Автор: Michael K. Miller; Richard G. Forbes Название: Atom-Probe Tomography ISBN: 1489974296 ISBN-13(EAN): 9781489974297 Издательство: Springer Рейтинг: Цена: 20896.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In this comprehensive introduction to the use of APT in nanocharacterization, readers will find everything they need to get up to speed on the technique, from the core physics to state-of-the-art instrumentation and revised methods of data analysis.
Автор: Michael K. Miller Название: Atom Probe Tomography ISBN: 1461369215 ISBN-13(EAN): 9781461369219 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution.
Автор: Williams Lefebvre Название: Atom Probe Tomography ISBN: 0128046473 ISBN-13(EAN): 9780128046470 Издательство: Elsevier Science Рейтинг: Цена: 22401.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms.
For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen-one of the leading scientific research centers exploring the various aspects of the instrument-will further enhance understanding and the learning process.
Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials
Written for both experienced researchers and new users
Includes exercises, along with corrections, for users to practice the techniques discussed
Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy
Автор: David J. Larson; Ty J. Prosa; Robert M. Ulfig; Bri Название: Local Electrode Atom Probe Tomography ISBN: 146148720X ISBN-13(EAN): 9781461487203 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The first single-source reference to all the major features of LEAP tomography, this volume includes a wealth of practical tips and covers all four core aspects of a LEAP tomography experiment from start to finish, as well as the software methods employed.
Автор: Simone Carmignato; Wim Dewulf; Richard Leach Название: Industrial X-Ray Computed Tomography ISBN: 3319595717 ISBN-13(EAN): 9783319595719 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book acts as a one-stop-shop resource for students and users of X-ray computed tomography in both academia and industry. The book also highlights where there is still work to do, in the perspective that X-ray computed tomography will be an essential part of Industry 4.0.
Автор: Baptiste Gault; Michael P. Moody; Julie M. Cairney Название: Atom Probe Microscopy ISBN: 1489989390 ISBN-13(EAN): 9781489989390 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book covers all facets of atom probe microscopy-including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels.
Автор: Hyongsok T. Soh; Kathryn Wilder Guarini; Calvin F. Название: Scanning Probe Lithography ISBN: 1441948945 ISBN-13(EAN): 9781441948946 Издательство: Springer Рейтинг: Цена: 23757.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning Probe Lithography (SPL) describes recent advances in the field of scanning probe lithography, a high resolution patterning technique that uses a sharp tip in close proximity to a sample to pattern nanometer-scale features on the sample.
Автор: K.F.J. Heinrich; D. Newbury Название: Electron Probe Quantitation ISBN: 1489926194 ISBN-13(EAN): 9781489926197 Издательство: Springer Рейтинг: Цена: 27950.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967.
Автор: Russell E. Walstedt Название: The NMR Probe of High-Tc Materials and Intermetallic Compounds ISBN: 3662555808 ISBN-13(EAN): 9783662555804 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This new edition updates readers in three areas of NMR studies, namely, recent developments in high-Tc materials, heavy fermion systems and actinide oxides are presented.
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