 р.
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Описание: Covers diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. This book covers specialized electron diffraction techniques, and the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis.

Автор: T. Sakurai; Y. Watanabe
Название: Advances in Scanning Probe Microscopy
ISBN: 3642630847 ISBN-13(EAN): 9783642630842
Издательство: Springer
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Цена: 13974.00 р.
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Описание: There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland.

Автор: Sergei V. Kalinin; Alexei Gruverman
Название: Scanning Probe Microscopy of Functional Materials
ISBN: 1493939475 ISBN-13(EAN): 9781493939473
Издательство: Springer
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Цена: 28732.00 р.
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Описание: Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to characterize a wide range of functional materials, including complex oxides, biopolymers, and semiconductors.

Автор: T. Sakurai; Y. Watanabe
Название: Advances in Scanning Probe Microscopy
ISBN: 3540667180 ISBN-13(EAN): 9783540667186
Издательство: Springer
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Цена: 23058.00 р.
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Описание: Covers several important topics in the field of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors, and more. This book is of interest to those involved in using scanning probe microscopy.

Автор: Bharat Bhushan
Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
ISBN: 3662507250 ISBN-13(EAN): 9783662507254
Издательство: Springer
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Цена: 19589.00 р.
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Описание: With chapters contributed by leading researchers, this comprehensive overview of the latest applied scanning probe techniques includes a strong section on biological applications and includes material from a number of industries for a fuller perspective.