Описание: Contains the proceedings of the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium, which was held to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies.
Автор: Mikio Yamashita; Hidemi Shigekawa; Ryuji Morita Название: Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy ISBN: 364205983X ISBN-13(EAN): 9783642059834 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The former covers the theory of nonlinear pulse propagation beyond the slowly-varing-envelope approximation, the generation and active chirp compensation of ultrabroadband optical pulses, the amplitude and phase characterization of few- to mono-cycle pulses, and the feedback field control for the mono-cycle-like pulse generation.
Автор: Samuel H. Cohen; Marcia L. Lightbody Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 3 ISBN: 1475781849 ISBN-13(EAN): 9781475781847 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998.
Автор: Samuel H. Cohen; Marcia L. Lightbody Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 2 ISBN: 1475793278 ISBN-13(EAN): 9781475793277 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994
Автор: M.T. Bray; Samuel H. Cohen; Marcia L. Lightbody Название: Atomic Force Microscopy/Scanning Tunneling Microscopy ISBN: 1475793243 ISBN-13(EAN): 9781475793246 Издательство: Springer Рейтинг: Цена: 26122.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.
This thesis focuses on the energy band engineering of graphene. It presents pioneering findings on the controlled growth of graphene and graphene-based heterostructures, as well as scanning tunneling microscopy/scanning tunneling spectroscopy (STM/STS) studies on their electronic structures. The thesis primarily investigates two classes of graphene-based systems: (i) twisted bilayer graphene, which was synthesized on Rh substrates and manifests van Hove singularities near Fermi Level, and (ii) in-plane h-BN-G heterostructures, which were controllably synthesized in an ultrahigh vacuum chamber and demonstrate intriguing electronic properties on the interface. In short, the thesis offers revealing insights into the energy band engineering of graphene-based nanomaterials, which will greatly facilitate future graphene applications.
Автор: M.T. Bray; Samuel H. Cohen; Marcia L. Lightbody Название: Atomic Force Microscopy/Scanning Tunneling Microscopy ISBN: 0306448904 ISBN-13(EAN): 9780306448904 Издательство: Springer Рейтинг: Цена: 26122.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.
Автор: Samuel H. Cohen; Marcia L. Lightbody Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 2 ISBN: 030645596X ISBN-13(EAN): 9780306455964 Издательство: Springer Рейтинг: Цена: 22201.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994
Автор: Roland Wiesendanger; Hans-Joachim G?ntherodt Название: Scanning Tunneling Microscopy III ISBN: 3540608249 ISBN-13(EAN): 9783540608240 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Providing an introduction to the theoretical foundations of STM and related scanning probe methods, this work outlines the various theoretical concepts developed in the past, and discusses the implications of the theoretical results for the interpretation of experimental data.
Автор: Henning Pr?ser Название: Scanning Tunneling Spectroscopy of Magnetic Bulk Impurities ISBN: 3319063847 ISBN-13(EAN): 9783319063843 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Magnetic impurities in a non-magnetic host metal have been actively explored in condensed matter physics in recent last decades. This thesis contains a comprehensive description of the STM /STS technique, sub-surface impurities, as well as single- and two-impurity Kondo physics - and as such offers a valuable introduction to newcomers to the field.
Автор: Henning Pr?ser Название: Scanning Tunneling Spectroscopy of Magnetic Bulk Impurities ISBN: 3319360515 ISBN-13(EAN): 9783319360515 Издательство: Springer Рейтинг: Цена: 13059.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Magnetic impurities in a non-magnetic host metal have been actively explored in condensed matter physics in recent last decades. This thesis contains a comprehensive description of the STM /STS technique, sub-surface impurities, as well as single- and two-impurity Kondo physics - and as such offers a valuable introduction to newcomers to the field.
Автор: Weilie Zhou; Zhong Lin Wang Название: Scanning Microscopy for Nanotechnology ISBN: 1441922091 ISBN-13(EAN): 9781441922090 Издательство: Springer Рейтинг: Цена: 20896.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book will appeal to nanomaterials researchers, and to SEM development specialists.
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