Advances in X-Ray Analysis, Charles S. Barrett; John B. Newkirk; Gavin R. Mall

Автор: William M. Mueller
Название: Advances in X-Ray Analysis
ISBN: 1468486330 ISBN-13(EAN): 9781468486339
Издательство: Springer
Рейтинг:
Цена: 6986.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Автор: C. Grant
Название: Advances in X-Ray Analysis
ISBN: 1461399777 ISBN-13(EAN): 9781461399773
Издательство: Springer
Рейтинг:
Цена: 6986.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: The successful application of x-r~ diffraction techniques and x-r~ spectrometry depends in large measure on the availability of dependable standards and reference data. One of the purposes of the invited papers in this 22nd Annual Denver X-Ray Conference was tc review the status of programs to prepare such standards and reference data.

Автор: William M. Mueller
Название: Advances in X-Ray Analysis
ISBN: 1468486365 ISBN-13(EAN): 9781468486360
Издательство: Springer
Рейтинг:
Цена: 13974.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: The Ninth Annual Conference on Applications of X-Ray Anal- ysis sponsored by the University of Denver was held August 10, 11,12, 1960, at the Park Lane Hotel in Denver, Colorado.

Автор: Gavin R. Mallett; Marie Fay; William M. Mueller
Название: Advances in X-Ray Analysis
ISBN: 1468476351 ISBN-13(EAN): 9781468476354
Издательство: Springer
Рейтинг:
Цена: 6986.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis.

Автор: William M. Mueller
Название: Advances in X-Ray Analysis
ISBN: 1468476084 ISBN-13(EAN): 9781468476088
Издательство: Springer
Рейтинг:
Цена: 6986.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: The text of this volume had its origin in the Tenth Annual Conference on Applications of X-Ray Analysis sponsored by the University of Denver and held August 7,8,9, 1961, at the Albany Hotel in Denver, Colorado.

Автор: William M. Mueller; Gavin R. Mallett; Marie Fay
Название: Advances in X-Ray Analysis
ISBN: 146848639X ISBN-13(EAN): 9781468486391
Издательство: Springer
Рейтинг:
Цена: 15672.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: knowledge increasing slowly through several centuries, accelerating rapidly during the past twenty years, culminat- ing at the present time in a virtual impossibility that one person - one communit- possibly even one nation - can hope to generate or use productively more than a minute portion of the world`s scientific knowledge.

Автор: Gregory J. McCarthy
Название: Advances in X-Ray Analysis
ISBN: 1461399890 ISBN-13(EAN): 9781461399896
Издательство: Springer
Рейтинг:
Цена: 13060.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: In keeping with recent practice, this year`s Denver Conference on Applications of X-ray Analysis emphasized x-ray diffraction and was co-sponsored by JCPDS, International Center for Diffraction Data.

Автор: William M. Mueller; Gavin Mallet; Marie Fay
Название: Advances in X-Ray Analysis
ISBN: 1468486756 ISBN-13(EAN): 9781468486759
Издательство: Springer
Рейтинг:
Цена: 6986.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: A real need exists for ways to bridge the gap between basic research and prac- tical application, for faster utilization of new discoveries and new developments in the world of technology, and for technical transfer of defense and space accomplish- ments to the civilian economy.

Автор: William M. Mueller; Marie Fay
Название: Advances in X-Ray Analysis
ISBN: 146848785X ISBN-13(EAN): 9781468487855
Издательство: Springer
Рейтинг:
Цена: 6986.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: At the same time the researcher is faced with problems of in- creasing complexity, with the requirement for new knowledge and new techniques, and must frequently, with little time, bridge the gap between his own sphere of experience and a sometimes apparently unrelated new interest.

Автор: John B. Newkirk; Gavin R. Mallett
Название: Advances in X-Ray Analysis
ISBN: 1468478370 ISBN-13(EAN): 9781468478372
Издательство: Springer
Рейтинг:
Цена: 6986.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: The featured subject of the 1966 Denver X-Ray Conference was X-Ray Diffraction Topography and Dynamical X-Ray Phenomena. One of the chairmen of the featured ses- sions, Professor R. Young, made the following remarks at the conclusion of his session. We think they are quite appropriate to the occasion and with his permission we reproduce them here.

Автор: John C. Russ
Название: Advances in X-Ray Analysis
ISBN: 1461399955 ISBN-13(EAN): 9781461399957
Издательство: Springer
Рейтинг:
Цена: 6986.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: In alternating years, the Denver X-ray Conference turns its principal attention, through the choice of subjects for the plenary lectures, to various aspects of either X-ray fluorescence or dif- fraction.

Автор: K. Heinrich
Название: Advances in X-Ray Analysis
ISBN: 1461399718 ISBN-13(EAN): 9781461399711
Издательство: Springer
Рейтинг:
Цена: 6986.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu- ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry.