Correlative Light and Electron Microscopy V, Muller-Reichert, Thomas

Автор: Zewail, Ahmed H. Thomas, John M.
Название: 4d electron microscopy
ISBN: 1848163908 ISBN-13(EAN): 9781848163904
Издательство: World Scientific Publishing
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Описание: The modern electron microscope yields a wealth of quantitative knowledge pertaining to structure, dynamics, and function barely matched by any other single scientific instrument. This book compares the merits of coherent electron waves with those of synchrotron radiation.

Автор: Goodhew
Название: Electron Microscopy & Analysis
ISBN: 0748409688 ISBN-13(EAN): 9780748409686
Издательство: Taylor&Francis
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Цена: 12248.00 р.
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Описание: A guide to scanning and transmission microscopes and to the analytical techniques based on them. It covers the techniques of electron energy loss spectroscopy and energy dispersive X-ray analysis. It compares electron microscopic techniques to many of the competing physical investigative techniques available.

Автор: Rudolf A. Steinbrecht; Karl Zierold
Название: Cryotechniques in Biological Electron Microscopy
ISBN: 3642728170 ISBN-13(EAN): 9783642728174
Издательство: Springer
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Цена: 15672.00 р.
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Описание: Growing insight into the fundamentals of the physics of water and ice, as well as increasing experience of how to cool cells rapidly enough have enlivened the interest in cryofixation and pro- duced a wealth of successful applications.

Автор: Liu, Jian Tan, Jiubin
Название: Confocal microscopy
ISBN: 1681743361 ISBN-13(EAN): 9781681743363
Издательство: Mare Nostrum (Eurospan)
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Цена: 6237.00 р.
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Описание: The confocal microscope is appropriate for imaging cells or the measurement of industrial artefacts. However, junior researchers and instrument users sometimes misuse imaging concepts and metrological characteristics, such as position resolution in industrial metrology and scale resolution in bio-imaging. And, metrological characteristics or influence factors in 3D measurement such as height assessment error caused by 3D coupling effect are so far not yet identified. In this book, the authors outline their practices by the working experiences on standardization and system design. This book assumes little previous knowledge of optics, but rich experience in engineering of industrial measurements, in particular with profile metrology or areal surface topography will be very helpful to understand the theoretical concerns and value of the technological advances. It should be useful for graduate students or researchers as extended reading material, as well as microscope users alongside their handbook.

Автор: Page Lisa
Название: Scanning Electron Microscopy
ISBN: 163238406X ISBN-13(EAN): 9781632384065
Издательство: Неизвестно
Цена: 22990.00 р.
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Описание: Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. This book focuses on various issues concerned with scanning electron microscopy, covering both theoretical and practical aspects. Numerous topics are organized under two sections, "Material Science" and "Nanostructured Materials for Electronic Industry". This book includes contributions by renowned researchers and experts in this field.

Автор: Patrick Echlin
Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 0387857303 ISBN-13(EAN): 9780387857305
Издательство: Springer
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Цена: 14673.00 р.
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Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Автор: Stokes
Название: Principles and Practice of Variable Pressure: Environmental Scanning Electron Microscopy (VP-ESEM)
ISBN: 0470065400 ISBN-13(EAN): 9780470065402
Издательство: Wiley
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Цена: 10763.00 р.
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Описание: * Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations * Crucially, the principles and applications outlined in this book are completely generic: i.e. applicable to all types of VPSEM, irrespective of manufacturer.

Автор: Kuo John
Название: Electron Microscopy
ISBN: 1627037756 ISBN-13(EAN): 9781627037754
Издательство: Springer
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Цена: 34937.00 р.
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Описание:

1. Conventional Specimen Preparation Techniques For Transmission Electron Microscopy of Cultured Cells

John J. Bozzola

2. Microwave-assisted Processing and Embedding for Transmission Electron Microscopy

Paul Webster

30. Freeze Stabilization and Cryopreparation Technique for Visualizing the Water Distribution in Woody Tissues by X-ray Im

Автор: Barabash Rozaliya, Ice Gene
Название: Strain and Dislocation Gradients from Diffraction: Spatially-Resolved Local Structure and Defects
ISBN: 1908979623 ISBN-13(EAN): 9781908979629
Издательство: World Scientific Publishing
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Цена: 23760.00 р.
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Описание: This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.

Автор: Thomas Vogt; Wolfgang Dahmen; Peter Binev
Название: Modeling Nanoscale Imaging in Electron Microscopy
ISBN: 1489997288 ISBN-13(EAN): 9781489997289
Издательство: Springer
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Цена: 15672.00 р.
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Описание: This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

Автор: Muller-Reichert,Thomas
Название: Correlative Light And Electron Microscopy Ii,124
ISBN: 0128010754 ISBN-13(EAN): 9780128010754
Издательство: Elsevier Science
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Цена: 19875.00 р.
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Автор: Erni Rolf
Название: Aberration-Corrected Imaging In Transmission Electron Microscopy: An Introduction (2Nd Edition)
ISBN: 1783265280 ISBN-13(EAN): 9781783265282
Издательство: World Scientific Publishing
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Цена: 14414.00 р.
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Описание: Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences.