Silicon-on-Insulator, S. Furukawa

Автор: Jinsong Zhang
Название: Transport Studies of the Electrical, Magnetic and Thermoelectric properties of Topological Insulator Thin Films
ISBN: 3662499258 ISBN-13(EAN): 9783662499252
Издательство: Springer
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Описание: This book presentsthe transport studies of topological insulator thin films grown by molecularbeam epitaxy. Through band structure engineering, the ideal topologicalinsulators, (Bi1ГЇВїВЅ xSbx)2Te3 ternary alloys, are successfully fabricated, whichpossess truly insulating bulk and tunable conducting surface states.

Автор: Palyi, Andras Asboth, Janos K. Oroszlany, Laszlo
Название: Short course on topological insulators
ISBN: 331925605X ISBN-13(EAN): 9783319256054
Издательство: Springer
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Описание: This course-based primer provides newcomers to the field with a concise introduction to some of the core topics in the emerging field of topological insulators. The aim is to provide a basic understanding of edge states, bulk topological invariants, and of the bulk--boundary correspondence with as simple mathematical tools as possible.

Автор: Peter L.F. Hemment; Vladimir S. Lysenko; Alexei N.
Название: Perspectives, Science and Technologies for Novel Silicon on Insulator Devices
ISBN: 0792361172 ISBN-13(EAN): 9780792361176
Издательство: Springer
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Описание: Contains the key papers presented during the International NATO Advanced Research Workshop on Silicon on Insulator device technologies. This book explores issues ranging from the economic aspects incorporating SOI and related materials into circuits and systems to consideration of low temperature electronics, quantum devices and MEMS.

Автор: J.-P. Colinge
Название: Silicon-on-Insulator Technology
ISBN: 079238007X ISBN-13(EAN): 9780792380078
Издательство: Springer
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Описание: Describes the different facets of Silicon-on-Insulator technology. This title presents a review of SOI materials, devices and circuits. It discusses SOI fabrication and characterization techniques, SOI device processing, the physics of the SOI MOSFET as well as that of SOI other devices, and the performances of SOI circuits.

Автор: J.-P. Colinge
Название: Silicon-on-Insulator Technology
ISBN: 1475721234 ISBN-13(EAN): 9781475721232
Издательство: Springer
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Описание: 5. 2. Distinction between thick- and thin-film devices . . . . . . . . . . . . . . . . . . . . 109 5. 3. I-V Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 112 5. 3. 1. Threshold voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 2 5. 3 . 2. Body effecL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 1 8 5. 3. 3. Short-channel effects . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120 5. 3. 4. Output characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 24 5. 4. Transconductance and mobility . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 129 5. 4. 1 Transconductance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 129 5. 4. 2. Mobility . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 130 5. 5. Subthreshold slope . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 132 5. 6. Impact ionization and high-field effects . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 9 5. 6. 1. Kink effecL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 39 5. 6. 2. Hot-electron degradation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 143 5. 7. Parasitic bipolar effects . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 145 5. 7. 1. Anomalous subthreshold slope . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 45 5. 7. 2. Reduced drain breakdown voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 7 5. 8. Accumulation-mode p-channel MOSFET . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 9 CHAPTER 6 - Other SOl Devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 5 9 6. 1. Non-conventional devices adapted from bulk . . . . . . . . . . . . . . . . . . . . . . . . . . . 159 6. 1. 1. COMFET . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 160 6. 1. 2. High-voltage lateral MOSFET . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 6 1 6. 1. 3. PIN photodiode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 162 6. 1. 4. JFET . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 163 6. 2. Novel SOl devices . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 164 6. 2. 1. Lubistor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Автор: Alexei Nazarov; J.-P. Colinge; Francis Balestra; J
Название: Semiconductor-On-Insulator Materials for Nanoelectronics Applications
ISBN: 3642267084 ISBN-13(EAN): 9783642267086
Издательство: Springer
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Описание: Devoted to the evolving field of modern nanoelectronics, this volume presents the physics and technology of nanoelectronic devices built on semiconductor-on-insulator (SemOI) systems. Topics include new semiconductor-on-insulator materials, physics of modern SemOI devices, and MEMS on SOI.

Автор: S Winnik
Название: Corrosion Under Insulation (CUI) Guidelines
ISBN: 0081007140 ISBN-13(EAN): 9780081007143
Издательство: Elsevier Science
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Описание:

Corrosion-under-insulation (CUI) refers to the external corrosion of piping and vessels that occurs underneath externally clad/jacketed insulation as a result of the penetration of water. By its very nature CUI tends to remain undetected until the insulation and cladding/jacketing is removed to allow inspection or when leaks occur. CUI is a common problem shared by the refining, petrochemical, power, industrial, onshore and offshore industries.

Автор: J.-P. Colinge
Название: Silicon-on-Insulator Technology
ISBN: 0792391500 ISBN-13(EAN): 9780792391500
Издательство: Springer
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Описание: Explains the principles and the physics of SOI materials fabrication and characterization, SOI processing SOI MOSFET device physics, and the use of SOI material in novel device design. The performances of SOI circuits for VLSI/ULSI and for niche applications are also described.

Автор: Florian Gebhard
Название: The Mott Metal-Insulator Transition
ISBN: 3540614818 ISBN-13(EAN): 9783540614814
Издательство: Springer
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Описание: Little do we reliably know about the Mott transition, and we are far from a complete understanding of the metal --insulator transition due to electr- electron interactions. The Hubbard model describes a Mott transition with a mere minimum of tunable par- eters, and various exact statements and even exact solutions exist in certain limiting cases.

Автор: Florian Gebhard
Название: The Mott Metal-Insulator Transition
ISBN: 3642082637 ISBN-13(EAN): 9783642082634
Издательство: Springer
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Описание: Little do we reliably know about the Mott transition, and we are far from a complete understanding of the metal --insulator transition due to electr- electron interactions. The Hubbard model describes a Mott transition with a mere minimum of tunable par- eters, and various exact statements and even exact solutions exist in certain limiting cases.

Автор: Denis Flandre; Alexei Nazarov; Peter L.F. Hemment
Название: Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment
ISBN: 1402030126 ISBN-13(EAN): 9781402030123
Издательство: Springer
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Описание: Collects the papers presented during NATO Advanced Research Workshop "Science and technology of Semiconductor on Insulator (SOI) structures and devices operating in a harsh environment". Presenting various innovations in SOI materials and devices, the papers focus on the reliability of SOI structures operating under harsh conditions.

Автор: Denis Flandre; Alexei N. Nazarov; Peter L.F. Hemme
Название: Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment
ISBN: 1402030118 ISBN-13(EAN): 9781402030116
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Описание: Collects the papers presented during NATO Advanced Research Workshop `Science and technology of Semiconductor on Insulator (SOI) structures and devices operating in a harsh environment` held in Kiev 26-30 April 2004. This volume contains both reviews from invited speakers and selected papers presenting innovations in SOI materials and devices.