High-Resolution Electron Microscopy for Materials Science, Daisuke Shindo; Hiraga Kenji
Автор: Michler G.H. Название: Electron Microscopy of Polymers ISBN: 3540363505 ISBN-13(EAN): 9783540363507 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.
Автор: Brent Fultz; James Howe Название: Transmission Electron Microscopy and Diffractometry of Materials ISBN: 3642433154 ISBN-13(EAN): 9783642433153 Издательство: Springer Рейтинг: Цена: 13059.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book explains aspects of transmission electron microscopy and x-ray diffractometry that are important for characterization of materials. The 4th edition adds new techniques such as electron tomography, nanobeam diffraction and geometric phase analysis.
Автор: David G. Rickerby; Giovanni Valdr?; Ugo Valdr? Название: Impact of Electron and Scanning Probe Microscopy on Materials Research ISBN: 0792359402 ISBN-13(EAN): 9780792359401 Издательство: Springer Рейтинг: Цена: 18167.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Covers diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. This book covers specialized electron diffraction techniques, and the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis.
Автор: Zewail, A.H. Название: 4D Electron Microscopy ISBN: 1848164009 ISBN-13(EAN): 9781848164000 Издательство: World Scientific Publishing Рейтинг: Цена: 6336.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Compares the merits of coherent electron waves with those of synchrotron radiation. This book exposes the paradigm concepts and the developed techniques that can be executed to gain knowledge in the entire domain of biological and physical science, and in the four dimensions of space and time.
Автор: Zurch, Michael Werner Название: High-resolution extreme ultraviolet microscopy ISBN: 3319123874 ISBN-13(EAN): 9783319123875 Издательство: Springer Рейтинг: Цена: 15372.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Finally, this book presents a newly developed technique of generating structured illumination by means of so-called optical vortex beams in the extreme ultraviolet regime and proposes its general usability for super-resolution imaging.
Автор: Michael Werner Z?rch Название: High-Resolution Extreme Ultraviolet Microscopy ISBN: 3319385658 ISBN-13(EAN): 9783319385655 Издательство: Springer Рейтинг: Цена: 13059.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Finally, this book presents a newly developed technique of generating structured illumination by means of so-called optical vortex beams in the extreme ultraviolet regime and proposes its general usability for super-resolution imaging.
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