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Electron Microscopy & Analysis, Goodhew



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Цена: 6373р.
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Наличие: Поставка под заказ.  Есть в наличии на складе поставщика.
Склад Англия: 18 шт.  Склад Америка: 69 шт.  
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Автор: Goodhew
Название:  Electron Microscopy & Analysis   (Электронная микроскопия и анализ)
Издательство: Taylor&Francis
Классификация:
Научное оборудование и методы, лабораторное оборудование

ISBN: 0748409688
ISBN-13(EAN): 9780748409686
ISBN: 0-7484-0968-8
ISBN-13(EAN): 978-0-7484-0968-6
Обложка/Формат: Paperback
Страницы: 254
Вес: 0.416 кг.
Дата издания: 30.11.2000
Язык: ENG
Издание: 3 rev ed
Иллюстрации: 147 colour illustrations
Размер: 23.37 x 15.67 x 1.42 cm
Читательская аудитория: Postgraduate, research & scholarly
Рейтинг:
Поставляется из: Англии
Описание: A guide to scanning and transmission microscopes and to the analytical techniques based on them. It covers the techniques of electron energy loss spectroscopy and energy dispersive X-ray analysis. It compares electron microscopic techniques to many of the competing physical investigative techniques available.



Electron Microscopy of Polymers

Автор: Michler G.H.
Название: Electron Microscopy of Polymers
ISBN: 3540363505 ISBN-13(EAN): 9783540363507
Издательство: Springer
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Цена: 13107 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.

Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

Автор: S. J. B. Reed
Название: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
ISBN: 052184875X ISBN-13(EAN): 9780521848756
Издательство: Cambridge Academ
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Цена: 6453 р.
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Описание: Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray ‘maps’ showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms an up-to-date text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

Автор: Reed
Название: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
ISBN: 052114230X ISBN-13(EAN): 9780521142304
Издательство: Cambridge Academ
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Цена: 3642 р.
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Описание: Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Progress in Transmission Electron Microscopy 1 / Concepts and Techniques

Автор: Zhang Xiao-Feng, Zhang Ze
Название: Progress in Transmission Electron Microscopy 1 / Concepts and Techniques
ISBN: 3540676805 ISBN-13(EAN): 9783540676805
Издательство: Springer
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Цена: 20477 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Автор: Patrick Echlin
Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 0387857303 ISBN-13(EAN): 9780387857305
Издательство: Springer
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Цена: 9817 р.
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Описание: Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids, and gases. This title describes what is needed up to the point the sample is put into the instrument. It is suitable for those who use these instruments.

Transmission Electron Microscopy

Автор: David B. Williams; C. Barry Carter
Название: Transmission Electron Microscopy
ISBN: 038776500X ISBN-13(EAN): 9780387765006
Издательство: Springer
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Цена: 9345 р.
Наличие на складе: Невозможна поставка.

Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.

Physical Principles of Electron Microscopy

Автор: Egerton
Название: Physical Principles of Electron Microscopy
ISBN: 0387258000 ISBN-13(EAN): 9780387258003
Издательство: Springer
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Цена: 12233 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Scanning Electron Microscopy and X-ray Microanalysis

Автор: Goldstein
Название: Scanning Electron Microscopy and X-ray Microanalysis
ISBN: 0306472929 ISBN-13(EAN): 9780306472923
Издательство: Springer
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Цена: 9349 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Intended for students, as well as practitioners, this text offers an introduction to the field of Scanning Electron Microscopy (SEM) and X-ray microanalysis. It discusses topics such as user-controlled functions of scanning electron microscopes, the characteristics of electron beam, the use of x-rays for qualitative analysis, and more.

Introduction to Conventional Transmission Electron Microscopy

Автор: Marc De Graef
Название: Introduction to Conventional Transmission Electron Microscopy
ISBN: 0521629950 ISBN-13(EAN): 9780521629959
Издательство: Cambridge Academ
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Цена: 9366 р.
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Описание: This book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field.

Electron Microscopy of Nanotubes

Автор: Wang Zhong-lin, Hui Chun
Название: Electron Microscopy of Nanotubes
ISBN: 1402073615 ISBN-13(EAN): 9781402073618
Издательство: Springer
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Цена: 18699 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Research in carbon nanotubes has reached a horizon that is impacting a variety of fields, such as nanoelectronics, flat panel display, composite materials, sensors, nanodevices and novel instrumentation. The unique structures of the nanotubes result in numerous superior physical and chemical properties, such as the strongest mechanical strength and the highest thermal conductivity, room temperature ballistic quantum conductance, electromechanical coupling, and super surface functionality. Among the various analytical techniques, high-resolution transmission electron microscopy (HRTEM) has played a key role in the discovery and characterization of carbon nanotubes. It may be claimed that carbon nanotubes might not have been discovered without using HRTEM. There is a great need of a book that addresses specifically the theory, techniques and application of electron microscopy and associated techniques for nanotube research. The objective of this book is to fill this gap. The potential of HRTEM is now well received in wide ranging communities such as materials science, physics, chemistry and electrical engineering. TEM is a powerful technique that is indispensable for characterizing nanomaterials, and Electron Microscopy of Nanotubes focuses on the applications of TEM in structural, electronic, and property characterization of carbon nanotubes and demonstrates how a comprehensive application of HRTEM and associated new techniques for nanotube research can be applied to a wide range of materials. The book contains 12 chapters and the authors for the chapters are the world prominent scientists specializing in the field. The contents of the book can be separated into three parts. The first part composed of chapters 1-6 is about the diffraction, imaging and spectroscopy of carbon-based nanotubes. The second part (chapters 7-9) describes the physical property nanomeasurements of carbon nanotubes based on in-situ TEM. The last part is about non-carbon based tubular structures and related structures.

Progress in Transmission Electron Microscopy 2 / Applications in Materials Science

Автор: Zhang Xiao-Feng, Zhang Ze
Название: Progress in Transmission Electron Microscopy 2 / Applications in Materials Science
ISBN: 3540676813 ISBN-13(EAN): 9783540676812
Издательство: Springer
Рейтинг:
Цена: 15427 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.

In-situ electron microscopy at high resolution

Название: In-situ electron microscopy at high resolution
ISBN: 9812797335 ISBN-13(EAN): 9789812797339
Издательство: World Scientific Publishing
Рейтинг:
Цена: 14936 р.
Наличие на складе: Поставка под заказ.

Описание: Reviews various techniques and achievements of in-situ high-resolution electron microscopy. This book also demonstrates the applications in several fields of materials science.


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