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Advances In Imaging And Electron Physics,158, Hawkes, Peter W.


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Автор: Hawkes, Peter W.
Название:  Advances In Imaging And Electron Physics,158
ISBN: 9780123747693
Издательство: Elsevier Science
Классификация:

ISBN-10: 0123747694
Обложка/Формат: Hardcover
Страницы: 320
Вес: 0.59 кг.
Дата издания: 10.09.2009
Язык: English
Размер: 22.86 x 15.24 x 2.03 cm
Читательская аудитория: Professional & vocational
Ссылка на Издательство: Link
Рейтинг:
Поставляется из: Европейский союз
Описание: Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in these domains.


Advances In Imaging And Electron Physics,161

Автор: Hawkes, Peter W.
Название: Advances In Imaging And Electron Physics,161
ISBN: 0123813182 ISBN-13(EAN): 9780123813183
Издательство: Elsevier Science
Рейтинг:
Цена: 30318.00 р.
Наличие на складе: Поставка под заказ.

Описание: Includes articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in different domains.

Advances In Imaging And Electron Physics,153

Автор: Hawkes, Peter W.
Название: Advances In Imaging And Electron Physics,153
ISBN: 012374220X ISBN-13(EAN): 9780123742209
Издательство: Elsevier Science
Рейтинг:
Цена: 32002.00 р.
Наличие на складе: Поставка под заказ.

Описание: The invention of the electron microscope made it possible to visualize a different world, far smaller than anything that could be seen with the traditional microscope. This volume focuses on the subject of correctors.

Hawkes-Advances in Imaging and Electron Physics V211

Автор: Hawkes, Peter
Название: Hawkes-Advances in Imaging and Electron Physics V211
ISBN: 0128174692 ISBN-13(EAN): 9780128174692
Издательство: Elsevier Science
Рейтинг:
Цена: 28465.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание:

Advances in Imaging and Electron Physics, Volume 209, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

  • Contains contributions from leading authorities on the subject matter
  • Informs and updates on the latest developments in the field of imaging and electron physics
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
  • Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
Advances In Imaging And Electron Physics,155

Автор: Greenfield, Dmitry
Название: Advances In Imaging And Electron Physics,155
ISBN: 0123747171 ISBN-13(EAN): 9780123747174
Издательство: Elsevier Science
Рейтинг:
Цена: 28633.00 р.
Наличие на складе: Поставка под заказ.

Описание: Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, micro lithography, and image science and digital image processing. This book summarizes the authors` knowledge and experience acquired over many-years in their work on computational charged particle optics.

Advances In Imaging And Electron Physics,156

Автор: Hawkes, Peter W.
Название: Advances In Imaging And Electron Physics,156
ISBN: 0123747627 ISBN-13(EAN): 9780123747624
Издательство: Elsevier Science
Рейтинг:
Цена: 28633.00 р.
Наличие на складе: Поставка под заказ.

Описание: Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances In Imaging And Electron Physics,160

Автор: Hawkes, Peter W.
Название: Advances In Imaging And Electron Physics,160
ISBN: 0123810175 ISBN-13(EAN): 9780123810175
Издательство: Elsevier Science
Рейтинг:
Цена: 30318.00 р.
Наличие на складе: Поставка под заказ.

Описание: Includes articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances in Imaging and Electron Physics

Автор: Hawkes, Peter
Название: Advances in Imaging and Electron Physics
ISBN: 0128171839 ISBN-13(EAN): 9780128171837
Издательство: Elsevier Science
Рейтинг:
Цена: 28465.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание:

Advances in Imaging and Electron Physics, Volume 210, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Sections in this new release cover Electron energy loss spectroscopy at high energy losses, Examination of 2D Hexagonal Band Structure from a Nanoscale Perspective for use in Electronic Transport Devices, and more.

  • Contains contributions from leading authorities on the subject matter
  • Informs and updates on the latest developments in the field of imaging and electron physics
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
  • Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
Advances in Imaging and Electron Physics,198

Автор: Hawkes, Peter W.
Название: Advances in Imaging and Electron Physics,198
ISBN: 0128048107 ISBN-13(EAN): 9780128048108
Издательство: Elsevier Science
Рейтинг:
Цена: 28633.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание:

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices, especially semiconductor devices, particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances In Imaging And Electron Physics,163

Автор: Hawkes, Peter W.
Название: Advances In Imaging And Electron Physics,163
ISBN: 012381314X ISBN-13(EAN): 9780123813145
Издательство: Elsevier Science
Рейтинг:
Цена: 30318.00 р.
Наличие на складе: Поставка под заказ.

Описание: Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in these domains.

Advances In Imaging And Electron Physics,164

Автор: Hawkes, Peter W.
Название: Advances In Imaging And Electron Physics,164
ISBN: 0123813123 ISBN-13(EAN): 9780123813121
Издательство: Elsevier Science
Рейтинг:
Цена: 30318.00 р.
Наличие на складе: Поставка под заказ.

Описание: Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in these domains.

Advances in Imaging and Electron Physics,196

Автор: Hawkes, Peter W.
Название: Advances in Imaging and Electron Physics,196
ISBN: 0128048123 ISBN-13(EAN): 9780128048122
Издательство: Elsevier Science
Рейтинг:
Цена: 28633.00 р.
Наличие на складе: Поставка под заказ.

Описание: Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances in Imaging and Electron Physics, Volume 200 1st edition

Автор: Hawkes, Peter W.
Название: Advances in Imaging and Electron Physics, Volume 200 1st edition
ISBN: 0128120908 ISBN-13(EAN): 9780128120903
Издательство: Elsevier Science
Рейтинг:
Цена: 28465.00 р.
Наличие на складе: Поставка под заказ.

Описание:

Advances in Imaging and Electron Physics, Volume 200, the latest release in a series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and computing methods. Topics in this latest release include Past and Present Attempts to Attain the Resolution Limit of the Transmission Electron Microscope, Phase Plates for Transmission Electron Microscopy, and X-Ray Lasers in Biology: Structure and Dynamics.


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