Atomic Force Microscopy/Scanning Tunneling Microscopy 2, Samuel H. Cohen; Marcia L. Lightbody

Автор: Roland Wiesendanger; Hans-Joachim G?ntherodt
Название: Scanning Tunneling Microscopy III
ISBN: 3540608249 ISBN-13(EAN): 9783540608240
Издательство: Springer
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Описание: Providing an introduction to the theoretical foundations of STM and related scanning probe methods, this work outlines the various theoretical concepts developed in the past, and discusses the implications of the theoretical results for the interpretation of experimental data.

Автор: M.T. Bray; Samuel H. Cohen; Marcia L. Lightbody
Название: Atomic Force Microscopy/Scanning Tunneling Microscopy
ISBN: 0306448904 ISBN-13(EAN): 9780306448904
Издательство: Springer
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Описание: In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.

Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 3
ISBN: 0306462974 ISBN-13(EAN): 9780306462979
Издательство: Springer
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Описание: Contains the proceedings of the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium, which was held to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies.

Автор: Hans-Joachim G?ntherodt; D. Anselmetti; Roland Wie
Название: Scanning Tunneling Microscopy I
ISBN: 3540584153 ISBN-13(EAN): 9783540584155
Издательство: Springer
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Описание: The conceptual simplicity of the STM technique is startling: bringing a sharp needle to within a few Angstroms of the surface of a conducting sample and using the tunneling cur- rent, which flows on application of a bias voltage, to sense the atomic and elec- tronic surface structure with atomic resolution!

Автор: Chunli Bai
Название: Scanning Tunneling Microscopy and Its Application
ISBN: 3642085008 ISBN-13(EAN): 9783642085000
Издательство: Springer
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Описание: Scanning Tunneling Microscopy and its Application presents a unified view of the rapidly growing field of STM, and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and the methods for tip and surface preparations, the monograph provides detailed accounts of STM application to metal and semiconductor surfaces, adsorbates and surface chemistry, biology, and nanofabrication. It examines limitations of the present-day investigations and provides hints about possible further trends. This second edition includes important new developments in the field.

Автор: Hans-Joachim G?ntherodt; D. Anselmetti; Roland Wie
Название: Scanning Tunneling Microscopy I
ISBN: 3642973450 ISBN-13(EAN): 9783642973451
Издательство: Springer
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Описание: Scanning Tunneling Microscopy I provides a unique introduction to a novel and fascinating technique that produces beautiful images of nature on an atomic scale. It is the first of three volumes that together offer a comprehensive treatment of scanning tunneling microscopy, its diverse applications, and its theoretical treatment.

Автор: Mikio Yamashita; Hidemi Shigekawa; Ryuji Morita
Название: Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy
ISBN: 364205983X ISBN-13(EAN): 9783642059834
Издательство: Springer
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Описание: The former covers the theory of nonlinear pulse propagation beyond the slowly-varing-envelope approximation, the generation and active chirp compensation of ultrabroadband optical pulses, the amplitude and phase characterization of few- to mono-cycle pulses, and the feedback field control for the mono-cycle-like pulse generation.

Автор: Patrick Echlin
Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 0387857303 ISBN-13(EAN): 9780387857305
Издательство: Springer
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Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Автор: Bonnell Dawn A
Название: Scanning Probe Microscopy for Energy Research
ISBN: 9814434701 ISBN-13(EAN): 9789814434706
Издательство: World Scientific Publishing
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Цена: 31680.00 р.
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Описание: Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.

Автор: Gerd Kaupp
Название: Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
ISBN: 3642066631 ISBN-13(EAN): 9783642066634
Издательство: Springer
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Описание: Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm.

Автор: B. Cappella; M. Geuss; M. Kl?ppel; M. Munz; E. Sch
Название: Filler-Reinforced Elastomers / Scanning Force Microscopy
ISBN: 3540005307 ISBN-13(EAN): 9783540005308
Издательство: Springer
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Описание: This study of polymer science presents short and concise reports on the physics and chemistry of polymers, each written by the world renowned experts.