Описание: The interaction of globular proteins with silica nanoparticles is dominated by electrostatic interactions and can be controlled by pH and ionic strength, while the bridging of nanoparticles by adsorbed protein molecules leads to large-scale hybrid aggregates of protein with the nanoparticles.
Автор: Institute Radiophysics; Christian Toepffer; G?nter Название: Interactions Between Charged Particles in a Magnetic Field ISBN: 3642442560 ISBN-13(EAN): 9783642442568 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This monograph focuses on the influence of a strong magnetic field on the interactions between charged particles in a many-body system. In the binary collision model, the Coulomb interaction between the test and the target particles is screened because of the polarization of the target.
Описание: The interaction of globular proteins with silica nanoparticles is dominated by electrostatic interactions and can be controlled by pH and ionic strength, while the bridging of nanoparticles by adsorbed protein molecules leads to large-scale hybrid aggregates of protein with the nanoparticles.
Автор: Edmund G. Seebauer; Meredith C. Kratzer Название: Charged Semiconductor Defects ISBN: 1849968209 ISBN-13(EAN): 9781849968201 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: "Charged Defects in Semiconductors" details the current state of knowledge regarding the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors.
Автор: Edmund G. Seebauer; Meredith C. Kratzer Название: Charged Semiconductor Defects ISBN: 1848820585 ISBN-13(EAN): 9781848820586 Издательство: Springer Рейтинг: Цена: 26122.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Defects in semiconductors have been studied for many years, in many cases with a view toward controlling their behaviour through various forms of `defect engineering`. This book covers the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors.
Автор: Dieter Liesen Название: Physics with Multiply Charged Ions ISBN: 030645114X ISBN-13(EAN): 9780306451140 Издательство: Springer Рейтинг: Цена: 30606.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of a NATO ASI held in Cargese, France, July 18-30, 1994
Автор: Fouad G. Major; Viorica N. Gheorghe; G?nther Werth Название: Charged Particle Traps ISBN: 3642060374 ISBN-13(EAN): 9783642060373 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Over the last quarter of this century, revolutionary advances have been made both in kind and in precision in the application of particle traps to the study of thephysics of charged particles, leading to intensi?ed interest in, and wide proliferation of, this topic.
Автор: Erhard Salzborn; Paul H. Mokler; Alfred M?ller Название: Atomic Physics of Highly Charged Ions ISBN: 3642766609 ISBN-13(EAN): 9783642766602 Издательство: Springer Рейтинг: Цена: 14673.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book contains the invited lectures and contributed papers presented at the V International Conference on the Physics of Highly Charged Ions, which was held at the lustus-Liebig-Universi- tat Giessen, 10-14 September 1990.
Автор: Dieter Liesen Название: Physics with Multiply Charged Ions ISBN: 1489914145 ISBN-13(EAN): 9781489914149 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Proceedings of a NATO ASI held in Cargese, France, July 18-30, 1994
Автор: R.K. Janev; L.P. Presnyakov; V.P. Shevelko Название: Physics of Highly Charged Ions ISBN: 3642691978 ISBN-13(EAN): 9783642691973 Издательство: Springer Рейтинг: Цена: 16769.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The physics of highly charged ions has become an essential ingredient of many modern research fields, such as x-ray astronomy and astrophysics, con- trolled thermonuclear fusion, heavy ion nuclear physics, charged particle ac- celerator physics, beam-foil spectroscopy, creation of xuv and x-ray lasers, etc.
Автор: Anjam Khursheed Название: The Finite Element Method in Charged Particle Optics ISBN: 0792386116 ISBN-13(EAN): 9780792386117 Издательство: Springer Рейтинг: Цена: 30039.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Intended to serve as a reference for postgraduate students and researchers working in the fields of charged particle optics or other finite-element-related applications. This book reports on some high-order interpolation techniques and mesh generation methods that will be useful to other finite element researchers.
Автор: W.D. Kraeft; D. Kremp; W. Ebeling; G. R?pke Название: Quantum Statistics of Charged Particle Systems ISBN: 1461292735 ISBN-13(EAN): 9781461292739 Издательство: Springer Рейтинг: Цена: 13060.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: MATSUBARA, 1982) the extended material on charged particle systems, which is now available thanks to the efforts of many workers in statistical mechanics, is widely dispersed in many original articles.
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