Advances in Scanning Probe Microscopy, T. Sakurai; Y. Watanabe
Автор: Adam Foster; Werner A. Hofer Название: Scanning Probe Microscopy ISBN: 1441923063 ISBN-13(EAN): 9781441923066 Издательство: Springer Рейтинг: Цена: 19589.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory.
Автор: T. Sakurai; Y. Watanabe Название: Advances in Scanning Probe Microscopy ISBN: 3540667180 ISBN-13(EAN): 9783540667186 Издательство: Springer Рейтинг: Цена: 23058.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Covers several important topics in the field of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors, and more. This book is of interest to those involved in using scanning probe microscopy.
Автор: Francesco Marinello; Daniele Passeri; Enrico Savio Название: Acoustic Scanning Probe Microscopy ISBN: 3642430791 ISBN-13(EAN): 9783642430794 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This comprehensive presentation of a powerful new technology deals with everything from basic theoretical explanations to calibration, enhancement, and applications. It also compares the advantages of the process to more established scanning probe methods.
Автор: Bharat Bhushan Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 ISBN: 3662506017 ISBN-13(EAN): 9783662506011 Издательство: Springer Рейтинг: Цена: 28732.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.
Автор: Bharat Bhushan Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 ISBN: 3662507250 ISBN-13(EAN): 9783662507254 Издательство: Springer Рейтинг: Цена: 19589.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: With chapters contributed by leading researchers, this comprehensive overview of the latest applied scanning probe techniques includes a strong section on biological applications and includes material from a number of industries for a fuller perspective.
Автор: Harald Fuchs; Bharat Bhushan Название: Biosystems - Investigated by Scanning Probe Microscopy ISBN: 3662519194 ISBN-13(EAN): 9783662519196 Издательство: Springer Рейтинг: Цена: 39182.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: All the essentials from the series Applied Scanning Probe Methods that relate to bio- and bio-related systems have here been combined in one volume to provide a comprehensive overview of SPM applications for biosystems, aimed at scientists and professionals.
Автор: Sergei V. Kalinin; Alexei Gruverman Название: Scanning Probe Microscopy of Functional Materials ISBN: 1493939475 ISBN-13(EAN): 9781493939473 Издательство: Springer Рейтинг: Цена: 28732.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to characterize a wide range of functional materials, including complex oxides, biopolymers, and semiconductors.
Автор: Stephen C. Minne; Scott R. Manalis; Calvin F. Quat Название: Bringing Scanning Probe Microscopy up to Speed ISBN: 0792384660 ISBN-13(EAN): 9780792384663 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. First, fast scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented.
Автор: David G. Rickerby; Giovanni Valdr?; Ugo Valdr? Название: Impact of Electron and Scanning Probe Microscopy on Materials Research ISBN: 0792359402 ISBN-13(EAN): 9780792359401 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Covers diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. This book covers specialized electron diffraction techniques, and the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis.
Описание: Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices.
Автор: Stephen C. Minne; Scott R. Manalis; Calvin F. Quat Название: Bringing Scanning Probe Microscopy up to Speed ISBN: 1461373530 ISBN-13(EAN): 9781461373537 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. First, fast scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented.
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