Testing and Reliable Design of CMOS Circuits, Niraj K. Jha; Sandip Kundu
Автор: Lee Название: The Design of CMOS Radio-Frequency Integrated Circuits ISBN: 0521835399 ISBN-13(EAN): 9780521835398 Издательство: Cambridge Academ Рейтинг: Цена: 14890.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book, first published in 2004, is an expanded and revised edition of Tom Lee`s acclaimed guide to the design of gigahertz RF integrated circuits. Major changes include a new chapter on the principles of wireless systems and an update to the chapter on architectures to include examples of complete designs.
Автор: Srinivasan Murali Название: Designing Reliable and Efficient Networks on Chips ISBN: 904818200X ISBN-13(EAN): 9789048182008 Издательство: Springer Рейтинг: Цена: 19589.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The book provides state-of-the-art methods to solve some of the most important problems encountered during NoC design. It is the first book to present in depth the state-of-the-art algorithms and optimization models for performing system-level design of NoCs.
Автор: Manoj Sachdev; Jose Pineda de Gyvez Название: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits ISBN: 1441942858 ISBN-13(EAN): 9781441942852 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.
Автор: Koeppl Название: Design and Analysis of Bio-molecular Circuits ISBN: 1441967656 ISBN-13(EAN): 9781441967657 Издательство: Springer Рейтинг: Цена: 26122.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The book deals with engineering aspects of the two emerging and intertwined fields of synthetic and systems biology. Both fields hold promise to revolutionize the way molecular biology research is done, the way today’s drug discovery works and the way bio-engineering is done. Both fields stress the importance of building and characterizing small bio-molecular networks in order to synthesize incrementally and understand large complex networks inside living cells. Reminiscent of computer-aided design (CAD) of electronic circuits, abstraction is believed to be the key concept to achieve this goal. It allows hiding the overwhelming complexity of cellular processes by encapsulating network parts into abstract modules. This book provides a unique perspective on how concepts and methods from CAD of electronic circuits can be leveraged to overcome complexity barrier perceived in synthetic and systems biology.
Автор: Angela Krstic; Kwang-Ting (Tim) Cheng Название: Delay Fault Testing for VLSI Circuits ISBN: 1461375614 ISBN-13(EAN): 9781461375616 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech- niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.
Автор: J. Altet; Antonio Rubio Название: Thermal Testing of Integrated Circuits ISBN: 144195287X ISBN-13(EAN): 9781441952875 Издательство: Springer Рейтинг: Цена: 14673.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.
Автор: Luciano Lavagno; Alberto L. Sangiovanni-Vincentell Название: Algorithms for Synthesis and Testing of Asynchronous Circuits ISBN: 1461364108 ISBN-13(EAN): 9781461364108 Издательство: Springer Рейтинг: Цена: 30745.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The book is intended for asynchronous hardware designers, for computer-aided tool experts, and for digital designers interested in ex- ploring the possibility of designing asynchronous circuits.
Автор: Kai-hui Chang; Igor L. Markov; Valeria Bertacco Название: Functional Design Errors in Digital Circuits ISBN: 9048181127 ISBN-13(EAN): 9789048181124 Издательство: Springer Рейтинг: Цена: 19589.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This text covers innovative methods to automate the debugging process throughout the design flow, enabling the production of more reliable electronic devices. It offers many examples and figures to illustrate key concepts and algorithms.
Автор: Ravi K. Gulati; Charles F. Hawkins Название: IDDQ Testing of VLSI Circuits ISBN: 1461363772 ISBN-13(EAN): 9781461363774 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported.
Автор: Heinz Koeppl; Douglas Densmore; Gianluca Setti; Ma Название: Design and Analysis of Biomolecular Circuits ISBN: 1489995056 ISBN-13(EAN): 9781489995056 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Dealing with the engineering aspects of the two emerging and intertwined fields of synthetic and systems biology, this book reflects the promise they hold to revolutionize the way molecular biology research, drug discovery, and bio-engineering are done.
Автор: Rajesh Garg Название: Analysis and Design of Resilient VLSI Circuits ISBN: 1489985107 ISBN-13(EAN): 9781489985101 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: VLSI design has grown more challenging due to detrimental effects of radiation particle strikes and processing variations. This book describes the design of resilient VLSI circuits, presenting algorithms and techniques to analyze and mitigate design problems.
Описание: This book presents a framework for the reuse-based design of AMS circuits. The framework is founded on three key elements: (1) a CAD-supported hierarchical design flow; The book features a detailed tutorial and in-depth coverage of all issues and must-have properties of reusable AMS blocks.
ООО "Логосфера " Тел:+7(495) 980-12-10 www.logobook.ru
