IDDQ Testing of VLSI Circuits, Ravi K. Gulati; Charles F. Hawkins

Автор: Prashant Saxena; Rupesh S. Shelar; Sachin Sapatnek
Название: Routing Congestion in VLSI Circuits
ISBN: 0387300376 ISBN-13(EAN): 9780387300375
Издательство: Springer
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Описание: This volume provides a complete understanding of the fundamental causes of routing congestion in present-day and next-generation VLSI circuits, offers techniques for estimating and relieving congestion, and provides a critical analysis of the accuracy and effectiveness of these techniques.

Автор: Ravi K. Gulati; Charles F. Hawkins
Название: IDDQ Testing of VLSI Circuits
ISBN: 0792393155 ISBN-13(EAN): 9780792393153
Издательство: Springer
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Цена: 18167.00 р.
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Описание: For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient`s temperature to determine the state of health.

Автор: S. Chakravarty; Paul J. Thadikaran
Название: Introduction to IDDQ Testing
ISBN: 0792399455 ISBN-13(EAN): 9780792399452
Издательство: Springer
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Описание: Testing techniques for VLSI circuits are undergoing changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. This volume presents the findings of research in this area.

Автор: S. Chakravarty; Paul J. Thadikaran
Название: Introduction to IDDQ Testing
ISBN: 1461378125 ISBN-13(EAN): 9781461378129
Издательство: Springer
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Описание: This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers.

Автор: Manoj Sachdev; Jose Pineda de Gyvez
Название: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
ISBN: 1441942858 ISBN-13(EAN): 9781441942852
Издательство: Springer
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Цена: 26120.00 р.
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Описание: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.

Автор: Angela Krstic; Kwang-Ting (Tim) Cheng
Название: Delay Fault Testing for VLSI Circuits
ISBN: 1461375614 ISBN-13(EAN): 9781461375616
Издательство: Springer
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Цена: 19591.00 р.
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Описание: In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech- niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.

Автор: Ran Wang; Krishnendu Chakrabarty
Название: Testing of Interposer-Based 2.5D Integrated Circuits
ISBN: 3319547135 ISBN-13(EAN): 9783319547138
Издательство: Springer
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Цена: 15372.00 р.
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Описание: The authors describe a set of design-for-test methods to address various challenges posed by the new generation of 2.5D ICs, including pre-bond testing of the silicon interposer, at-speed interconnect testing, built-in self-test architecture, extest scheduling, and a programmable method for low-power scan shift in SoC dies.

Автор: J. Altet; Antonio Rubio
Название: Thermal Testing of Integrated Circuits
ISBN: 144195287X ISBN-13(EAN): 9781441952875
Издательство: Springer
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Описание: Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.

Автор: Niraj K. Jha; Sandip Kundu
Название: Testing and Reliable Design of CMOS Circuits
ISBN: 1461288185 ISBN-13(EAN): 9781461288183
Издательство: Springer
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Цена: 19564.00 р.
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Описание: In the last few years CMOS technology has become increas- ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. However, the rapid advance- ments in this area pose many new problems in the area of testing. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing.

Автор: Luciano Lavagno; Alberto L. Sangiovanni-Vincentell
Название: Algorithms for Synthesis and Testing of Asynchronous Circuits
ISBN: 1461364108 ISBN-13(EAN): 9781461364108
Издательство: Springer
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Цена: 30745.00 р.
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Описание: The book is intended for asynchronous hardware designers, for computer-aided tool experts, and for digital designers interested in ex- ploring the possibility of designing asynchronous circuits.

Автор: P. Antognetti; D.A. Antoniadis; Robert W. Dutton;
Название: Process and Device Simulation for MOS-VLSI Circuits
ISBN: 9400968442 ISBN-13(EAN): 9789400968448
Издательство: Springer
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Цена: 12157.00 р.
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Описание: Proceedings of the NATO Advanced Study Institute on Process and Device Simulation for MOS-VLSI Circuits, Sogesta, Urbino, Italy, July 12-23, 1982