Fundamentals of Light Microscopy and Electronic Imaging, 2nd Edition, Murphy Douglas B. , Davidson Michael W.
Старое издание
Автор: Douglas B. Murphy Название: Fundamentals of Light Microscopy and Electronic Imaging ISBN: 047125391X ISBN-13(EAN): 9780471253914 Издательство: Wiley Цена: 12664.00 р. Наличие на складе: Невозможна поставка. Описание: This practical book presents the fundamentals of light and electron microscopy, including the basics of microscope design, image formation, and camera function. Moreover, researchers will learn how to acquire electronic images and perform image processing. The author provides instructions on the latest techniques involving video microscopy, digital microscopy, laser scanning microscopy, digital CCD microscopy, as well as a chapter covering issues related to image processing for scientific publication.
Описание: Provides the information about the fundamentals of electronics, detailing the knowledge necessary to understand the operation of a range of electronic circuits: amplifiers, logic circuits, power supplies and oscillators. This book is accompanied by a website that offers the reader a set of tools that can be used to simplify circuit calculations.
Описание: Fundamentals of Applied Pathophysiology, second edition , is designed specifically for nursing and healthcare students, providing a user-friendly, straightforward, jargon-free, accessible introduction to pathophysiology. With an applied, full-colou
Автор: Reifenberger Ronald G Название: Fundamentals Of Atomic Force Microscopy - Part I: Foundations ISBN: 9814630357 ISBN-13(EAN): 9789814630351 Издательство: World Scientific Publishing Рейтинг: Цена: 6336.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https://nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)
Автор: Reifenberger Ronald Название: Fundamentals of Atomic Force Microscopy - Part I: Foundations ISBN: 9814630349 ISBN-13(EAN): 9789814630344 Издательство: World Scientific Publishing Рейтинг: Цена: 15048.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https: //nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)
Автор: Alana Verminski and Kelly Marie Blanchat Название: Fundamentals of Electronic Resource Management ISBN: 1783302305 ISBN-13(EAN): 9781783302307 Издательство: Facet Рейтинг: Цена: 11605.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This guide to ERM fundamentals will prove invaluable, both as a primer for those preparing to enter the field as well as a ready reference for current practitioners.
Описание: Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences.
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