Advances in X-Ray Analysis, William M. Mueller; Gavin Mallet; Marie Fay

Автор: William M. Mueller; Gavin R. Mallett; Marie Fay
Название: Advances in X-Ray Analysis
ISBN: 146848639X ISBN-13(EAN): 9781468486391
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Описание: knowledge increasing slowly through several centuries, accelerating rapidly during the past twenty years, culminat- ing at the present time in a virtual impossibility that one person - one communit- possibly even one nation - can hope to generate or use productively more than a minute portion of the world`s scientific knowledge.

Автор: Gavin R. Mallett; Marie Fay; William M. Mueller
Название: Advances in X-Ray Analysis
ISBN: 1468476351 ISBN-13(EAN): 9781468476354
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Описание: The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis.

Автор: William M. Mueller
Название: Advances in X-Ray Analysis
ISBN: 1468476084 ISBN-13(EAN): 9781468476088
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Описание: The text of this volume had its origin in the Tenth Annual Conference on Applications of X-Ray Analysis sponsored by the University of Denver and held August 7,8,9, 1961, at the Albany Hotel in Denver, Colorado.

Автор: Charles S. Barrett; John B. Newkirk; Gavin R. Mall
Название: Advances in X-Ray Analysis
ISBN: 1468475371 ISBN-13(EAN): 9781468475371
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Описание: The University of Denver and its staff members deserve much credit for organizing and operating this Denver X-ray Conference year after year, for there seems to be no doubt that it and the yolumes that result from it are filling a need.

Автор: Gregory J. McCarthy
Название: Advances in X-Ray Analysis
ISBN: 1461399890 ISBN-13(EAN): 9781461399896
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Описание: In keeping with recent practice, this year`s Denver Conference on Applications of X-ray Analysis emphasized x-ray diffraction and was co-sponsored by JCPDS, International Center for Diffraction Data.

Автор: William M. Mueller
Название: Advances in X-Ray Analysis
ISBN: 1468486330 ISBN-13(EAN): 9781468486339
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Автор: John B. Newkirk; Gavin R. Mallett
Название: Advances in X-Ray Analysis
ISBN: 1468478370 ISBN-13(EAN): 9781468478372
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Описание: The featured subject of the 1966 Denver X-Ray Conference was X-Ray Diffraction Topography and Dynamical X-Ray Phenomena. One of the chairmen of the featured ses- sions, Professor R. Young, made the following remarks at the conclusion of his session. We think they are quite appropriate to the occasion and with his permission we reproduce them here.

Автор: John C. Russ
Название: Advances in X-Ray Analysis
ISBN: 1461399955 ISBN-13(EAN): 9781461399957
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Описание: In alternating years, the Denver X-ray Conference turns its principal attention, through the choice of subjects for the plenary lectures, to various aspects of either X-ray fluorescence or dif- fraction.

Автор: K. Heinrich
Название: Advances in X-Ray Analysis
ISBN: 1461399718 ISBN-13(EAN): 9781461399711
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Описание: The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu- ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry.

Автор: D. K. Smith
Название: Advances in X-Ray Analysis
ISBN: 1461399920 ISBN-13(EAN): 9781461399926
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Описание: Indexing by computer methods or accurate lattice parameters through least-squares fitting procedures with resulting small residuals is a good test of d value accuracy. In most of the reported studies, the emphasis has been more on the data acquisition than on the specific problems to which the data is to be applied.

Автор: Howard McMurdie
Название: Advances in X-ray Analysis
ISBN: 1461399831 ISBN-13(EAN): 9781461399834
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Описание: X-ray diffraction as a method of qualitative analysis for crystal- line phases has been long accepted, and has had constant improvement in method and equipment.

Автор: Charles Barrett
Название: Advances in X-Ray Analysis
ISBN: 1461399688 ISBN-13(EAN): 9781461399681
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Описание: The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu- ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry.