Scanning Probe Lithography, Hyongsok T. Soh; Kathryn Wilder Guarini; Calvin F.

Автор: Hyongsok T. Soh; Kathryn Wilder Guarini; Calvin F.
Название: Scanning Probe Lithography
ISBN: 0792373618 ISBN-13(EAN): 9780792373612
Издательство: Springer
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Цена: 23757.00 р.
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Описание: Describes advances in the field of scanning probe lithography, a high resolution patterning technique that uses a sharp tip in close proximity to a sample to pattern nanometer-scale features on the sample. This book describes the historical context, the relevant inventions, and the prospects for eventual manufacturing use of this technology.

Автор: Mack
Название: Fundamental Principles of Optical Lithography: The Science of Microfabrication
ISBN: 0470727306 ISBN-13(EAN): 9780470727300
Издательство: Wiley
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Цена: 9179.00 р.
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Описание: Fundamental Principles of Optical Lithography: The Science of Microfabrication presents a complete theoretical and practical treatment of the topic of lithography for both students and researchers. This sole-authored text includes optional computer simulation exercises as well as problems at the end of each chapter.

Автор: Bharat Bhushan
Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
ISBN: 3662506017 ISBN-13(EAN): 9783662506011
Издательство: Springer
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Цена: 28732.00 р.
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Описание: The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.

Автор: Bharat Bhushan
Название: Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
ISBN: 3662507250 ISBN-13(EAN): 9783662507254
Издательство: Springer
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Цена: 19589.00 р.
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Описание: With chapters contributed by leading researchers, this comprehensive overview of the latest applied scanning probe techniques includes a strong section on biological applications and includes material from a number of industries for a fuller perspective.

Автор: Sergei V. Kalinin; Alexei Gruverman
Название: Scanning Probe Microscopy of Functional Materials
ISBN: 1493939475 ISBN-13(EAN): 9781493939473
Издательство: Springer
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Цена: 28732.00 р.
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Описание: Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to characterize a wide range of functional materials, including complex oxides, biopolymers, and semiconductors.

Автор: T. Sakurai; Y. Watanabe
Название: Advances in Scanning Probe Microscopy
ISBN: 3540667180 ISBN-13(EAN): 9783540667186
Издательство: Springer
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Цена: 23058.00 р.
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Описание: Covers several important topics in the field of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors, and more. This book is of interest to those involved in using scanning probe microscopy.

Автор: Stephen C. Minne; Scott R. Manalis; Calvin F. Quat
Название: Bringing Scanning Probe Microscopy up to Speed
ISBN: 0792384660 ISBN-13(EAN): 9780792384663
Издательство: Springer
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Цена: 20962.00 р.
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Описание: Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. First, fast scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented.

Автор: Harald Fuchs; Bharat Bhushan
Название: Biosystems - Investigated by Scanning Probe Microscopy
ISBN: 3662519194 ISBN-13(EAN): 9783662519196
Издательство: Springer
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Цена: 39182.00 р.
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Описание: All the essentials from the series Applied Scanning Probe Methods that relate to bio- and bio-related systems have here been combined in one volume to provide a comprehensive overview of SPM applications for biosystems, aimed at scientists and professionals.

Автор: Bharat Bhushan; Harald Fuchs; Masahiko Tomitori
Название: Applied Scanning Probe Methods X
ISBN: 3642093426 ISBN-13(EAN): 9783642093425
Издательство: Springer
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Цена: 27245.00 р.
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Описание: The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

Автор: Paula M. Vilarinho; Yossi Rosenwaks; Angus Kingon
Название: Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
ISBN: 1402030177 ISBN-13(EAN): 9781402030178
Издательство: Springer
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Цена: 55762.00 р.
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Описание: Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices.