The Non-Equilibrium Green`s Function Method for Nanoscale Device Simulation, Mahdi Pourfath

Автор: Ashok K. Vaseashta; Ion N. Mihailescu
Название: Functionalized Nanoscale Materials, Devices and Systems
ISBN: 1402089023 ISBN-13(EAN): 9781402089022
Издательство: Springer
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Цена: 19564.00 р.
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Описание: Describes the underlying principles, synthesis routes, characterizations, applications of Nanoscale materials. This book discusses several top-down (attrition) and bottoms-up (self-assembly) approaches to prepare nanomaterials. It is suitable for those considering careers in the field of nanostructured materials and nanotechnology.

Автор: Jo?o P. Oliveira; Jo?o Goes
Название: Parametric Analog Signal Amplification Applied to Nanoscale CMOS Technologies
ISBN: 148999873X ISBN-13(EAN): 9781489998736
Издательство: Springer
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Цена: 15672.00 р.
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Описание: This book analyzes parametric amplification with emphasis on the MOS discrete-time implementation. Examples include a small gain amplifier, discrete-time mixer/IIR-Filter, and analog-to-digital converter. Offers experimental data validating the overall design.

Автор: Tiwari, Sandip
Название: Nanoscale Device Physics
ISBN: 0198759878 ISBN-13(EAN): 9780198759874
Издательство: Oxford Academ
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Цена: 10296.00 р.
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Описание: The primary advanced textbook for the teaching of science and engineering of nanoscale devices as used in the semiconductor, electronics, magnetics, optics and electromechanics industry.

Автор: Mark Lundstrom; Jing Guo
Название: Nanoscale Transistors
ISBN: 1441939156 ISBN-13(EAN): 9781441939159
Издательство: Springer
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Цена: 16977.00 р.
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Описание: To push MOSFETs to their scaling limits and to explore devices that may complement or even replace them at molecular scale, a clear understanding of device physics at nanometer scale is necessary.

Автор: Terry L. Alford; L.C. Feldman; James W. Mayer
Название: Fundamentals of Nanoscale Film Analysis
ISBN: 1441939806 ISBN-13(EAN): 9781441939807
Издательство: Springer
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Цена: 11099.00 р.
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Описание:

Modern science and technology, from materials science to integrated circuit development, is directed toward the nanoscale. From thin films to field effect transistors, the emphasis is on reducing dimensions from the micro to the nanoscale. Fundamentals of Nanoscale Film Analysis concentrates on analysis of the structure and composition of the surface and the outer few tens to hundred nanometers in depth. It describes characterization techniques to quantify the structure, composition and depth distribution of materials with the use of energetic particles and photons.