High Definition Metrology Based Surface Quality Control and Applications, Shichang Du; Lifeng Xi
Автор: Raghavendra, N V; Krishnamurthy, L Название: Engineering Metrology and Measurements ISBN: 0198085494 ISBN-13(EAN): 9780198085492 Издательство: Oxford Academ Цена: 4750.00 р. Наличие на складе: Поставка под заказ.
Описание: Engineering Metrology and Measurements is a textbook designed for students of mechanical, production and allied disciplines to facilitate learning of various shop-floor measurement techniques and also understand the basics of mechanical measurements.
Автор: Balasubramanian Muralikrishnan; Jayaraman Raja Название: Computational Surface and Roundness Metrology ISBN: 1849967733 ISBN-13(EAN): 9781849967730 Издательство: Springer Рейтинг: Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. There are examples, illustrations and exercises included.
Автор: Michael Quinten Название: A Practical Guide to Surface Metrology ISBN: 3030294536 ISBN-13(EAN): 9783030294533 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book offers a genuinely practical introduction to the most commonly encountered optical and non-optical systems used for the metrology and characterization of surfaces, including guidance on best practice, calibration, advantages and disadvantages, and interpretation of results. It enables the user to select the best approach in a given context.Most methods in surface metrology are based upon the interaction of light or electromagnetic radiation (UV, NIR, IR), and different optical effects are utilized to get a certain optical response from the surface; some of them record only the intensity reflected or scattered by the surface, others use interference of EM waves to obtain a characteristic response from the surface. The book covers techniques ranging from microscopy (including confocal, SNOM and digital holographic microscopy) through interferometry (including white light, multi-wavelength, grazing incidence and shearing) to spectral reflectometry and ellipsometry. The non-optical methods comprise tactile methods (stylus tip, AFM) as well as capacitive and inductive methods (capacitive sensors, eddy current sensors).The book provides:Overview of the working principlesDescription of advantages and disadvantagesCurrently achievable numbers for resolutions, repeatability, and reproducibilityExamples of real-world applicationsA final chapter discusses examples where the combination of different surface metrology techniques in a multi-sensor system can reasonably contribute to a better understanding of surface properties as well as a faster characterization of surfaces in industrial applications. The book is aimed at scientists and engineers who use such methods for the measurement and characterization ofsurfaces across a wide range of fields and industries, including electronics, energy, automotive and medical engineering.
Автор: Y Zhao; T Kramer; Robert Brown; Xun Xu Название: Information Modeling for Interoperable Dimensional Metrology ISBN: 1447160290 ISBN-13(EAN): 9781447160298 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book analyzes interoperability issues in dimensional metrology systems and describes information modeling techniques. Coverage includes theory, techniques and key technologies, and explores new approaches for solving real-world interoperability problems.
Автор: Grabe, Michael Название: Truth and traceability in physics and metrology ISBN: 1643270974 ISBN-13(EAN): 9781643270975 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 9286.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Discusses a new error concept dispensing with the common practice to randomize unknown systematic errors. Instead, unknown systematic errors are treated as what they physically are - namely as constants being unknown with respect to magnitude and sign.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
Описание: Meeting the need for a reliable handbook on pertinent metrology approaches in nanomaterials, experts from European, American and Asian standardization bodies provide a balanced and comprehensive overview of the state of the art, highlighting the importance of global standards.
This book offers an in-depth discussion related to metrological aspects of automated tests. The accuracy of experimental estimates of test object performance is examined from the standpoint of their statistical variance and systematic biases.
The proposed metrological model of automated tests allows to determine the metrological characteristics of measurement means using data from their static and dynamic calibrations. Knowledge of these characteristics provides an ability to examine their impact on the accuracy of test results for the purposes of estimating statistical uncertainties caused by instrumentation errors and eliminating biases that occur as a consequence of inertial properties of measurement means.
Optimization of requirements for measurement errors to ensure a given accuracy of test results is discussed as well.
Proposed approaches and described methods are illustrated by test examples of turbomachinery products.
Автор: Jiang, X. Jane Название: Advanced Metrology ISBN: 0128218150 ISBN-13(EAN): 9780128218150 Издательство: Elsevier Science Рейтинг: Цена: 26444.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Advanced Metrology: Freeform Surfaces provides the perfect guide for engineering designers and manufacturers interested in exploring the benefits of this technology. The inclusion of industrial case studies and examples will help readers to implement these techniques which are being developed across different industries as they offer improvements to the functional performance of products and reduce weight and cost.
Автор: S. V. Gupta Название: Mass Metrology ISBN: 3030124649 ISBN-13(EAN): 9783030124649 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This second edition of Mass Metrology: The Newly Defined Kilogram has been thoroughly revised to reflect the recent redefinition of the kilogram in terms of Planck’s constant. The necessity of defining the kilogram in terms of physical constants was already underscored in the first edition. However, the kilogram can also be defined in terms of Avogadro’s number, using a collection of ions of heavy elements, by the levitation method, or using voltage and watt balances. The book also addresses the concepts of gravitational, inertial and conventional mass, and describes in detail the variation of acceleration due to gravity. Further topics covered in this second edition include: the effect of gravity variations on the reading of electronic balances derived with respect to latitude, altitude and earth topography; the classification of weights by the OIML; and maximum permissible error in different categories of weights prescribed by national and international organizations. The book also discusses group weighing techniques and the use of nanotechnology for the detection of mass differences as small as 10-24 g. Last but not least, readers will find details on the XRCD method for defining the kilogram in terms of Planck’s constant.
Автор: B.F. Dyson; S. Loveday; M.G. Gee Название: Materials Metrology and Standards for Structural Performance ISBN: 0412582708 ISBN-13(EAN): 9780412582707 Издательство: Springer Рейтинг: Цена: 32652.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Deals with materials metrology and standards for engineering design. This book includes an examination of metrological considerations as well as investigating the many measurement and control techniques. It is of interest to materials scientists and engineers from graduates to experienced professionals.
ООО "Логосфера " Тел:+7(495) 980-12-10 www.logobook.ru
