Defect and Fault Tolerance in VLSI Systems, C.H. Stapper; V.K. Jain; Gabriele Saucier

Автор: Jos? Pineda de Gyvez
Название: Integrated Circuit Defect-Sensitivity: Theory and Computational Models
ISBN: 0792393066 ISBN-13(EAN): 9780792393061
Издательство: Springer
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Цена: 18167.00 р.
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Описание: Spot defects are random phenomena present in every fabrication line. As technological processes mature towards submicron features, the effect of these defects on the functional and parametric behavior of the IC becomes crucial. This title reviews the importance of a defect-sensitivity analysis in contemporary VLSI design procedures.

Автор: Manoj Sachdev; Jose Pineda de Gyvez
Название: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
ISBN: 1441942858 ISBN-13(EAN): 9781441942852
Издательство: Springer
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Цена: 26120.00 р.
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Описание: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.

Автор: Jos? Pineda de Gyvez
Название: Integrated Circuit Defect-Sensitivity: Theory and Computational Models
ISBN: 1461363837 ISBN-13(EAN): 9781461363835
Издательство: Springer
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Цена: 18167.00 р.
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Описание: The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC`s).

Автор: Hans-Joachim Queisser; Johann-Martin Spaeth; Haral
Название: Point Defects in Semiconductors and Insulators
ISBN: 3642627226 ISBN-13(EAN): 9783642627224
Издательство: Springer
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Цена: 25155.00 р.
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Описание: The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap- peared about 10 years ago.

Автор: C.H. Stapper; V.K. Jain; Gabriele Saucier
Название: Defect and Fault Tolerance in VLSI Systems
ISBN: 0306435314 ISBN-13(EAN): 9780306435317
Издательство: Springer
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Цена: 30606.00 р.
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Описание: Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems.

Автор: Telman Aliev
Название: Digital Noise Monitoring of Defect Origin
ISBN: 1441944109 ISBN-13(EAN): 9781441944108
Издательство: Springer
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Цена: 23757.00 р.
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Описание: This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise.