Power Transmission System Analysis Against Faults and Attacks, Chowdhury, Tamalika ; Chakrabarti, Abhijit ; Chand
Автор: Mrozek Название: Multi-run Memory Tests for Pattern Sensitive Faults ISBN: 3319912038 ISBN-13(EAN): 9783319912035 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail.
Автор: Hou, Yunhe Название: Electrical power transmission system engineering ISBN: 0367655047 ISBN-13(EAN): 9780367655044 Издательство: Taylor&Francis Рейтинг: Цена: 18374.00 р. Наличие на складе: Поставка под заказ.
Автор: Gonen Turan Название: Electrical Power Transmission System Engineering ISBN: 1482232227 ISBN-13(EAN): 9781482232226 Издательство: Taylor&Francis Рейтинг: Цена: 7920.00 р. Наличие на складе: Поставка под заказ.
Описание:
Electrical Power Transmission System Engineering: Analysis and Design is devoted to the exploration and explanation of modern power transmission engineering theory and practice. Designed for senior-level undergraduate and beginning-level graduate students, the book serves as a text for a two-semester course or, by judicious selection, the material may be condensed into one semester. Written to promote hands-on self-study, it also makes an ideal reference for practicing engineers in the electric power utility industry.
Basic material is explained carefully, clearly, and in detail, with multiple examples. Each new term is defined as it is introduced. Ample equations and homework problems reinforce the information presented in each chapter. A special effort is made to familiarize the reader with the vocabulary and symbols used by the industry. Plus, the addition of numerous impedance tables for overhead lines, transformers, and underground cables makes the text self-contained.
The Third Edition is not only up to date with the latest advancements in electrical power transmission system engineering, but also:
Provides a detailed discussion of flexible alternating current (AC) transmission systems
Offers expanded coverage of the structures, equipment, and environmental impacts of transmission lines
Features additional examples of shunt fault analysis using MATLAB(R)
Also included is a review of the methods for allocating transmission line fixed charges among joint users, new trends and regulations in transmission line construction, a guide to the Federal Energy Regulatory Commission (FERC) electric transmission facilities permit process and Order No. 1000, and an extensive glossary of transmission system engineering terminology.
Covering the electrical and mechanical aspects of the field with equal detail, Electrical Power Transmission System Engineering: Analysis and Design, Third Edition supplies a solid understanding of transmission system engineering today.
Описание: This book illuminates how synchrophasors achieve the monitoring, protection and control optimizations necessary to expand existing power systems to support increasing amounts of renewable and distributed energy resources.
Автор: Ten, Chee-Wooi ; Hou, Yunhe Название: Modern Power System Analysis ISBN: 0367655063 ISBN-13(EAN): 9780367655068 Издательство: Taylor&Francis Рейтинг: Цена: 20671.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Das, J.C. Название: Power System Analysis ISBN: 0824707370 ISBN-13(EAN): 9780824707378 Издательство: Marcel Dekker Цена: 19173.00 р. Наличие на складе: Нет в наличии.
Описание: Accurate, fast, and reliable fault classification techniques are an important operational requirement in modern-day power transmission systems. This book gives an elaboration of the power system faults and the conventional techniques of fault analysis.
Автор: Jitendra B. Khare; Wojciech Maly Название: From Contamination to Defects, Faults and Yield Loss ISBN: 0792397142 ISBN-13(EAN): 9780792397144 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.
Автор: Ireneusz Mrozek Название: Multi-run Memory Tests for Pattern Sensitive Faults ISBN: 3030081982 ISBN-13(EAN): 9783030081980 Издательство: Springer Рейтинг: Цена: 12577.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;Presents practical algorithms for design and implementation of efficient multi-run tests;Demonstrates methods verified by analytical and experimental investigations.
Автор: S. Jayanthy; M.C. Bhuvaneswari Название: Test Generation of Crosstalk Delay Faults in VLSI Circuits ISBN: 9811324921 ISBN-13(EAN): 9789811324925 Издательство: Springer Рейтинг: Цена: 19564.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.
Описание: This book describes fault tolerance techniques based on software and hardware to create hybrid techniques. The authors then discuss the best trade-off between software-based and hardware-based techniques and introduce novel hybrid techniques.
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