Industrial X-Ray Computed Tomography, Simone Carmignato; Wim Dewulf; Richard Leach
Автор: Rui Bernardes; Jos? Cunha-Vaz Название: Optical Coherence Tomography ISBN: 3662521180 ISBN-13(EAN): 9783662521182 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book covers application of OCT from the anterior to the posterior ocular segments, and details clinical applications ranging from adaptive optics to the integration of a slit-lamp, and new structural and functional information extraction from OCT data.
Автор: Michael K. Miller Название: Atom Probe Tomography ISBN: 1461369215 ISBN-13(EAN): 9781461369219 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution.
Автор: Michael K. Miller; Richard G. Forbes Название: Atom-Probe Tomography ISBN: 1489974296 ISBN-13(EAN): 9781489974297 Издательство: Springer Рейтинг: Цена: 20896.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In this comprehensive introduction to the use of APT in nanocharacterization, readers will find everything they need to get up to speed on the technique, from the core physics to state-of-the-art instrumentation and revised methods of data analysis.
Автор: Williams Lefebvre Название: Atom Probe Tomography ISBN: 0128046473 ISBN-13(EAN): 9780128046470 Издательство: Elsevier Science Рейтинг: Цена: 22401.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms.
For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen-one of the leading scientific research centers exploring the various aspects of the instrument-will further enhance understanding and the learning process.
Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials
Written for both experienced researchers and new users
Includes exercises, along with corrections, for users to practice the techniques discussed
Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy
Автор: Michael K. Miller Название: Atom Probe Tomography ISBN: 0306464152 ISBN-13(EAN): 9780306464157 Издательство: Springer Рейтинг: Цена: 22203.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Written by the inventor of the technique, this book provides the first complete description of atom probe tomography (APT). It provides a brief history of the development of the APT technique and the different types of three-dimentional probes that have been developed.
Автор: David J. Larson; Ty J. Prosa; Robert M. Ulfig; Bri Название: Local Electrode Atom Probe Tomography ISBN: 146148720X ISBN-13(EAN): 9781461487203 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The first single-source reference to all the major features of LEAP tomography, this volume includes a wealth of practical tips and covers all four core aspects of a LEAP tomography experiment from start to finish, as well as the software methods employed.
ООО "Логосфера " Тел:+7(495) 980-12-10 www.logobook.ru
