Volume Electron Microscopy,177, Narayan,Kedar

Автор: Zewail, Ahmed H. Thomas, John M.
Название: 4d electron microscopy
ISBN: 1848163908 ISBN-13(EAN): 9781848163904
Издательство: World Scientific Publishing
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Описание: The modern electron microscope yields a wealth of quantitative knowledge pertaining to structure, dynamics, and function barely matched by any other single scientific instrument. This book compares the merits of coherent electron waves with those of synchrotron radiation.

Название: Electron Microscopy and Analysis 2003
ISBN: 0367394537 ISBN-13(EAN): 9780367394530
Издательство: Taylor&Francis
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Описание: Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current developments in the field, primarily in the UK.

Автор: Muller-Reichert, Thomas
Название: Correlative Light and Electron Microscopy V
ISBN: 0323951414 ISBN-13(EAN): 9780323951418
Издательство: Elsevier Science
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Автор: Kuo John
Название: Electron Microscopy
ISBN: 1627037756 ISBN-13(EAN): 9781627037754
Издательство: Springer
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Описание:

1. Conventional Specimen Preparation Techniques For Transmission Electron Microscopy of Cultured Cells

John J. Bozzola

2. Microwave-assisted Processing and Embedding for Transmission Electron Microscopy

Paul Webster

30. Freeze Stabilization and Cryopreparation Technique for Visualizing the Water Distribution in Woody Tissues by X-ray Im

Автор: Page Lisa
Название: Handbook of Transmission Electron Microscopy
ISBN: 1632382830 ISBN-13(EAN): 9781632382832
Издательство: Неизвестно
Цена: 28506.00 р.
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Автор: Anjam Khursheed
Название: Secondary Electron Energy Spectroscopy In The Scanning Electron Microscope
ISBN: 9811227020 ISBN-13(EAN): 9789811227028
Издательство: World Scientific Publishing
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Описание:

This book deals with the subject of secondary energy spectroscopy in the scanning electron microscope (SEM). The SEM is a widely used research instrument for scientific and engineering research and its low energy scattered electrons, known as secondary electrons, are used mainly for the purpose of nanoscale topographic imaging. This book demonstrates the advantages of carrying out precision electron energy spectroscopy of its secondary electrons, in addition to them being used for imaging. The book will demonstrate how secondary electron energy spectroscopy can transform the SEM into a powerful analytical tool that can map valuable material science information to the nanoscale, superimposing it onto the instrument's normal topographic mode imaging. The book demonstrates how the SEM can then be used to quantify/identify materials, acquire bulk density of states information, capture dopant density distributions in semiconductor specimens, and map surface charge distributions.

Название: Correlative Light and Electron Microscopy IV, 162
ISBN: 0128220589 ISBN-13(EAN): 9780128220580
Издательство: Elsevier Science
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Описание: Correlative Light and Electron Microscopy IV, Volume 162, a new volume in the Methods in Cell Biology series, continues the legacy of this premier serial with quality chapters authored by leaders in the field. Besides the detailed description of protocols for CLEM technologies including time-resolution, Super resolution LM and Volume EM, new chapters cover Workflow (dis)-advantages/spiderweb, Serial section LM + EM, Platinum clusters as CLEM probes, Correlative Light Electron Microscopy with a transition metal complex as a single probe, SEM-TEM-SIMS, HPF-CLEM, A new workflow for high-throughput screening of mitotic mammalian cells for electron microscopy using classic histological dyes, and more

Автор: Mendis
Название: Electron Beam-Specimen Interactions and Simulation Methods in Microscopy
ISBN: 1118456092 ISBN-13(EAN): 9781118456095
Издательство: Wiley
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Автор: Thomas Mueller-Reichert
Название: Correlative Light and Electron MIcroscopy,111
ISBN: 0124160263 ISBN-13(EAN): 9780124160262
Издательство: Elsevier Science
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Описание: Covers areas of CLEM including a brief history and overview on CLEM methods, imaging of intermediate stages of meiotic spindle assembly in C. This title includes a brief history and overview on CLEM methods.

Автор: Pratibha L. Gai
Название: In-Situ Microscopy in Materials Research
ISBN: 0792399897 ISBN-13(EAN): 9780792399896
Издательство: Springer
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Цена: 30606.00 р.
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Описание: 2 Lorentz Microscopy 287 Observation of Superconducting Vortices 288 3. 1 Superconducting Vortices Observed by Interference Microscopy 288 3. 1 Profile Mode 288 3. 2 Transmission Mode 291 3. 2 Superconducting Vortices Observed by Lorentz Microscopy 293 3. 3 Observation of Vortex Interaction with Pinning Centers 294 3. 1 Surface Steps 295 3.

Автор: Frank Joachim
Название: Single-Particle Cryo-Electron Microscopy: Single-Particle Cryo-Electron Microscopy
ISBN: 9813234857 ISBN-13(EAN): 9789813234857
Издательство: World Scientific Publishing
Цена: 30096.00 р.
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Описание:

The book reproduces 55 of more than 300 articles written by the author, representing milestones in methods development of single-particle cryo-EM as well as important results obtained by this technique in the study of biological macromolecules and their interactions. Importantly, neither symmetries nor ordered arrangements (as in two-dimensional crystals, helical assemblies, icosahedral viruses) are required. Although the biological applications are mainly in the area of ribosome structure and function, the elucidation of membrane channel structures and their activation and gating mechanisms are represented, as well. The book is introduced by a commentary that explains the original development of concepts, describes the contributions of the author's colleagues and students, and shows how challenges were overcome as the technique matured. Along the way, the ribosome served as an example for a macromolecule with intricate structure and conformational dynamics that pose challenges for three-dimensional visualization. Toward the end of the book -- bringing us to the present time -- molecular structures with near-atomic resolution are presented, and a novel type of computational analysis, manifold embedding, is introduced.

Single-particle cryo-EM is currently revolutionizing structural biology, presenting a powerful alternative to X-ray crystallography as a means to solve the structure of biological macromolecules. The book presents in one place a number of articles containing key advances in mathematical and computational methods leading up to the present time. Secondly, the development of the technique over the years is reflected by ever-expanding discoveries in the field of ribosome structure and function. Thirdly, as all histories of ideas, the history of concepts pertaining to this new method of visualization is fascinating all in itself.

Автор: David G. Robinson; David G. Robinson; K. M?hlethal
Название: Methods of Preparation for Electron Microscopy
ISBN: 354017592X ISBN-13(EAN): 9783540175926
Издательство: Springer
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Описание: Many competent biological and medical research workers expressed their anxiety that objects in high vacuum would be modified due to complete dehydration and the absorbed electron energy would eventually cause degrada- tion to rudimentary carbon backbones.