Dielectric Properties of Wood and Wood-Based Materials, Grigoriy I. Torgovnikov
Автор: Paul S. Ho; Jihperng Leu; Wei William Lee Название: Low Dielectric Constant Materials for IC Applications ISBN: 3642632211 ISBN-13(EAN): 9783642632211 Издательство: Springer Рейтинг: Цена: 22203.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Low dielectric constant materials are an important component of microelectronic devices. Topics include: Organic dielectric materials, Inorganic dielectric materials, Composite dielectric materials, Metrology and characterization techniques, Integration, Reliability.
Описание: Advances in synthesis and characterization of dielectric, piezoelectric and ferroelectric thin films are included in this volume. Dielectric, piezoelectric and ferroelectric thin films have a tremendous impact on a variety of commercial and military systems including tunable microwave devices, memories, MEMS devices, actuators and sensors.
Описание: As semiconductor manufacturers implement copper conductors in advanced interconnect schemes, research and development efforts shift toward the selection of an insulator that can take maximum advantage of the lower power and faster signal propagation allowed by copper interconnects.
Автор: Alexander Trubin Название: Lattices of Dielectric Resonators ISBN: 3319251465 ISBN-13(EAN): 9783319251462 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book provides the analytical theory of complex systems composed of a large number of high-Q dielectric resonators. The scattering process of short pulses in dielectric filter structures, dielectric antennas and lattices of dielectric resonators is discussed.
Автор: J. Keith Nelson Название: Dielectric Polymer Nanocomposites ISBN: 1441915907 ISBN-13(EAN): 9781441915900 Издательство: Springer Рейтинг: Цена: 26122.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book discusses the background, principles and promise of nanodielectrics then details the processing of nanocomposites. It also addresses special considerations of clay-based processes and concludes with the perspective of industrial applications.
Автор: Paluch Название: Dielectric Properties of Ionic Liquids ISBN: 331932487X ISBN-13(EAN): 9783319324876 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book discusses the mechanisms of electric conductivity in various ionic liquid systems (protic, aprotic as well as polymerized ionic liquids). It hence covers the electric properties of ionic liquids and their macromolecular counterpanes, some of the most promising materials for the development of safe electrolytes in modern electrochemical energy devices such as batteries, super-capacitors, fuel cells and dye-sensitized solar cells. Chapter contributions by the experts in the field discuss important findings obtained using broadband dielectric spectroscopy (BDS) and other complementary techniques. The book is an excellent introduction for readers who are new to the field of dielectric properties of ionic conductors, and a helpful guide for every scientist who wants to investigate the interplay between molecular structure and dynamics in ionic conductors by means of dielectric spectroscopy.
Автор: Borja Название: Dielectric Breakdown in Gigascale Electronics ISBN: 3319432184 ISBN-13(EAN): 9783319432182 Издательство: Springer Рейтинг: Цена: 7836.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book focuses on the experimental and theoretical aspects of the time-dependent breakdown of advanced dielectric films used in gigascale electronics. Coverage includes the most important failure mechanisms for thin low-k films, new and established experimental techniques, recent advances in the area of dielectric failure, and advanced simulations/models to resolve and predict dielectric breakdown, all of which are of considerable importance for engineers and scientists working on developing and integrating present and future chip architectures. The book is specifically designed to aid scientists in assessing the reliability and robustness of electronic systems employing low-k dielectric materials such as nano-porous films. Similarly, the models presented here will help to improve current methodologies for estimating the failure of gigascale electronics at device operating conditions from accelerated lab test conditions. Numerous graphs, tables, and illustrations are included to facilitate understanding of the topics. Readers will be able to understand dielectric breakdown in thin films along with the main failure modes and characterization techniques. In addition, they will gain expertise on conventional as well as new field acceleration test models for predicting long term dielectric degradation.
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