Контакты/Проезд  Доставка и Оплата Помощь/Возврат
История
  +7(495) 980-12-10
  пн-пт: 10-18 сб,вс: 11-18
  shop@logobook.ru
   
    Поиск книг                    Поиск по списку ISBN Расширенный поиск    
Найти
  Зарубежные издательства Российские издательства  
Авторы | Каталог книг | Издательства | Новинки | Учебная литература | Акции | Хиты | |
 

Optical Metrology for Fluids, Combustion and Solids, Carolyn Mercer


Варианты приобретения
Цена: 24456.00р.
Кол-во:
Наличие: Поставка под заказ.  Есть в наличии на складе поставщика.
Склад Америка: Есть  
При оформлении заказа до: 2025-07-28
Ориентировочная дата поставки: Август-начало Сентября
При условии наличия книги у поставщика.

Добавить в корзину
в Мои желания

Автор: Carolyn Mercer
Название:  Optical Metrology for Fluids, Combustion and Solids
ISBN: 9781402074073
Издательство: Springer
Классификация:
ISBN-10: 1402074077
Обложка/Формат: Hardcover
Страницы: 459
Вес: 0.95 кг.
Дата издания: 31.07.2003
Язык: English
Размер: 164 x 241 x 33
Основная тема: Physics
Ссылка на Издательство: Link
Рейтинг:
Поставляется из: Германии
Описание: The invention of the laser, the computer and microelectronics has enabled a measurement revolution such that virtually every parameter of engineering interest can be measured. This handbook presents the assemblage of the techniques necessary to provide a basic understanding of optical measurement for fluids, combustion, and solids.


Handbook of Optical Metrology

Название: Handbook of Optical Metrology
ISBN: 1138112089 ISBN-13(EAN): 9781138112087
Издательство: Taylor&Francis
Рейтинг:
Цена: 12554.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание:

The field of optical metrology offers a wealth of both practical and theoretical accomplishments, and can cite any number of academic papers recording such. However, while several books covering specific areas of optical metrology do exist, until the pages herein were researched, written, and compiled, the field lacked for a comprehensive handbook, one providing an overview of optical metrology that covers practical applications as well as fundamentals.

Carefully designed to make information accessible to beginners without sacrificing academic rigor, the Handbook of Optical Metrology: Principles and Applications discusses fundamental principles and techniques before exploring practical applications.

With contributions from veterans in the field, as well as from up-and-coming researchers, the Handbook offers 30 substantial and well-referenced chapters. In addition to the introductory matter, forward-thinking descriptions are included in every chapter that make this a valuable reference for all those involved with optical metrology.

Quantum Metrology, Imaging, and Communication

Автор: David S. Simon; Gregg Jaeger; Alexander V. Sergien
Название: Quantum Metrology, Imaging, and Communication
ISBN: 331946549X ISBN-13(EAN): 9783319465494
Издательство: Springer
Рейтинг:
Цена: 16769.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.

Optical Absorption and Dispersion in Solids

Автор: John Noel. Hodgson
Название: Optical Absorption and Dispersion in Solids
ISBN: 1461333237 ISBN-13(EAN): 9781461333234
Издательство: Springer
Рейтинг:
Цена: 6986.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: The electromagnetic theory of Maxwell and the electron theory of Lorentz and Drude stimulated a great deal of experimental work on the optical properties of solids in the late nineteenth and early twentieth centuries.

A Practical Guide to Surface Metrology

Автор: Michael Quinten
Название: A Practical Guide to Surface Metrology
ISBN: 3030294536 ISBN-13(EAN): 9783030294533
Издательство: Springer
Рейтинг:
Цена: 13974.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This book offers a genuinely practical introduction to the most commonly encountered optical and non-optical systems used for the metrology and characterization of surfaces, including guidance on best practice, calibration, advantages and disadvantages, and interpretation of results. It enables the user to select the best approach in a given context.Most methods in surface metrology are based upon the interaction of light or electromagnetic radiation (UV, NIR, IR), and different optical effects are utilized to get a certain optical response from the surface; some of them record only the intensity reflected or scattered by the surface, others use interference of EM waves to obtain a characteristic response from the surface. The book covers techniques ranging from microscopy (including confocal, SNOM and digital holographic microscopy) through interferometry (including white light, multi-wavelength, grazing incidence and shearing) to spectral reflectometry and ellipsometry. The non-optical methods comprise tactile methods (stylus tip, AFM) as well as capacitive and inductive methods (capacitive sensors, eddy current sensors).The book provides:Overview of the working principlesDescription of advantages and disadvantagesCurrently achievable numbers for resolutions, repeatability, and reproducibilityExamples of real-world applicationsA final chapter discusses examples where the combination of different surface metrology techniques in a multi-sensor system can reasonably contribute to a better understanding of surface properties as well as a faster characterization of surfaces in industrial applications. The book is aimed at scientists and engineers who use such methods for the measurement and characterization ofsurfaces across a wide range of fields and industries, including electronics, energy, automotive and medical engineering.

Frequency Standards and Metrology

Автор: Andrea De Marchi
Название: Frequency Standards and Metrology
ISBN: 3642745032 ISBN-13(EAN): 9783642745034
Издательство: Springer
Рейтинг:
Цена: 15672.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Fringe Pattern Analysis for Optical Metrology - Theory, Algorithms, and Applications

Автор: Servin
Название: Fringe Pattern Analysis for Optical Metrology - Theory, Algorithms, and Applications
ISBN: 3527411526 ISBN-13(EAN): 9783527411528
Издательство: Wiley
Рейтинг:
Цена: 18842.00 р.
Наличие на складе: Поставка под заказ.

Описание: The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology.

Advances in Optical Form and Coordinate Metrology

Автор: Richard Leach
Название: Advances in Optical Form and Coordinate Metrology
ISBN: 0750325224 ISBN-13(EAN): 9780750325226
Издательство: INGRAM PUBLISHER SERVICES UK
Рейтинг:
Цена: 25344.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Many recent studies argue that domestic factors such as corruption, nepotism, and Confucian traditions of government and society prevented the industrial enterprises initiated by China from 1870 to 1911 from achieving success. Dr. Thomas takes a different view, showing that foreign intervention had more influence than purely domestic concerns on the nation`s industrialization efforts.

Quantum Metrology, Imaging, and Communication

Автор: Simon David S., Jaeger Gregg, Sergienko Alexander V.
Название: Quantum Metrology, Imaging, and Communication
ISBN: 3319835408 ISBN-13(EAN): 9783319835402
Издательство: Springer
Рейтинг:
Цена: 20962.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.

Optical Properties of Solids

Автор: Fox, Mark
Название: Optical Properties of Solids
ISBN: 0199573379 ISBN-13(EAN): 9780199573370
Издательство: Oxford Academ
Рейтинг:
Цена: 6176.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: The second edition of this successful textbook provides an up-to-date account of the optical physics of solids. All of the chapters have been updated and improved, and new sections on optical control of spin, quantum dots, plasmonics, negative refraction, carbon nanostructures and diamond NV centres have been added.

Optical Metrology

Автор: Oliv?rio D.D. Soares
Название: Optical Metrology
ISBN: 9401081158 ISBN-13(EAN): 9789401081153
Издательство: Springer
Рейтинг:
Цена: 12157.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Proceedings of the NATO Advanced Study Institute held in Viana do Castelo, Portugal, July 16-27, 1984


ООО "Логосфера " Тел:+7(495) 980-12-10 www.logobook.ru
   В Контакте     В Контакте Мед  Мобильная версия