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Electromigration in Thin Films and Electronic Devices: Materials and Reliability, Kim Choong-Un


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Цена: 28739.00р.
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Автор: Kim Choong-Un
Название:  Electromigration in Thin Films and Electronic Devices: Materials and Reliability
ISBN: 9780081016961
Издательство: Elsevier Science
Классификация:


ISBN-10: 0081016964
Обложка/Формат: Paperback
Страницы: 354
Вес: 0.49 кг.
Дата издания: 02.09.2016
Серия: Woodhead publishing series in electronic and optical materials
Язык: English
Размер: 234 x 156 x 19
Читательская аудитория: Professional & vocational
Подзаголовок: Materials and reliability
Ссылка на Издательство: Link
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Поставляется из: Европейский союз
Описание: Understanding and limiting electromigration in thin films is essential to the continued development of advanced copper interconnects for integrated circuits. Electromigration in thin films and electronic devices provides an up-to-date review of key topics in this commercially important area.Part one consists of three introductory chapters, covering modelling of electromigration phenomena, modelling electromigration using the peridynamics approach and simulation and x-ray microbeam studies of electromigration. Part two deals with electromigration issues in copper interconnects, including x-ray microbeam analysis, voiding, microstructural evolution and electromigration failure. Finally, part three covers electromigration in solder, with chapters discussing topics such as electromigration-induced microstructural evolution and electromigration in flip-chip solder joints.With its distinguished editor and international team of contributors, Electromigration in thin films and electronic devices is an essential reference for materials scientists and engineers in the microelectronics, packaging and interconnects industries, as well as all those with an academic research interest in the field.


Electromigration In Ulsi Interconnections

Автор: Tan Cher Ming
Название: Electromigration In Ulsi Interconnections
ISBN: 9814273325 ISBN-13(EAN): 9789814273329
Издательство: World Scientific Publishing
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Цена: 15840.00 р.
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Описание: Presents a description of the electro migration in integrated circuits. This book examines the various interconnected systems and their evolution employed in integrated circuit technology. It is suitable for readers on electro migration in ULSI interconnections.

Electromigration Inside Logic Cells

Автор: Posser
Название: Electromigration Inside Logic Cells
ISBN: 3319488988 ISBN-13(EAN): 9783319488981
Издательство: Springer
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Цена: 12157.00 р.
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Описание: This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics.

Adhesives Technology for Electronic Applications: Materials, Processing, Reliability

Автор: Licari James J., Swanson Dale W.
Название: Adhesives Technology for Electronic Applications: Materials, Processing, Reliability
ISBN: 0128103701 ISBN-13(EAN): 9780128103708
Издательство: Elsevier Science
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Цена: 23244.00 р.
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Описание: Adhesives are widely used in the manufacture and assembly of electronic circuits and products. Generally, electronics design engineers and manufacturing engineers are not well versed in adhesives, while adhesion chemists have a limited knowledge of electronics. This book bridges these knowledge gaps and is useful to both groups. The book includes chapters covering types of adhesive, the chemistry on which they are based, and their properties, applications, processes, specifications, and reliability. Coverage of toxicity, environmental impacts and the regulatory framework make this book particularly important for engineers and managers alike.The third edition has been updated throughout and includes new sections on nanomaterials, environmental impacts and new environmentally friendly ‘green’ adhesives. Information about regulations and compliance has been brought fully up-to-date.As well as providing full coverage of standard adhesive types, Licari explores the most recent developments in fields such as: Tamper-proof adhesives for electronic security devices. Bio-compatible adhesives for implantable medical devices. Electrically conductive adhesives to replace toxic tin-lead solders in printed circuit assembly – as required by regulatory regimes, e.g. the EU’s Restriction of Hazardous Substances Directive or RoHS (compliance is required for all products placed on the European market). Nano-fillers in adhesives, used to increase the thermal conductivity of current adhesives for cooling electronic devices.

Recent Developments in Electronic Materials and Devices - Ceramic Transactions V131

Автор: Nair
Название: Recent Developments in Electronic Materials and Devices - Ceramic Transactions V131
ISBN: 1574981455 ISBN-13(EAN): 9781574981452
Издательство: Wiley
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Цена: 17574.00 р.
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Описание: With information on the subject of dielectric materials, this volume brings important updates to electronic device engineers and researchers in the area of ferroelectric materials. Topics include materials, processes, properties, and electronic devices based on these materials and systems. .

Nanotechnology for Electronic Materials and Devices

Автор: Anatoli Korkin; Evgeni Gusev; Jan K. Labanowski; S
Название: Nanotechnology for Electronic Materials and Devices
ISBN: 1441936122 ISBN-13(EAN): 9781441936127
Издательство: Springer
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Цена: 23508.00 р.
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Описание: The high level of attention and interest of the global community to NANO science and technology to a large extent is linked to the GIGAntic challenges for the c- tinuing growth of information technology, which sparked an unprecedented level of interdisciplinary and international cooperation among industrial and academic researchers, companies, IT market rivals, and countries, including former political and military rivals . Microelectronics technologies have reached a new stage in their development: The latest miniaturization of electronic devices is approaching atomic dimensions, interconnect bottlenecks are limiting circuit speeds, new ma- rials are being introduced into microelectronics manufacture at an unprecedented rate, and alternative technologies to mainstream complementary metal-oxide sem- conductors (CMOSs) are being considered . The very dynamic stage of science and technology related to the advanced and future electronics and photonics creates a growing gap between the large number of rapid publications and nanotechnology highlights in media on one side and fundamental understanding of underlying phenomena and an adequate evaluation of scientific discoveries and technological innovations on the other side. Writing a tutorial book on fundamentals of science and technology for electronics at this time is almost the same level of challenge as writing a history book during a revolution.


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