Scanning Tunneling Microscopy I, Hans-Joachim G?ntherodt; D. Anselmetti; Roland Wie

Автор: Samuel H. Cohen; Marcia L. Lightbody
Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 2
ISBN: 1475793278 ISBN-13(EAN): 9781475793277
Издательство: Springer
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Цена: 19591.00 р.
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Описание: Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994

Автор: Henning Pr?ser
Название: Scanning Tunneling Spectroscopy of Magnetic Bulk Impurities
ISBN: 3319063847 ISBN-13(EAN): 9783319063843
Издательство: Springer
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Цена: 18167.00 р.
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Описание: Magnetic impurities in a non-magnetic host metal have been actively explored in condensed matter physics in recent last decades. This thesis contains a comprehensive description of the STM /STS technique, sub-surface impurities, as well as single- and two-impurity Kondo physics - and as such offers a valuable introduction to newcomers to the field.

Автор: Weilie Zhou; Zhong Lin Wang
Название: Scanning Microscopy for Nanotechnology
ISBN: 1441922091 ISBN-13(EAN): 9781441922090
Издательство: Springer
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Цена: 20896.00 р.
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Описание: This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book will appeal to nanomaterials researchers, and to SEM development specialists.

Автор: P.W. Hawkes; Ludwig Reimer
Название: Scanning Electron Microscopy
ISBN: 3642083722 ISBN-13(EAN): 9783642083723
Издательство: Springer
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Цена: 26120.00 р.
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Описание: The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Автор: Adam Foster; Werner A. Hofer
Название: Scanning Probe Microscopy
ISBN: 1441923063 ISBN-13(EAN): 9781441923066
Издательство: Springer
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Цена: 19589.00 р.
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Описание: Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory.

Автор: T. Sakurai; Y. Watanabe
Название: Advances in Scanning Probe Microscopy
ISBN: 3642630847 ISBN-13(EAN): 9783642630842
Издательство: Springer
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Цена: 13974.00 р.
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Описание: There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland.

Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 3
ISBN: 0306462974 ISBN-13(EAN): 9780306462979
Издательство: Springer
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Цена: 23508.00 р.
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Описание: Contains the proceedings of the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium, which was held to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies.

Автор: Mikio Yamashita; Hidemi Shigekawa; Ryuji Morita
Название: Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy
ISBN: 364205983X ISBN-13(EAN): 9783642059834
Издательство: Springer
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Цена: 26120.00 р.
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Описание: The former covers the theory of nonlinear pulse propagation beyond the slowly-varing-envelope approximation, the generation and active chirp compensation of ultrabroadband optical pulses, the amplitude and phase characterization of few- to mono-cycle pulses, and the feedback field control for the mono-cycle-like pulse generation.

Автор: Samuel H. Cohen; Marcia L. Lightbody
Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 3
ISBN: 1475781849 ISBN-13(EAN): 9781475781847
Издательство: Springer
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Цена: 19591.00 р.
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Описание: The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998.

Автор: M.T. Bray; Samuel H. Cohen; Marcia L. Lightbody
Название: Atomic Force Microscopy/Scanning Tunneling Microscopy
ISBN: 1475793243 ISBN-13(EAN): 9781475793246
Издательство: Springer
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Цена: 26122.00 р.
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Описание: In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.

Автор: Mengxi Liu
Название: Controlled Synthesis and Scanning Tunneling Microscopy Study of Graphene and Graphene-Based Heterostructures
ISBN: 9811051801 ISBN-13(EAN): 9789811051807
Издательство: Springer
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Цена: 16769.00 р.
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Описание:

This thesis focuses on the energy band engineering of graphene. It presents pioneering findings on the controlled growth of graphene and graphene-based heterostructures, as well as scanning tunneling microscopy/scanning tunneling spectroscopy (STM/STS) studies on their electronic structures. The thesis primarily investigates two classes of graphene-based systems: (i) twisted bilayer graphene, which was synthesized on Rh substrates and manifests van Hove singularities near Fermi Level, and (ii) in-plane h-BN-G heterostructures, which were controllably synthesized in an ultrahigh vacuum chamber and demonstrate intriguing electronic properties on the interface. In short, the thesis offers revealing insights into the energy band engineering of graphene-based nanomaterials, which will greatly facilitate future graphene applications.

Автор: M.T. Bray; Samuel H. Cohen; Marcia L. Lightbody
Название: Atomic Force Microscopy/Scanning Tunneling Microscopy
ISBN: 0306448904 ISBN-13(EAN): 9780306448904
Издательство: Springer
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Цена: 26122.00 р.
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Описание: In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.