Thermal Testing of Integrated Circuits, J. Altet; Antonio Rubio

Автор: Qiang Cui; Juin J. Liou; Jean-Jacques Hajjar; Javi
Название: On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
ISBN: 3319358243 ISBN-13(EAN): 9783319358246
Издательство: Springer
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Цена: 11753.00 р.
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Описание: This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs` ESD safety level, while maximizing RF performance.

Автор: Edwin W. Greeneich
Название: Analog Integrated Circuits
ISBN: 0412085216 ISBN-13(EAN): 9780412085215
Издательство: Springer
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Цена: 23058.00 р.
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Описание: Analog Integrated Circuits deals with the design and analysis of modem analog circuits using integrated bipolar and field-effect transistor technologies. Included in this is an extensive coverage of feedback amplifiers, current-mode circuits, and translinear circuits.

Автор: Ran Wang; Krishnendu Chakrabarty
Название: Testing of Interposer-Based 2.5D Integrated Circuits
ISBN: 3319547135 ISBN-13(EAN): 9783319547138
Издательство: Springer
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Цена: 15372.00 р.
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Описание: The authors describe a set of design-for-test methods to address various challenges posed by the new generation of 2.5D ICs, including pre-bond testing of the silicon interposer, at-speed interconnect testing, built-in self-test architecture, extest scheduling, and a programmable method for low-power scan shift in SoC dies.

Автор: Nicholas Andrew Wasley
Название: Nano-photonics in III-V Semiconductors for Integrated Quantum Optical Circuits
ISBN: 3319348833 ISBN-13(EAN): 9783319348834
Издательство: Springer
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Цена: 13059.00 р.
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Описание: This thesis breaks new ground in the physics of photonic circuits for quantum optical applications, offering the first demonstration of a spin-photon interface using an all-waveguide geometry, and a number of other highly novel contributions to the field.

Автор: Geert Van der Plas; Georges Gielen; Willy M.C. San
Название: A Computer-Aided Design and Synthesis Environment for Analog Integrated Circuits
ISBN: 0792376978 ISBN-13(EAN): 9780792376972
Издательство: Springer
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Цена: 23508.00 р.
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Описание: Addresses the design methodologies and CAD tools available for the systematic design and design automation of analogue integrated circuits. This title discusses two complementary approaches that increase analogue design productivity, demonstrated throughout using design times of the different design experiments undertaken.

Автор: Carlos H. Diaz; Sung-Mo (Steve) Kang; Charvaka Duv
Название: Modeling of Electrical Overstress in Integrated Circuits
ISBN: 0792395050 ISBN-13(EAN): 9780792395058
Издательство: Springer
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Цена: 26546.00 р.
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Описание: Electrical overstress (EOS) and Electrostatic discharge (ESD) pose as one of the threats to integrated circuits (ICs). This book analyzes the EOS/ESD-related failures in I/O protection devices in integrated circuits. This book is intended for VLSI designers, reliability engineers and those working on the development of EOS/ESD analysis tools.

Автор: Nishath K. Verghese; Timothy J. Schmerbeck; David
Название: Simulation Techniques and Solutions for Mixed-Signal Coupling in Integrated Circuits
ISBN: 0792395441 ISBN-13(EAN): 9780792395447
Издательство: Springer
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Цена: 26120.00 р.
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Описание: This text addresses two major issues of the mixed-signal coupling problem - how to simulate it and how to overcome it. It identifies some of the problems that will be encountered, gives examples of actual hardware experiences, offers simulation techniques and suggests possible solutions.

Автор: D.M. Walker
Название: Yield Simulation for Integrated Circuits
ISBN: 0898382440 ISBN-13(EAN): 9780898382440
Издательство: Springer
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Цена: 23751.00 р.
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Описание: Since only half the chip area would have redundancy, I was concerned that the increase in yield would not outweigh the increased costs of testing and redundancy programming. I wanted a simulator that would allow me to evaluate the yield of arbitrary redundant layouts, hence I termed such a simulator a layout or yield simulator.