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4D Electron Microscopy, Zewail, A.H.


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Цена: 4857р.
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Наличие: Поставка под заказ.  Есть в наличии на складе поставщика.
Склад Англия: 51 шт.  Склад Америка: 133 шт.  
При оформлении заказа до: 13 дек 2019
Ориентировочная дата поставки: начало Февраля

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Автор: Zewail, A.H.
Название:  4D Electron Microscopy   (А. Х. Цевайл: 4D электронный микроскоп)
Издательство: World Scientific Publishing
Классификация:
Научное оборудование и методы, лабораторное оборудование
Физическая химия

ISBN: 1848164009
ISBN-13(EAN): 9781848164000
ISBN: 1-84816-400-9
ISBN-13(EAN): 978-1-84816-400-0
Обложка/Формат: Paperback
Страницы: 360
Вес: 0.664 кг.
Дата издания: 2010  
Язык: ENG
Иллюстрации: Colour illustrations, figures
Размер: 24.38 x 16.26 x 1.78 cm
Читательская аудитория: Postgraduate, research & scholarly
Подзаголовок: Imaging in space and time
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Поставляется из: Англии
Описание: Compares the merits of coherent electron waves with those of synchrotron radiation. This book exposes the paradigm concepts and the developed techniques that can be executed to gain knowledge in the entire domain of biological and physical science, and in the four dimensions of space and time.
Дополнительное описание:




Electron Microscopy of Polymers

Автор: Goerg H. Michler
Название: Electron Microscopy of Polymers
ISBN: 364207166X ISBN-13(EAN): 9783642071669
Издательство: Springer
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Цена: 11358 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: The study of polymers by electron microscopy (EM) needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy, are given in this hands-on book.

New Horizons of Applied Scanning Electron Microscopy

Автор: Kenichi Shimizu; Tomoaki Mitani
Название: New Horizons of Applied Scanning Electron Microscopy
ISBN: 3642031595 ISBN-13(EAN): 9783642031595
Издательство: Springer
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Цена: 13107 р.
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Описание: In modern scanning electron microscopy, sample surface preparation is of key importance. This book presents the procedures for sample surface preparation, thereby facilitating unprecedented capabilities with advanced scanning electron microscopes.

Correlative Light and Electron MIcroscopy,111

Автор: Thomas Mueller-Reichert
Название: Correlative Light and Electron MIcroscopy,111
ISBN: 0124160263 ISBN-13(EAN): 9780124160262
Издательство: Elsevier Science
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Цена: 10856 р. 12062.00 -10%
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Описание: The combination of electron microscopy with transmitted light microscopy (termed correlative light and electron microscopy; CLEM) has been employed for decades to generate molecular identification that can be visualized by a dark, electron-dense precipitate. This new volume of Methods in Cell Biology covers many areas of CLEM, includinga brief history and overview on CLEM methods, imaging of intermediate stages of meiotic spindle assembly in C. elegans embryos using CLEM, and capturing endocytic segregation events with HPF-CLEM.

High-resolution Electron Microscopy

Автор: Spence John C H
Название: High-resolution Electron Microscopy
ISBN: 0199668639 ISBN-13(EAN): 9780199668632
Издательство: Oxford Academ
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Цена: 10408 р.
Наличие на складе: Нет в наличии.

Описание: This book gives the basic theoretical background needed to understand how electron microscopes allow us to see atoms, together with highly practical advice for electron microscope operators. It covers the usefulness of seeing atoms in the semiconductor industry, in materials science, in condensed matter physics, and in biology.

In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science

Автор: Dehm
Название: In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science
ISBN: 3527319735 ISBN-13(EAN): 9783527319732
Издательство: Wiley
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Цена: 13063 р.
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Описание: Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples.

Low Voltage Electron Microscopy: Principles and  Applications

Автор: Bell
Название: Low Voltage Electron Microscopy: Principles and Applications
ISBN: 111997111X ISBN-13(EAN): 9781119971115
Издательство: Wiley
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Цена: 8752 р.
Наличие на складе: Нет в наличии.

Описание: Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing.

Transmission Electron Microscopy

Автор: Ludwig Reimer; Helmut Kohl
Название: Transmission Electron Microscopy
ISBN: 144192308X ISBN-13(EAN): 9781441923080
Издательство: Springer
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Цена: 14492 р.
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Описание: This text, the standard of the field, includes an overview of such topics as the theory of image and contrast formation as well as discussion of recent progress in the field, especially in the areas of aberration corrector and energy filtering.

Electron Beam-Specimen Interactions and Applications in Microscopy

Автор: Mendis
Название: Electron Beam-Specimen Interactions and Applications in Microscopy
ISBN: 1118456092 ISBN-13(EAN): 9781118456095
Издательство: Wiley
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Цена: 9771 р.
Наличие на складе: Нет в наличии.

Описание: A detailed presentation of the physics of electron beam-specimen interactions Electron microscopy is one of the most widely used characterisation techniques in materials science, physics, chemistry, and the life sciences.

Electron Microscopy

Автор: Kuo John
Название: Electron Microscopy
ISBN: 1627037756 ISBN-13(EAN): 9781627037754
Издательство: Springer
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Цена: 21504 р.
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Modeling Nanoscale Imaging in Electron Microscopy

Автор: Thomas Vogt; Wolfgang Dahmen; Peter Binev
Название: Modeling Nanoscale Imaging in Electron Microscopy
ISBN: 1489997288 ISBN-13(EAN): 9781489997289
Издательство: Springer
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Цена: 10485 р.
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Описание: This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

Aberration-Corrected Imaging In Transmission Electron Microscopy: An Introduction (2Nd Edition)

Автор: Erni Rolf
Название: Aberration-Corrected Imaging In Transmission Electron Microscopy: An Introduction (2Nd Edition)
ISBN: 1783265280 ISBN-13(EAN): 9781783265282
Издательство: World Scientific Publishing
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Цена: 11050 р.
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Описание: Aberration-Corrected Imaging In Transmission Electron Microscopy Provides An Introduction To Aberration-Corrected Atomic-Resolution Electron Microscopy Imaging In Materials And Physical Sciences. It Covers Both The Broad Beam Transmission Mode (Tem; Transmission Electron Microscopy) And The Scanning Transmission Mode (Stem; Scanning Transmission Electron Microscopy). The Book Is Structured In Three Parts. The First Part Introduces The Basics Of Conventional Atomic-Resolution Electron Microscopy Imaging In Tem And Stem Modes. This Part Also Describes Limits Of Conventional Electron Microscopes And Possible Artefacts Which Are Caused By The Intrinsic Lens Aberrations That Are Unavoidable In Such Instruments. The Second Part Introduces Fundamental Electron Optical Concepts And Thus Provides A Brief Introduction To Electron Optics. Based On The First And Second Parts Of The Book, The Third Part Focuses On Aberration Correction; It Describes The Various Aberrations In Electron Microscopy And Introduces The Concepts Of Spherical Aberration Correctors And Advanced Aberration Correctors, Including Correctors For Chromatic Aberration. This Part Also Provides Guidelines On How To Optimize The Imaging Conditions For Atomic-Resolution Stem And Tem Imaging.This Second Edition Has Been Completely Revised And Updated In Order To Incorporate The Very Recent Technological And Scientific Achievements That Have Been Realized Since The First Edition Appeared In 2010.

Electron Microscopy in Biology A Practical Approach (Paperback)

Автор: Harris, Robin
Название: Electron Microscopy in Biology A Practical Approach (Paperback)
ISBN: 0199632154 ISBN-13(EAN): 9780199632152
Издательство: Oxford Academ
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Цена: 8847 р.
Наличие на складе: Нет в наличии.

Описание: Transmission electron microscopy is one of the most important and popular forms of microscopy used in biomedical research. This is a broadly based compilation of the most important specimen preparation techniques and their applications. It provides detailed protocols for a wide range of procedures relating to the electron microscopy of tissues, cells, and their components with the emphasis on biomedical applications. The fundamental methods for specimen preparation,tissue fixation, embedding, and sectioning are covered in depth and are followed by the more specialist techniques of freeze-substitution, immunogold labelling, autoradiography, and enzyme histochemistry.


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