Advanced Transmission Electron Microscopy, Jian Min Zuo; John C.H. Spence

Автор: Ludwig Reimer; Helmut Kohl
Название: Transmission Electron Microscopy
ISBN: 144192308X ISBN-13(EAN): 9781441923080
Издательство: Springer
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Цена: 20962.00 р.
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Описание: This text, the standard of the field, includes an overview of such topics as the theory of image and contrast formation as well as discussion of recent progress in the field, especially in the areas of aberration corrector and energy filtering.

Автор: Andreas Rosenauer
Название: Transmission Electron Microscopy of Semiconductor Nanostructures
ISBN: 3662146185 ISBN-13(EAN): 9783662146187
Издательство: Springer
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Цена: 13060.00 р.
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Описание: This book provides tools well suited for thequantitative investigation of semiconductor electron microscopy. The bookfocuses on new methods including strain stateanalysis as well as evaluation of the compositionvia the lattice fringe analysis (CELFA) technique.

Автор: Francis Leonard Deepak; Alvaro Mayoral; Raul Arena
Название: Advanced Transmission Electron Microscopy
ISBN: 3319151762 ISBN-13(EAN): 9783319151762
Издательство: Springer
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Цена: 18284.00 р.
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Описание: This book highlights the current understanding of materials in the context of new and continuously emerging techniques in the field of electron microscopy. The authors present applications of electron microscopic techniques in characterizing various well-known & new nanomaterials.

Автор: Tanaka Nobuo
Название: Scanning Transmission Electron Microscopy of Nanomaterials
ISBN: 184816789X ISBN-13(EAN): 9781848167896
Издательство: World Scientific Publishing
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Цена: 30888.00 р.
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Описание: The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This title covers achievements in the field of STEM obtained with advanced technologies.

Автор: Dai-Ming Tang
Название: In Situ Transmission Electron Microscopy Studies of Carbon Nanotube Nucleation Mechanism and Carbon Nanotube-Clamped Metal Atomic Chains
ISBN: 3642372589 ISBN-13(EAN): 9783642372582
Издательство: Springer
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Цена: 15372.00 р.
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Описание: This book describes real-time observation and atomic level monitoring and machining using an in situ transmission electron microscopy (TEM) approach to investigate growth of carbon nanotubes and fabrication and properties of CNT-clamped metal atomic chains.

Автор: Ludwig Reimer; P.W. Hawkes; C. Deininger; R.F. Ege
Название: Energy-Filtering Transmission Electron Microscopy
ISBN: 3662140551 ISBN-13(EAN): 9783662140550
Издательство: Springer
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Цена: 13060.00 р.
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Описание: Energy-Filtering Transmission Electron Microscopy (EFTEM) presents a summary of the electron optics, the electron-specimen interactions, and the operation and contrast modes of this new field of analytical electron microscopy.

Автор: J?rgen Thomas; Thomas Gemming
Название: Analytical Transmission Electron Microscopy
ISBN: 9401786003 ISBN-13(EAN): 9789401786003
Издательство: Springer
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Цена: 10480.00 р.
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Описание: Based on the authors` years of experience as instructors, this book is an introduction for all persons who want to use a transmission electron microscope. Offers illustrative examples, simple models and practical hints on analytical transmission microscopy.