Filler-Reinforced Elastomers / Scanning Force Microscopy, B. Cappella; M. Geuss; M. Kl?ppel; M. Munz; E. Sch

Автор: Patrick Echlin
Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 0387857303 ISBN-13(EAN): 9780387857305
Издательство: Springer
Рейтинг:
Цена: 14673.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Автор: V. S. Fikhtegol ts
Название: Ultraviolet Spectra of Elastomers and Rubber Chemicals
ISBN: 1461595932 ISBN-13(EAN): 9781461595939
Издательство: Springer
Рейтинг:
Цена: 6986.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: In the modern organic synthesis industries, one of which is the synthetic rubber industry, ever increasing use is made of physical and physicochemical methods of analysis, which sur- pass chemical methods in speed, accuracy, and sensitivity.

Автор: Karel Dusek; J.B. Donnet; S.G. Entelis; V.V. Evrei
Название: Pharmacy/Thermomechanics/Elastomers/Telechelics
ISBN: 3662151863 ISBN-13(EAN): 9783662151860
Издательство: Springer
Рейтинг:
Цена: 6986.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Автор: B. Cappella; M. Geuss; M. Kl?ppel; M. Munz; E. Sch
Название: Filler-Reinforced Elastomers / Scanning Force Microscopy
ISBN: 3642056040 ISBN-13(EAN): 9783642056048
Издательство: Springer
Рейтинг:
Цена: 32651.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Название: Atomic Force Microscopy/Scanning Tunneling Microscopy 3
ISBN: 0306462974 ISBN-13(EAN): 9780306462979
Издательство: Springer
Рейтинг:
Цена: 23508.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Contains the proceedings of the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium, which was held to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies.

Автор: M. Arora; G. Carlesso; J.M. Davidson; A.J. Domb; G
Название: Filled Elastomers Drug Delivery Systems
ISBN: 3662146398 ISBN-13(EAN): 9783662146392
Издательство: Springer
Рейтинг:
Цена: 27950.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Автор: Bonnell Dawn A
Название: Scanning Probe Microscopy for Energy Research
ISBN: 9814434701 ISBN-13(EAN): 9789814434706
Издательство: World Scientific Publishing
Рейтинг:
Цена: 31680.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.

Автор: Gerd Kaupp
Название: Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
ISBN: 3642066631 ISBN-13(EAN): 9783642066634
Издательство: Springer
Рейтинг:
Цена: 26120.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm.