2nd International Multidisciplinary Microscopy and Microanalysis Congress, E.K. Polychroniadis; Ahmet Yavuz Oral; Mehmet Ozer
Автор: E.K. Polychroniadis; Ahmet Yavuz Oral; Mehmet Ozer Название: 2nd International Multidisciplinary Microscopy and Microanalysis Congress ISBN: 3319169181 ISBN-13(EAN): 9783319169187 Издательство: Springer Рейтинг: Цена: 28734.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The 2nd International Multidisciplinary Microscopy and Microanalysis Congress & Exhibition (InterM 2014) was held on 16-19 October 2014 in Oludeniz, Fethiye/ Mugla, Turkey.The aim of the congress was to gather scientists from various branches and discuss the latest improvements in the field of microscopy.
The 3rd International Multidisciplinary Microscopy Congress (InterM2015), held from 19 to 23 October 2015, focused on the latest developments concerning applications of microscopy in the biological, physical and chemical sciences at all dimensional scales, advances in instrumentation, techniques in and educational materials on microscopy. These proceedings gather 17 peer-reviewed technical papers submitted by leading academic and research institutions from nine countries and representing some of the most cutting-edge research available.
Автор: Efstathios K. Polychroniadis; Ahmet Yavuz Oral; Me Название: International Multidisciplinary Microscopy Congress ISBN: 3319377094 ISBN-13(EAN): 9783319377094 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The International Multidisciplinary Microscopy Congress (INTERM2013) was organized on October 10-13, 2013.
Автор: Joseph Goldstein; Dale E. Newbury; David C. Joy; C Название: Scanning Electron Microscopy and X-ray Microanalysis ISBN: 1461349699 ISBN-13(EAN): 9781461349693 Издательство: Springer Рейтинг: Цена: 10448.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described.
Автор: Joseph Goldstein; Dale E. Newbury; Patrick Echlin; Название: Scanning Electron Microscopy and X-Ray Microanalysis ISBN: 1461332753 ISBN-13(EAN): 9781461332756 Издательство: Springer Рейтинг: Цена: 16979.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Joseph Goldstein; Dale Newbury; David Joy; Joseph Название: Scanning Electron Microscopy and X-Ray Microanalysis ISBN: 149396674X ISBN-13(EAN): 9781493966745 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Поставка под заказ.
Описание: This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners - engineers, technicians, physical and biological scientists, clinicians, and technical managers - will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc.
In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope's software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD).
With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling.
New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process.
This book helps you to achieve this goal. Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managersEmphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful resultsProvides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurementsMakes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation. Includes case studies to illustrate practical problem solvingCovers Helium ion scanning microscopyOrganized into relatively self-contained modules - no need to "read it all" to understand a topicIncludes an online supplement-an extensive "Database of Electron-Solid Interactions"-which can be accessed on SpringerLink, in Chapter 3
Автор: B.G. Yacobi; L.L. Kazmerski; D.B. Holt Название: Microanalysis of Solids ISBN: 1489914943 ISBN-13(EAN): 9781489914941 Издательство: Springer Рейтинг: Цена: 27950.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Thus, the major parts of the book are: Electron Beam Techniques, Ion Beam Techniques, Photon Beam Techniques, Acoustic Wave Excitation, and Tunneling of Electrons and Scanning Probe Microscopies.
Автор: Karl Zierold; Herbert K. Hagler Название: Electron Probe Microanalysis ISBN: 3642744796 ISBN-13(EAN): 9783642744792 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Invited contributions with conference discussion of the conference on "Progress of Electron Probe Microanalysis in Biology and Medicine" at Schloss Ringberg, November 16- 19, 1988
Описание: Part I Lectures: A computational fluidstructure interaction analysis of a fiberreinforced stentless aortic valve, J. De Hart, G.W.M. Peters, P.J.G. Schreurs, F.P.T. Baaijens; Nonlinear Inverse Problems: Theoretical Aspects and Some Industrial Applications, Heinz W. Engl, Philipp Kugler; Numerical Methods for the Simulation of Incompressible Viscous Flow: An Introduction, Roland Glowinski, TsorngWhay, Pan, L. Hector Juarez V. Edward Dean.- Part II Speakers: Data assimilation methods for an oceanographic problem, Didier Auroux, Jacques Blum; Ant colonies: a nature inspired paradigm for the mathematical modelling of selforganizing systems, Vincenzo Capasso, Daniela Morale; Distribution Theoretic Approach to Multiphase Flow, Hideo Kawarada, E. Baba, M. Okada, H. Suito; An Ant System Heuristic for the TwoDimensional Finite Bin Packing Problem: preliminary results, Marco A. Boschetti, Vittorio Maniezzo; Distributed Multidisciplinary Design Optimisation in Aeronautics using Evolutionary Algorithms, Game Theory and Hierarchy, Eric J. Whitney, Luis F. Gonzalez, Jacques Pйriaux; Distributed Multidisciplinary Design Optimisation in Aeronautics using Evolutionary Algorithms, Game Theory and Hierarchy, Eric J. Whitney, Luis F. Gonzalez, Jacques Pйriaux.
Автор: Patrick Echlin; C.E. Fiori; Joseph Goldstein; Davi Название: Advanced Scanning Electron Microscopy and X-Ray Microanalysis ISBN: 1475790295 ISBN-13(EAN): 9781475790290 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book has its origins in the intensive short courses on scanning elec- tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.
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