Scanning Tunneling Spectroscopy of Magnetic Bulk Impurities, Henning Pr?ser

Автор: Samuel H. Cohen; Marcia L. Lightbody
Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 3
ISBN: 1475781849 ISBN-13(EAN): 9781475781847
Издательство: Springer
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Цена: 19591.00 р.
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Описание: The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998.

Автор: Klaus Graff
Название: Metal Impurities in Silicon-Device Fabrication
ISBN: 3642629652 ISBN-13(EAN): 9783642629655
Издательство: Springer
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Цена: 13060.00 р.
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Описание: This up-to-date monograph provides a thorough review of the relevant data and properties of the transition-metal impurities generated during silicon-sample and device fabrication. This new edition includes important recent data and many new tables.

Автор: Bernard Pajot; Bernard Clerjaud
Название: Optical Absorption of Impurities and Defects in Semiconducting Crystals
ISBN: 3642430805 ISBN-13(EAN): 9783642430800
Издательство: Springer
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Цена: 18284.00 р.
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Описание: This volume outlines how absorption spectroscopy is important to the investigation of deep-level centers introduced in semiconductors and insulators. It also explains how vibrational spectroscopy determines the atomic structure and symmetry of complexes.

Автор: Henning Pr?ser
Название: Scanning Tunneling Spectroscopy of Magnetic Bulk Impurities
ISBN: 3319063847 ISBN-13(EAN): 9783319063843
Издательство: Springer
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Цена: 18167.00 р.
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Описание: Magnetic impurities in a non-magnetic host metal have been actively explored in condensed matter physics in recent last decades. This thesis contains a comprehensive description of the STM /STS technique, sub-surface impurities, as well as single- and two-impurity Kondo physics - and as such offers a valuable introduction to newcomers to the field.

Автор: Samuel H. Cohen; Marcia L. Lightbody
Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 2
ISBN: 1475793278 ISBN-13(EAN): 9781475793277
Издательство: Springer
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Цена: 19591.00 р.
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Описание: Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994

Автор: Mengxi Liu
Название: Controlled Synthesis and Scanning Tunneling Microscopy Study of Graphene and Graphene-Based Heterostructures
ISBN: 9811051801 ISBN-13(EAN): 9789811051807
Издательство: Springer
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Цена: 16769.00 р.
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Описание:

This thesis focuses on the energy band engineering of graphene. It presents pioneering findings on the controlled growth of graphene and graphene-based heterostructures, as well as scanning tunneling microscopy/scanning tunneling spectroscopy (STM/STS) studies on their electronic structures. The thesis primarily investigates two classes of graphene-based systems: (i) twisted bilayer graphene, which was synthesized on Rh substrates and manifests van Hove singularities near Fermi Level, and (ii) in-plane h-BN-G heterostructures, which were controllably synthesized in an ultrahigh vacuum chamber and demonstrate intriguing electronic properties on the interface. In short, the thesis offers revealing insights into the energy band engineering of graphene-based nanomaterials, which will greatly facilitate future graphene applications.

Автор: Hans-Joachim G?ntherodt; D. Anselmetti; Roland Wie
Название: Scanning Tunneling Microscopy I
ISBN: 3642973450 ISBN-13(EAN): 9783642973451
Издательство: Springer
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Цена: 11173.00 р.
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Описание: Scanning Tunneling Microscopy I provides a unique introduction to a novel and fascinating technique that produces beautiful images of nature on an atomic scale. It is the first of three volumes that together offer a comprehensive treatment of scanning tunneling microscopy, its diverse applications, and its theoretical treatment.

Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 3
ISBN: 0306462974 ISBN-13(EAN): 9780306462979
Издательство: Springer
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Цена: 23508.00 р.
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Описание: Contains the proceedings of the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium, which was held to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies.

Автор: M.T. Bray; Samuel H. Cohen; Marcia L. Lightbody
Название: Atomic Force Microscopy/Scanning Tunneling Microscopy
ISBN: 1475793243 ISBN-13(EAN): 9781475793246
Издательство: Springer
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Цена: 26122.00 р.
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Описание: In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.

Автор: M.T. Bray; Samuel H. Cohen; Marcia L. Lightbody
Название: Atomic Force Microscopy/Scanning Tunneling Microscopy
ISBN: 0306448904 ISBN-13(EAN): 9780306448904
Издательство: Springer
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Цена: 26122.00 р.
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Описание: In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.

Автор: Roland Wiesendanger; Hans-Joachim G?ntherodt
Название: Scanning Tunneling Microscopy III
ISBN: 3540608249 ISBN-13(EAN): 9783540608240
Издательство: Springer
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Цена: 15672.00 р.
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Описание: Providing an introduction to the theoretical foundations of STM and related scanning probe methods, this work outlines the various theoretical concepts developed in the past, and discusses the implications of the theoretical results for the interpretation of experimental data.

Автор: Olof Holtz; Qing Xiang Zhao
Название: Impurities Confined in Quantum Structures
ISBN: 3642622283 ISBN-13(EAN): 9783642622281
Издательство: Springer
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Цена: 13974.00 р.
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Описание: The dramatic impact of low dimensional semiconductor structures on c- rent and future device applications cannot be overstated. The modi?ed electronic structure of semiconductor quantum structures results in transport and optical properties, which di?er from those of constituent bulk materials.