IDDQ Testing of VLSI Circuits, Ravi K. Gulati; Charles F. Hawkins
Автор: S. Chakravarty; Paul J. Thadikaran Название: Introduction to IDDQ Testing ISBN: 0792399455 ISBN-13(EAN): 9780792399452 Издательство: Springer Рейтинг: Цена: 30606.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Testing techniques for VLSI circuits are undergoing changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. This volume presents the findings of research in this area.
Автор: Ravi K. Gulati; Charles F. Hawkins Название: IDDQ Testing of VLSI Circuits ISBN: 1461363772 ISBN-13(EAN): 9781461363774 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported.
Автор: Manoj Sachdev; Jose Pineda de Gyvez Название: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits ISBN: 1441942858 ISBN-13(EAN): 9781441942852 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.
Автор: Ran Wang; Krishnendu Chakrabarty Название: Testing of Interposer-Based 2.5D Integrated Circuits ISBN: 3319547135 ISBN-13(EAN): 9783319547138 Издательство: Springer Рейтинг: Цена: 15372.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The authors describe a set of design-for-test methods to address various challenges posed by the new generation of 2.5D ICs, including pre-bond testing of the silicon interposer, at-speed interconnect testing, built-in self-test architecture, extest scheduling, and a programmable method for low-power scan shift in SoC dies.
Автор: J. Altet; Antonio Rubio Название: Thermal Testing of Integrated Circuits ISBN: 144195287X ISBN-13(EAN): 9781441952875 Издательство: Springer Рейтинг: Цена: 14673.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.
Автор: Luciano Lavagno; Alberto L. Sangiovanni-Vincentell Название: Algorithms for Synthesis and Testing of Asynchronous Circuits ISBN: 1461364108 ISBN-13(EAN): 9781461364108 Издательство: Springer Рейтинг: Цена: 30745.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The book is intended for asynchronous hardware designers, for computer-aided tool experts, and for digital designers interested in ex- ploring the possibility of designing asynchronous circuits.
Автор: Xiao Liu; Qiang Xu Название: Trace-Based Post-Silicon Validation for VLSI Circuits ISBN: 3319005324 ISBN-13(EAN): 9783319005324 Издательство: Springer Рейтинг: Цена: 19564.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book surveys state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits, discusses key challenges in post-silicon validation and offers automated solutions that are systematic and cost-effective.
Автор: P. Antognetti; D.A. Antoniadis; Robert W. Dutton; Название: Process and Device Simulation for MOS-VLSI Circuits ISBN: 9400968442 ISBN-13(EAN): 9789400968448 Издательство: Springer Рейтинг: Цена: 12157.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of the NATO Advanced Study Institute on Process and Device Simulation for MOS-VLSI Circuits, Sogesta, Urbino, Italy, July 12-23, 1982
Автор: Prashant Saxena; Rupesh S. Shelar; Sachin Sapatnek Название: Routing Congestion in VLSI Circuits ISBN: 0387300376 ISBN-13(EAN): 9780387300375 Издательство: Springer Рейтинг: Цена: 22203.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This volume provides a complete understanding of the fundamental causes of routing congestion in present-day and next-generation VLSI circuits, offers techniques for estimating and relieving congestion, and provides a critical analysis of the accuracy and effectiveness of these techniques.
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