Defect and Fault Tolerance in VLSI Systems, C.H. Stapper; V.K. Jain; Gabriele Saucier

Автор: C.H. Stapper; V.K. Jain; Gabriele Saucier
Название: Defect and Fault Tolerance in VLSI Systems
ISBN: 1475799594 ISBN-13(EAN): 9781475799590
Издательство: Springer
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Описание: Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems.

Автор: Jos? Pineda de Gyvez
Название: Integrated Circuit Defect-Sensitivity: Theory and Computational Models
ISBN: 0792393066 ISBN-13(EAN): 9780792393061
Издательство: Springer
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Описание: Spot defects are random phenomena present in every fabrication line. As technological processes mature towards submicron features, the effect of these defects on the functional and parametric behavior of the IC becomes crucial. This title reviews the importance of a defect-sensitivity analysis in contemporary VLSI design procedures.

Автор: Emilio Scalise
Название: Vibrational Properties of Defective Oxides and 2D Nanolattices
ISBN: 3319071815 ISBN-13(EAN): 9783319071817
Издательство: Springer
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Описание: Introduction.- Theoretical Methods.- First-Principles Modelling of Vibrational Modes in Defective Oxides.- Vibrational Properties of Silicene and Germanene.- Interaction of Silicene with Non-Metallic Layered Templates.- Conclusions and Perspectives.- Appendix for Experimental Techniques.

Автор: Manoj Sachdev; Jose Pineda de Gyvez
Название: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
ISBN: 1441942858 ISBN-13(EAN): 9781441942852
Издательство: Springer
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Описание: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.