Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques, Ghavami Behnam, Raji Mohsen
Автор: Ghavami, Behnam, Raji, Mohsen Название: Soft Error Reliability of VLSI Circuits ISBN: 3030516091 ISBN-13(EAN): 9783030516093 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.
Описание: This book provides comprehensive coverage of the latest research into integrated circuits` ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits.
Автор: Lawrence P. Huelsman; Georges Gielen Название: Symbolic Analysis of Analog Circuits: Techniques and Applications ISBN: 0792393244 ISBN-13(EAN): 9780792393245 Издательство: Springer Рейтинг: Цена: 22354.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book brings together important contributions and state-of-the-art research results in the rapidly advancing area of symbolic analysis of analog circuits. The book is an excellent reference, providing insights into some of the most important issues in the symbolic analysis of analog circuits.
Part I. New physics-based EM analysis and system-level dynamic reliability management.- Chapter 1. Introduction.- Chapter 2. Physics Based EM Modeling.- Chapter 3. Fast EM Stress Evolution Analysis Using Krylov Subspace Method.- Chapter 4. Fast EM Immortatlity Analysis For Multisegment Copper Interconnect Wires.- Chapter 5. Dynamic EM Models For Transient Stress Evolution and Recovery.- Chapter 6. Compact EM Models for Multi-SEgment Interconnect Wires.- Chapter 7. EM Assesment for Power Grid Networks.- Chapter 8. Resource Based EM Modeling for Multi-Crore Microprocessors.- Chapter 9. DRM and Optimization for Real Time Embedded Systems.- Chapter 10. Learning Based DRM and Energy Optimization for Many Core Dark Silicaon Processors.- Chapter 11. Recovery Aware DRM for Near Threshold Dark Silicon Processors.- Chapter 12. Cross-Layer DRM and Optimization For Datacenter Systems.- Part II. Transistor Aging Effects and Reliability.- 13. Introduction.- Chapter 14. Aging AWare Timings Analysis.- Chapter 15. Aging Aware Standard Cell Library Optimization Methods.- Chapter 16. Aging Effects In Sequential Elements.- Chapter 17. Aging Guardband Reduction Through Selective Flip Flop Optimization.- Chapter 18. Workload Aware Static Aging Monitoring and Mitigation of Timing Critical Flip Flops.- Chapter 19. Aging Relaxation at Micro Architecture Level Using Special NOPS.- Chapter 20. Extratime Modelling and Analyis of Transistor Agin at Microarchitecture Level.- Chapter 21. Reducing Processor Wearout By Exploiting The Timing Slack of Instructions.
Автор: Kabir Chakraborty; Abhijit Chakrabarti Название: Soft Computing Techniques in Voltage Security Analysis ISBN: 8132223063 ISBN-13(EAN): 9788132223061 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book focuses on soft computing techniques for enhancing voltage security in electrical power networks. The fundamental aim of this book is to present a comprehensive treatise on power system security and the simulation of power system security.
Автор: Jacob K. White; Alberto L. Sangiovanni-Vincentelli Название: Relaxation Techniques for the Simulation of VLSI Circuits ISBN: 1461294029 ISBN-13(EAN): 9781461294023 Издательство: Springer Рейтинг: Цена: 19564.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Circuit simulation has been a topic of great interest to the integrated circuit design community for many years. At the University of California, Berkeley, a great deal of research has been devoted to the study of both the numerical properties and the efficient imple- mentation of circuit simulation algorithms.
Автор: Sahrling, Mikael, Название: Fast techniques for integrated circuit design / ISBN: 1108498450 ISBN-13(EAN): 9781108498456 Издательство: Cambridge Academ Рейтинг: Цена: 15365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Learn how to use estimation techniques to solve integrated circuit (IC) design problems, accelerate the design process, and enhance understanding of complex systems with this step-by-step guide. Using numerous real-world application examples, it is ideal for both early-career and established professionals and researchers, and graduate students, working in IC design.
Описание: This is a comprehensive guide to fault injection techniques used to evaluate the dependability of a digital system. The description and the critical analysis of different fault injection techniques and tools are authored by key scientists in the field of system dependability and fault tolerance.
Описание: In the industry of manufacturing and design, one major constraint has been enhancing operating performance using less time. As technology continues to advance, manufacturers are looking for better methods in predicting the condition and residual lifetime of electronic devices in order to save repair costs and their reputation. Intelligent systems are a solution for predicting the reliability of these components; however, there is a lack of research on the advancements of this smart technology within the manufacturing industry. AI Techniques for Reliability Prediction for Electronic Components provides emerging research exploring the theoretical and practical aspects of prediction methods using artificial intelligence and machine learning in the manufacturing field. Featuring coverage on a broad range of topics such as data collection, fault tolerance, and health prognostics, this book is ideally designed for reliability engineers, electronic engineers, researchers, scientists, students, and faculty members seeking current research on the advancement of reliability analysis using AI.
Описание: This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications.
Описание: This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications.
Автор: Bhim Singh,Ambrish Chandra,Kamal Al?€“Haddad Название: Power Quality: Problems and Mitigation Techniques ISBN: 1118922050 ISBN-13(EAN): 9781118922057 Издательство: Wiley Рейтинг: Цена: 16466.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Maintaining a stable level of power quality in the distribution network is a growing challenge due to increased use of power electronics converters in domestic, commercial and industrial sectors.
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