Integrated Circuit Defect-Sensitivity: Theory and Computational Models, Jos? Pineda de Gyvez

Автор: Grosz
Название: High Sensitivity Magnetometers
ISBN: 3319340689 ISBN-13(EAN): 9783319340685
Издательство: Springer
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Цена: 25155.00 р.
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Описание: This book gathers, for the first time, an overview of nearly all of the magnetic sensors that exist today. The book is offering the readers a thorough and comprehensive knowledge from basics to state-of-the-art and is therefore suitable for both beginners and experts. From the more common and popular AMR magnetometers and up to the recently developed NV center magnetometers, each chapter is describing a specific type of sensor and providing all the information that is necessary to understand the magnetometer behavior including theoretical background, noise model, materials, electronics, design and fabrication techniques, etc.

Автор: C.H. Stapper; V.K. Jain; Gabriele Saucier
Название: Defect and Fault Tolerance in VLSI Systems
ISBN: 1475799594 ISBN-13(EAN): 9781475799590
Издательство: Springer
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Цена: 20962.00 р.
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Описание: Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems.

Автор: X.J. Fan; E. Suhir
Название: Moisture Sensitivity of Plastic Packages of IC Devices
ISBN: 1461426251 ISBN-13(EAN): 9781461426257
Издательство: Springer
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Цена: 34937.00 р.
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Описание: This book provides information on the state-of-the-art techniques and methodologies related to moisture issues in plastic packages. It includes numerous industrial applications, along with the results of the most recent research and development efforts.

Автор: A. L. Dontchev
Название: Perturbations, Approximations and Sensitivity Analysis of Optimal Control Systems
ISBN: 3540124632 ISBN-13(EAN): 9783540124634
Издательство: Springer
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Цена: 12157.00 р.
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Автор: C.H. Stapper; V.K. Jain; Gabriele Saucier
Название: Defect and Fault Tolerance in VLSI Systems
ISBN: 0306435314 ISBN-13(EAN): 9780306435317
Издательство: Springer
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Цена: 30606.00 р.
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Описание: Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems.

Автор: Manoj Sachdev; Jose Pineda de Gyvez
Название: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
ISBN: 1441942858 ISBN-13(EAN): 9781441942852
Издательство: Springer
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Цена: 26120.00 р.
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Описание: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.

Автор: Pierre Deymier; Keith Runge; Krishna Muralidharan
Название: Multiscale Paradigms in Integrated Computational Materials Science and Engineering
ISBN: 3319343548 ISBN-13(EAN): 9783319343549
Издательство: Springer
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Цена: 15672.00 р.
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Описание: This book presents cutting-edge concepts, paradigms, and research highlights in the field of computational materials science and engineering, and provides a fresh, up-to-date perspective on solving present and future materials challenges.