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A Practical Guide to Surface Metrology, Michael Quinten


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Цена: 13974.00р.
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Автор: Michael Quinten
Название:  A Practical Guide to Surface Metrology
ISBN: 9783030294533
Издательство: Springer
Классификация:





ISBN-10: 3030294536
Обложка/Формат: Hardcover
Страницы: 230
Вес: 0.55 кг.
Дата издания: 2019
Серия: Springer Series in Measurement Science and Technology
Язык: English
Издание: 1st ed. 2019
Иллюстрации: 100 tables, color; 100 illustrations, color; 56 illustrations, black and white; xxv, 230 p. 156 illus., 100 illus. in color.
Размер: 234 x 156 x 16
Читательская аудитория: Professional & vocational
Основная тема: Physics
Ссылка на Издательство: Link
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Поставляется из: Германии
Описание: This book offers a genuinely practical introduction to the most commonly encountered optical and non-optical systems used for the metrology and characterization of surfaces, including guidance on best practice, calibration, advantages and disadvantages, and interpretation of results. It enables the user to select the best approach in a given context.Most methods in surface metrology are based upon the interaction of light or electromagnetic radiation (UV, NIR, IR), and different optical effects are utilized to get a certain optical response from the surface; some of them record only the intensity reflected or scattered by the surface, others use interference of EM waves to obtain a characteristic response from the surface. The book covers techniques ranging from microscopy (including confocal, SNOM and digital holographic microscopy) through interferometry (including white light, multi-wavelength, grazing incidence and shearing) to spectral reflectometry and ellipsometry. The non-optical methods comprise tactile methods (stylus tip, AFM) as well as capacitive and inductive methods (capacitive sensors, eddy current sensors).The book provides:Overview of the working principlesDescription of advantages and disadvantagesCurrently achievable numbers for resolutions, repeatability, and reproducibilityExamples of real-world applicationsA final chapter discusses examples where the combination of different surface metrology techniques in a multi-sensor system can reasonably contribute to a better understanding of surface properties as well as a faster characterization of surfaces in industrial applications. The book is aimed at scientists and engineers who use such methods for the measurement and characterization ofsurfaces across a wide range of fields and industries, including electronics, energy, automotive and medical engineering.
Дополнительное описание: Preface.- Introduction to Surfaces and Surface Metrology.- Tactile Surface Metrology.- Capacitive And Inductive Surface Metrology.- Optical Surface Metrology- Physical Basics.- Optical Surface Metrology - Methods .- Imaging Methods - Multisensor - Systems



Machine Tool Metrology

Автор: Graham T. Smith
Название: Machine Tool Metrology
ISBN: 3319251074 ISBN-13(EAN): 9783319251073
Издательство: Springer
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Цена: 25155.00 р.
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Описание: Machine Tools - an Introduction.- Laser Instrumentation and Calibration.- Optical Instrumentation for Machine Calibration.- Telescoping Ballbars and other Diagnostic Intrumentation.- Artefacts for Machine Verification.- Machine Tool Performance - Spindle Analysis; Corrosion and Oil Debris Monitoring; Thermography.- Uncertainty of Measurement and Statistical Process Control.- Machine Tool Reliability.- Total Productive Maintenance (TPM) and Reliability-centred Maintenance (RCM).

Distributed Large-Scale Dimensional Metrology

Автор: Fiorenzo Franceschini; Maurizio Galetto; Domenico
Название: Distributed Large-Scale Dimensional Metrology
ISBN: 1447158393 ISBN-13(EAN): 9781447158394
Издательство: Springer
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Цена: 19589.00 р.
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Описание: The new idea of using WSNs for large-scale dimensional metrology has led to the design of distributed systems, subverting classic approaches and providing unique advantages such as portability and flexibility. This book explores the cutting edge in this field.

Metrology and Standardization of Nanotechnology - Protocols and Industrial Innovations

Автор: Mansfield
Название: Metrology and Standardization of Nanotechnology - Protocols and Industrial Innovations
ISBN: 3527340394 ISBN-13(EAN): 9783527340392
Издательство: Wiley
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Цена: 27078.00 р.
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Описание: Meeting the need for a reliable handbook on pertinent metrology approaches in nanomaterials, experts from European, American and Asian standardization bodies provide a balanced and comprehensive overview of the state of the art, highlighting the importance of global standards.

High Definition Metrology Based Surface Quality Control and Applications

Автор: Shichang Du; Lifeng Xi
Название: High Definition Metrology Based Surface Quality Control and Applications
ISBN: 9811502781 ISBN-13(EAN): 9789811502781
Издательство: Springer
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Цена: 13974.00 р.
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Описание: This book provides insights into surface quality control techniques and applications based on high-definition metrology (HDM). Intended as a reference resource for engineers who routinely use a variety of quality control methods and are interested in understanding the data processing, from HDM data to final control actions, it can also be used as a textbook for advanced courses in engineering quality control applications for students who are already familiar with quality control methods and practices. It enables readers to not only assimilate the quality control methods involved, but also to quickly implement the techniques in practical engineering problems. Further, it includes numerous case studies to highlight the implementation of the methods using measured HDM data of surface features. Since MATLAB is extensively employed in these case studies, familiarity with this software is helpful, as is a general understanding of surface quality control methods.

Computational Surface and Roundness Metrology

Автор: Balasubramanian Muralikrishnan; Jayaraman Raja
Название: Computational Surface and Roundness Metrology
ISBN: 1849967733 ISBN-13(EAN): 9781849967730
Издательство: Springer
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Цена: 16977.00 р.
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Описание: This book provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. There are examples, illustrations and exercises included.

Information Modeling for Interoperable Dimensional Metrology

Автор: Y Zhao; T Kramer; Robert Brown; Xun Xu
Название: Information Modeling for Interoperable Dimensional Metrology
ISBN: 1447160290 ISBN-13(EAN): 9781447160298
Издательство: Springer
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Цена: 18284.00 р.
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Описание: This book analyzes interoperability issues in dimensional metrology systems and describes information modeling techniques. Coverage includes theory, techniques and key technologies, and explores new approaches for solving real-world interoperability problems.

Quantum metrology with photoelectrons, volume ii: applications and advances

Автор: Hockett, Paul
Название: Quantum metrology with photoelectrons, volume ii: applications and advances
ISBN: 1643270001 ISBN-13(EAN): 9781643270005
Издательство: Mare Nostrum (Eurospan)
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Цена: 11504.00 р.
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Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.

Fringe Pattern Analysis for Optical Metrology - Theory, Algorithms, and Applications

Автор: Servin
Название: Fringe Pattern Analysis for Optical Metrology - Theory, Algorithms, and Applications
ISBN: 3527411526 ISBN-13(EAN): 9783527411528
Издательство: Wiley
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Цена: 18842.00 р.
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Описание: The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology.

Quantum metrology with photoelectrons, volume i: foundations

Автор: Hockett, Paul
Название: Quantum metrology with photoelectrons, volume i: foundations
ISBN: 1681746859 ISBN-13(EAN): 9781681746852
Издательство: Mare Nostrum (Eurospan)
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Цена: 10811.00 р.
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Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications.The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.

Introduction to Quantum Metrology

Автор: Waldemar Nawrocki
Название: Introduction to Quantum Metrology
ISBN: 3030196763 ISBN-13(EAN): 9783030196769
Издательство: Springer
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Цена: 23757.00 р.
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Описание: This book discusses the theory of quantum effects used in metrology, and presents the author’s research findings in the field of quantum electronics. It also describes the quantum measurement standards used in various branches of metrology, such as those relating to electrical quantities, mass, length, time and frequency.The first comprehensive survey of quantum metrology problems, it introduces a new approach to metrology, placing a greater emphasis on its connection with physics, which is of importance for developing new technologies, nanotechnology in particular. Presenting practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a broad range of physicists and metrologists. It also promotes a better understanding and approval of the new system in both industry and academia.This second edition includes two new chapters focusing on the revised SI system and satellite positioning systems. Practical realization (mise en pratique) the base units (metre, kilogram, second, ampere, kelvin, candela, and mole), new defined in the revised SI, is presented in details. Another new chapter describes satellite positioning systems and their possible applications. In satellite positioning systems, like GPS, GLONASS, BeiDou and Galileo, quantum devices – atomic clocks – serve wide population of users.


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