Advances In Imaging And Electron Physics,127, Hawkes, Peter W.
Автор: Hawkes, Peter W. Название: Advances In Imaging And Electron Physics,164 ISBN: 0123813123 ISBN-13(EAN): 9780123813121 Издательство: Elsevier Science Рейтинг: Цена: 30318.00 р. Наличие на складе: Поставка под заказ.
Описание: Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in these domains.
Автор: Hawkes, Peter W. Название: Advances In Imaging And Electron Physics,161 ISBN: 0123813182 ISBN-13(EAN): 9780123813183 Издательство: Elsevier Science Рейтинг: Цена: 30318.00 р. Наличие на складе: Поставка под заказ.
Описание: Includes articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in different domains.
Автор: Hawkes, Peter W. Название: Advances in Imaging and Electron Physics,196 ISBN: 0128048123 ISBN-13(EAN): 9780128048122 Издательство: Elsevier Science Рейтинг: Цена: 28633.00 р. Наличие на складе: Поставка под заказ.
Описание: Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Автор: Hawkes, Peter Название: Hawkes-Advances in Imaging and Electron Physics V211 ISBN: 0128174692 ISBN-13(EAN): 9780128174692 Издательство: Elsevier Science Рейтинг: Цена: 28465.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Advances in Imaging and Electron Physics, Volume 209, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
Contains contributions from leading authorities on the subject matter
Informs and updates on the latest developments in the field of imaging and electron physics
Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
Advances in Imaging and Electron Physics, Volume 200, the latest release in a series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and computing methods. Topics in this latest release include Past and Present Attempts to Attain the Resolution Limit of the Transmission Electron Microscope, Phase Plates for Transmission Electron Microscopy, and X-Ray Lasers in Biology: Structure and Dynamics.
Автор: Hawkes, Peter W. Название: Advances In Imaging And Electron Physics,162 ISBN: 0123813166 ISBN-13(EAN): 9780123813169 Издательство: Elsevier Science Рейтинг: Цена: 30318.00 р. Наличие на складе: Поставка под заказ.
Описание: Includes articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in different domains.
Автор: Hawkes, Peter W. Название: Advances In Imaging And Electron Physics,151 ISBN: 0123742188 ISBN-13(EAN): 9780123742186 Издательство: Elsevier Science Рейтинг: Цена: 28633.00 р. Наличие на складе: Поставка под заказ.
Описание: Merges "Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy". This title includes articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, and electromagnetic wave propagation.
Автор: Hawkes, Peter W. Название: Advances In Imaging And Electron Physics,219 ISBN: 012824612X ISBN-13(EAN): 9780128246122 Издательство: Elsevier Science Рейтинг: Цена: 28465.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Advances in Imaging and Electron Physics, Volume 219, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
Contains contributions from leading authorities on the subject matter
Informs and updates on the latest developments in the field of imaging and electron physics
Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
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